Memory using variable tunnel barrier widths
    7.
    发明授权
    Memory using variable tunnel barrier widths 失效
    使用可变隧道势垒宽度的内存

    公开(公告)号:US07985963B2

    公开(公告)日:2011-07-26

    申请号:US12454698

    申请日:2009-05-21

    IPC分类号: H01L47/00

    摘要: A memory using a tunnel barrier that has a variable effective width is disclosed. A memory element includes a tunneling barrier and a conductive material. The conductive material typically has mobile ions that either move towards or away from the tunneling barrier in response to a voltage across the memory element. A low conductivity region is either formed or destroyed. It can be formed by either the depletion or excess ions around the tunneling barrier, or by the mobile ions combining with complementary ions. It may be destroyed by either reversing the forming process or by reducing the tunneling barrier and injecting ions into the conductive material. The low conductivity region increases the effective width of the tunnel barrier, making electrons tunnel a greater distance, which reduces the memory element's conductivity. By varying conductivity multiple states can be created in the memory cell.

    摘要翻译: 公开了一种使用具有可变有效宽度的隧道势垒的存储器。 存储元件包括隧道势垒和导电材料。 导电材料通常具有响应于存储元件两端的电压而移动或者远离隧道势垒的移动离子。 形成或破坏低导电性区域。 它可以通过隧道势垒周围的耗尽或过量离子,或通过与互补离子组合的移动离子来形成。 可能通过反转成形过程或减少隧道势垒并将离子注入导电材料来破坏。 低导电率区域增加了隧道势垒的有效宽度,使得电子隧道更大的距离,这降低了存储元件的导电性。 通过改变电导率,可以在存储器单元中产生多个状态。