WIRING STRUCTURES FOR THREE-DIMENSIONAL SEMICONDUCTOR DEVICES
    21.
    发明申请
    WIRING STRUCTURES FOR THREE-DIMENSIONAL SEMICONDUCTOR DEVICES 有权
    三维半导体器件的接线结构

    公开(公告)号:US20140203442A1

    公开(公告)日:2014-07-24

    申请号:US14157830

    申请日:2014-01-17

    IPC分类号: G11C5/06

    摘要: Wiring structures of three-dimensional semiconductor devices and methods of forming the same are provided. The wiring structures may include an upper wordline and a lower wordline, each of which extends in a longitudinal direction. The upper wordline may include a recessed portion that extends for only a portion of the upper wordline in a transverse direction and the lower wordline may include a wiring area exposed by the recessed portion of the upper wordline. The wiring structures may also include an upper contact plug contacting the upper wordline and a lower contact plug contacting the wiring area. The upper and lower contact plugs may extend in a vertical direction.

    摘要翻译: 提供三维半导体器件的接线结构及其形成方法。 布线结构可以包括上字线和下字线,每个字线在纵向方向上延伸。 上字线可以包括在横向方向上仅延伸上部字线的一部分的凹部,下部字线可以包括由上部字线的凹部露出的布线区域。 布线结构还可以包括接触上部字线的上部接触插塞和与接线区域接触的下部接触插头。 上下接触塞可以在垂直方向上延伸。

    SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING SEMICONDUCTOR DEVICES
    22.
    发明申请
    SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING SEMICONDUCTOR DEVICES 有权
    半导体器件和制造半导体器件的方法

    公开(公告)号:US20140197542A1

    公开(公告)日:2014-07-17

    申请号:US14155649

    申请日:2014-01-15

    IPC分类号: H01L23/528

    摘要: Semiconductor devices are provided. A semiconductor device may include a substrate and a plurality of lines on the substrate. The semiconductor device may include a dielectric layer on the substrate and adjacent the plurality of lines. The semiconductor device may include a connection element in the dielectric layer. In some embodiments, the semiconductor device may include a plurality of contacts on the connection element, and a conductive interconnection on one of the plurality of contacts that are on the connection element and on a contact that is spaced apart from the connection element.

    摘要翻译: 提供半导体器件。 半导体器件可以包括衬底和衬底上的多条线。 半导体器件可以包括在衬底上并与多条线相邻的电介质层。 该半导体器件可以包括介电层中的连接元件。 在一些实施例中,半导体器件可以包括连接元件上的多个触点,以及在连接元件上的多个触点中的一个触点上以及与连接元件间隔开的触点上的导电互连。

    Semiconductor devices and methods of fabricating the same
    23.
    发明授权
    Semiconductor devices and methods of fabricating the same 有权
    半导体器件及其制造方法

    公开(公告)号:US08587052B2

    公开(公告)日:2013-11-19

    申请号:US13402171

    申请日:2012-02-22

    IPC分类号: H01L29/792

    摘要: One example embodiment of a semiconductor device includes a memory cell array formed on a substrate. The memory cell array includes a gate stack including alternating conductive and insulating layers. A first lower conductive layer in the gate stack has a portion disposed below a first upper conductive layer in the gate stack, and a first contact area of the first lower conductive layer is disposed higher than a second contact area of the first upper conductive layer. The semiconductor device further includes first and second contact plugs extending into the gate stack to contact the first and second contact areas, respectively.

    摘要翻译: 半导体器件的一个示例实施例包括形成在衬底上的存储单元阵列。 存储单元阵列包括包括交替的导电和绝缘层的栅极堆叠。 栅堆叠中的第一下导电层具有设置在栅极堆叠中的第一上导电层下方的部分,并且第一下导电层的第一接触区域设置为高于第一上导电层的第二接触面积。 半导体器件还包括分别延伸到栅极堆叠中以分别接触第一和第二接触区域的第一和第二接触插塞。

    SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
    24.
    发明申请
    SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME 有权
    半导体器件及其制造方法

    公开(公告)号:US20130032875A1

    公开(公告)日:2013-02-07

    申请号:US13402171

    申请日:2012-02-22

    IPC分类号: H01L29/792 H01L29/78

    摘要: One example embodiment of a semiconductor device includes a memory cell array formed on a substrate. The memory cell array includes a gate stack including alternating conductive and insulating layers. A first lower conductive layer in the gate stack has a portion disposed below a first upper conductive layer in the gate stack, and a first contact area of the first lower conductive layer is disposed higher than a second contact area of the first upper conductive layer. The semiconductor device further includes first and second contact plugs extending into the gate stack to contact the first and second contact areas, respectively.

    摘要翻译: 半导体器件的一个示例实施例包括形成在衬底上的存储单元阵列。 存储单元阵列包括包括交替的导电和绝缘层的栅极堆叠。 栅堆叠中的第一下导电层具有设置在栅极堆叠中的第一上导电层下方的部分,并且第一下导电层的第一接触区域设置为高于第一上导电层的第二接触面积。 半导体器件还包括分别延伸到栅极堆叠中以分别接触第一和第二接触区域的第一和第二接触插塞。

    Three-Dimensional Semiconductor Memory Devices and Method of Fabricating the Same
    25.
    发明申请
    Three-Dimensional Semiconductor Memory Devices and Method of Fabricating the Same 有权
    三维半导体存储器件及其制造方法

    公开(公告)号:US20120280299A1

    公开(公告)日:2012-11-08

    申请号:US13415388

    申请日:2012-03-08

    IPC分类号: H01L29/68

    摘要: Provided are three-dimensional semiconductor memory devices and methods of fabricating the same. The device may include an electrode structure extending in a first direction and including electrodes and insulating patterns which are alternately and repeatedly stacked on a substrate, and vertical active patterns penetrating the electrode structure. At least an uppermost electrode of the electrodes is divided into a plurality of physically isolated segments arranged in the first direction. The segments of the uppermost electrode are electrically connected to each other.

    摘要翻译: 提供三维半导体存储器件及其制造方法。 该器件可以包括在第一方向上延伸的电极结构,并且包括电极和交替重复堆叠在基板上的绝缘图案,以及穿透电极结构的垂直有源图案。 至少电极的最上面的电极被分成沿着第一方向布置的多个物理隔离的部分。 最上面的电极的电极彼此电连接。