公开(公告)号：US09581676B2

公开(公告)日：2017-02-28

申请号：US14553153

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

IPC: G01R31/00 ,  G01R35/00 ,  G01R31/28

CPC classification number: G01R35/005 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

Abstract translation: 提供了一种校准和调试测试系统的方法。 首先，校准不同电路段的值，并保存校准时电路段的参数。 校准后，可以在DUT上对电气测试进行处理。 如果测试系统发生故障，则再次校准电气路径段的值，以将当前参数与先前保存的参数进行比较。 出现错误的组件可以通过这种方式迅速找到。

公开(公告)号：US09523708B2

公开(公告)日：2016-12-20

申请号：US14556612

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Ya-Hung Lo ,  Shou-Jen Tsai

IPC: G01R31/00 ,  G01R1/04 ,  G01R31/28 ,  G01R1/073

CPC classification number: G01R1/04 ,  G01R1/07392 ,  G01R31/2887

Abstract: An electrical testing device includes a base having two parallel first rails, a platform provided on the base, a support provided between the first rails, a test arm, a rotary table provided on the test arm, a plurality of holders provided on the rotary table, and a plurality of probe sets respectively provided on the holders. The support has a second rail provided thereon, and is moveable relative to the base and the platform. The test arm is provided on the second rail and above the platform, wherein the test arm is moveable along with the support, and is also movable relative to the support. The rotary table is moveable or rotatable relative to the test arm. The holders are moveable along with the rotary table, and are also moveable or rotatable relative to the rotary table. The probe sets are moveable along with the holders.

Abstract translation: 电测试装置包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在第一轨道之间的支撑件，测试臂，设置在测试臂上的旋转台，设置在旋转台上的多个保持架 ，以及分别设置在保持器上的多个探针组。 支撑件具有设置在其上的第二轨道，并且可相对于基座和平台移动。 测试臂设置在第二轨道上并在平台上方，其中测试臂可与支撑件一起移动，并且也可相对于支撑件移动。 旋转台相对于测试臂是可移动的或可旋转的。 支架可与旋转工作台一起移动，并且也可相对于旋转工作台移动或旋转。 探头组与支架一起可移动。

公开(公告)号：US09835651B2

公开(公告)日：2017-12-05

申请号：US14619597

申请日：2015-02-11

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Hao Wei ,  Jun-Liang Lai ,  Chih-Hao Ho

IPC: G01R1/067

CPC classification number: G01R1/06727 ,  G01R1/06772

Abstract: A high-frequency cantilever type probe card includes a base board, a probe base provided on the base board, two probes, and a capacitor having opposite ends electrically connected to the probes respectively. The probe base is made of an insulating material, and the probes are made of a conductive material. Each of the probes has an arm and a tip, wherein the arm is connected to the probe base, and the tip is adapted to contact a pad of a DUT. When the DUT generates a testing signal with a high frequency, and the testing signal is transmitted to one of the probes, the capacitor, and the other one of the probes in sequence, and then transmitted back to the DUT.

公开(公告)号：US09658249B2

公开(公告)日：2017-05-23

申请号：US14140294

申请日：2013-12-24

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai

IPC: G01R1/067

CPC classification number: G01R1/06772 ,  G01R31/31716 ,  G01R31/31905

Abstract: A probe card which is capable of transmitting high-frequency signals provided by a DUT, and the DUT includes an output pin group and an input pin group for sending and receiving the high-frequency signals respectively. The probe card includes a first signal pin group, a second signal pin group, and a multiband circuit. The first signal pin group is made of a conductive material, and is used to contact the output pin group; the second signal pin group is made of a conductive material too, and is used to contact the input pin group; the multiband circuit is electrically connected to the first signal pin group and the second signal pin group to allow signals within a first bandwidth and a second bandwidth to pass therethrough.

公开(公告)号：US09622348B2

公开(公告)日：2017-04-11

申请号：US14332269

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai ,  Chun-Chung Huang ,  Jing-Zhi Hung ,  Yung Nan Wu ,  Chih-Hao Ho

IPC: H05K1/11 ,  H05K1/02 ,  H05K3/42

CPC classification number: H05K1/116 ,  H05K1/0298 ,  H05K3/429 ,  H05K2201/09845

Abstract: A multilayer circuit board includes a plurality of stacked substrates, a plurality of first conductive lands, and a plurality of second conductive lands. A surface at a side of each of the substrates has an exposed portion which is not covered by the neighboring substrate, wherein each of the first conductive lands is respectively provided on each of the exposed portions. Each of the second conductive lands is provided on the exposed portion of the outermost substrate, wherein each of the substrates has a conductor pattern to be electrically connected to one of the first conductive lands and to one of the second conductive lands.

公开(公告)号：US09500675B2

公开(公告)日：2016-11-22

申请号：US14331610

申请日：2014-07-15

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai ,  Wei Chen ,  Hsin Hsiang Liu ,  Kuang Chung Chou ,  Chan Hung Huang

IPC: G01R1/073

CPC classification number: G01R1/07385 ,  G01R1/07378 ,  G01R31/31716 ,  G01R31/31905

Abstract: A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has two first connecting circuits and two second connecting circuits, wherein an end of each first connecting circuit is connected to the PCB. The probe base is provided between the substrate and the DUT with the probes provided thereon, wherein an end of each probe is exposed and electrically connected to one second connecting circuit, while another end thereof is also exposed to contact the DUT. Each signal path switcher is provided on the probe base, and respectively electrically connected to another end of one first and one second connecting circuits. The capacitor is provided on the probe base with two ends electrically connected to the two signal path switchers.

Abstract translation: 支持环回测试并且在PCB和DUT之间提供的探针模块包括衬底，探针基座，两个探针，两个信号路径切换器和电容器。 基板具有两个第一连接电路和两个第二连接电路，其中每个第一连接电路的一端连接到PCB。 探针基座设置在基板和DUT之间，其上设置有探针，其中每个探针的端部暴露并电连接到一个第二连接电路，而另一端也暴露于与DUT接触。 每个信号路径切换器设置在探针基座上，并且分别电连接到一个第一和第二连接电路的另一端。 电容器设置在探针基座上，两端电连接到两个信号路径切换器。

公开(公告)号：US20160305981A1

公开(公告)日：2016-10-20

申请号：US15098186

申请日：2016-04-13

Applicant: MPI Corporation

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai ,  Chih-Hao Ho ,  Hao Wei

IPC: G01R1/073

CPC classification number: G01R31/2889 ,  G01R31/31924

Abstract: A probe card for transmitting power signals from a tester to two devices under test (DUTs) is provided, which includes two signal pins, two power conducting circuits, and at least a matching part. The signal pins are made of conductive materials, wherein one end of the signal pin contacts one of the DUTs. The two power conducting circuits are electrically connected to the two signal pins respectively to transmit the power signals to the DUTs. One of two ends of the power conducting circuits is connected to the signal pins; the other end of the power conducting circuits is electrically connected to the tester. The matching part is electrically connected to the power conducting circuit in parallel to lower a resistance of the power conducting circuit below a predetermined value, or to lower a percentage error of resistance of the power conducting circuit below a predetermined percentage error.

Abstract translation: 提供了用于从测试仪向两个待测器件（DUT）发送功率信号的探针卡，其中包括两个信号引脚，两个电源电路和至少一个匹配部分。 信号引脚由导电材料制成，其中信号引脚的一端接触DUT中的一个。 两个电源电路分别电连接到两个信号引脚以将功率信号传输到DUT。 电源电路的两端之一连接到信号引脚; 电源电路的另一端与测试器电连接。 匹配部分并联地电连接到电力传导电路，以将导电电路的电阻降低到预定值以下，或将导电电路的电阻百分比误差降低到预定百分比误​​差以下。

公开(公告)号：US09316685B2

公开(公告)日：2016-04-19

申请号：US14076379

申请日：2013-11-11

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai

IPC: G01R31/00 ,  G01R31/28 ,  G01R31/317

CPC classification number: G01R31/2889 ,  G01R31/31721

Abstract: A probe card, which is used to transmit power signals and test signals from a tester to a DUT, includes a pin base, a plurality of signal pins, a signal conducting circuit and at least one power conducting circuit. The signal pins are made of conductive materials, and each contacts the DUT with an end thereof; the signal conducting circuit has a first resistance, and electrically connects the tester and the other end of one of the signal pin to transmit the test signals to the DUT; the power conducting circuit has a second resistance which is much less than the first resistance, and electrically connects the tester and the other end of one of the signal pin which is not connected with the signal conducting circuit to transmit the power signals to the DUT.

Abstract translation: 用于将功率信号和测试信号从测试仪传送到DUT的探针卡包括一个引脚基座，多个信号引脚，一个信号传导电路和至少一个功率传导电路。 信号引脚由导电材料制成，并且每个与其端部接触DUT; 所述信号导通电路具有第一电阻，并将所述测试器和所述信号引脚之一的另一端电连接以将所述测试信号传输到所述DUT; 电力导通电路具有比第一电阻小得多的第二电阻，并且将测试器与未与信号导通电路连接的信号引脚的另一端电连接以将功率信号传输到DUT。