公开(公告)号：US2243383A

公开(公告)日：1941-05-27

申请号：US25566839

申请日：1939-02-10

Applicant: ALOIS LEBER

Inventor： ALOIS LEBER

IPC: G01J1/12

CPC classification number: G01J1/124

公开(公告)号：US2151187A

公开(公告)日：1939-03-21

申请号：US14399737

申请日：1937-05-21

Applicant: CHRISTOPHER DANIEL E

Inventor： CHRISTOPHER DANIEL E

IPC: G01J1/12

CPC classification number: G01J1/124

公开(公告)号：US1482441A

公开(公告)日：1924-02-05

申请号：US67587723

申请日：1923-11-20

Applicant: WILHELM SCHLICHTER

Inventor： WILHELM SCHLICHTER

IPC: G01J1/12

CPC classification number: G01J1/12

公开(公告)号：US11610558B2

公开(公告)日：2023-03-21

申请号：US17841758

申请日：2022-06-16

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Wanjae Ju ,  Nanyoung Park ,  Jungyong Yun ,  Heewoong Yoon

IPC: G09G3/34 ,  G01J1/12 ,  H04M1/22

Abstract: According to various embodiments, an electronic device includes a housing, a display viewable through a front surface of the housing and configured to display a screen, a camera sensor disposed in at least a portion of the front surface of the housing and configured to measure an external illuminance, a processor operationally connected to the display and the camera sensor; and a memory operationally connected to the processor. The memory may store instructions that, when executed, cause the processor to control the electronic device to: detect an turn-on event of the display, turn on the camera sensor to acquire the external illuminance using the camera sensor based on the display being turned on, acquire preview image information for a specified time through the camera sensor, turn off the camera sensor, acquire the external illuminance using an exposure time and a brightness value based on the acquired preview image information, and control a luminance of the display based on the external illuminance.

公开(公告)号：US08189182B2

公开(公告)日：2012-05-29

申请号：US12535815

申请日：2009-08-05

Applicant: Mitsutaka Iwasaki

Inventor： Mitsutaka Iwasaki

IPC: G01J1/12

CPC classification number: G03G15/326 ,  G01J1/32 ,  G01J1/4223 ,  G01J1/44 ,  G03G15/043 ,  G03G15/0435

Abstract: A semiconductor integrated circuit device controlling a first light amount of light emitted from a light source based on a second light amount of light entering a light amount detection part so that the first light amount becomes a target level is disclosed. The semiconductor integrated circuit device includes a comparison part configured to compare a voltage corresponding to the second light amount and a reference voltage corresponding to the target level; and a drive current control part configured to control a drive current supplied to the light source based on the result of the comparison by the comparison part. The drive current control part includes a return light identification part configured to determine whether the second light amount includes a third light amount of return light occurring discontinuously.

Abstract translation: 公开了一种半导体集成电路装置，其控制从光源发出的第一光量的光量，基于进入光量检测部的第二光量，使得第一光量成为目标电平。 半导体集成电路器件包括：比较部，被配置为将与第二光量对应的电压与对应于目标电平的基准电压进行比较; 以及驱动电流控制部，被配置为基于所述比较部的比较结果来控制提供给所述光源的驱动电流。 驱动电流控制部包括返回光识别部，其被配置为确定第二光量是否包括不连续地发生的第三光量的返回光。

公开(公告)号：US20100033714A1

公开(公告)日：2010-02-11

申请号：US12535815

申请日：2009-08-05

Applicant: Mitsutaka Iwasaki

Inventor： Mitsutaka Iwasaki

IPC: G01J1/12 ,  G01J1/32 ,  G03G15/04

CPC classification number: G03G15/326 ,  G01J1/32 ,  G01J1/4223 ,  G01J1/44 ,  G03G15/043 ,  G03G15/0435

Abstract: A semiconductor integrated circuit device controlling a first light amount of light emitted from a light source based on a second light amount of light entering a light amount detection part so that the first light amount becomes a target level is disclosed. The semiconductor integrated circuit device includes a comparison part configured to compare a voltage corresponding to the second light amount and a reference voltage corresponding to the target level; and a drive current control part configured to control a drive current supplied to the light source based on the result of the comparison by the comparison part. The drive current control part includes a return light identification part configured to determine whether the second light amount includes a third light amount of return light occurring discontinuously.

Abstract translation: 公开了一种半导体集成电路装置，其控制从光源发出的第一光量的光量，基于进入光量检测部的第二光量，使得第一光量成为目标电平。 半导体集成电路器件包括：比较部，被配置为将与第二光量对应的电压与对应于目标电平的基准电压进行比较; 以及驱动电流控制部，被配置为基于所述比较部的比较结果来控制提供给所述光源的驱动电流。 驱动电流控制部包括返回光识别部，其被配置为确定第二光量是否包括不连续地发生的第三光量的返回光。

公开(公告)号：US07649622B1

公开(公告)日：2010-01-19

申请号：US11824216

申请日：2007-06-30

Applicant: Ke-Cai Zeng ,  Steven Cummins ,  Edward Huber ,  Vincent Uy ,  Steven Sanders ,  Patrick Zicolello ,  Brett A. Spurlock

Inventor： Ke-Cai Zeng ,  Steven Cummins ,  Edward Huber ,  Vincent Uy ,  Steven Sanders ,  Patrick Zicolello ,  Brett A. Spurlock

IPC: G01J1/10 ,  G01J1/12

CPC classification number: G01J1/08 ,  G01J1/16 ,  G01J2001/0481 ,  G01J2001/1673 ,  G01J2001/4252

Abstract: A test system and method are provided for testing in parallel radiant output of multiple light emitting devices. Generally, the method involves: (i) providing a system having a master, calibrated power meter (CPM), a source transfer standard (STS), and multiple secondary, test site power meters (TSPMs); (ii) determining a relationship between electrical power supplied to the STS and a radiant output therefrom as measured by the CPM; (iii) calibrating the TSPMs using the STS and the relationship between the power supplied to the STS and the radiant output therefrom as determined by the CPM; and (iv) positioning the devices undergoing test on a fixture of the test system and positioning the fixture relative to the TSPMs to test radiant outputs of the devices. Preferably, the TSPMs are calibrated by exposing each to the STS at a known power, determining a difference between the radiant output measured by the CPM and TSPM, using this difference as an offset that is added to the a signal from the TSPM to provide a corrected radiant output for the device under test. Other embodiments are also disclosed.

Abstract translation: 提供了一种用于测试多个发光器件的并行辐射输出的测试系统和方法。 通常，该方法包括：（i）提供具有主，校准功率计（CPM），源传输标准（STS）和多个次级测试站功率计（TSPM）的系统; （ii）确定由CPM测量的提供给STS的电力与其辐射输出之间的关系; （iii）使用STS校准TSPM，以及由CPM确定的提供给STS的功率与辐射输出之间的关系; 以及（iv）将经过测试的设备定位在测试系统的固定装置上并相对于TSPM定位固定装置以测试装置的辐射输出。 优选地，TSPM通过以已知功率将每个接收到STS进行校准，确定由CPM和TSPM测量的辐射输出之间的差异，使用该差作为相加于来自TSPM的信号以提供 被测器件的校正辐射输出。 还公开了其他实施例。

公开(公告)号：US20080088829A1

公开(公告)日：2008-04-17

申请号：US11791761

申请日：2005-11-29

Applicant: Takashi Fuyuki

Inventor： Takashi Fuyuki

IPC: G01J1/12

CPC classification number: G01N21/66 ,  G01J1/08 ,  G01J2001/4247 ,  H01L31/186 ,  H02S50/10 ,  Y02B10/12 ,  Y02E10/50 ,  Y02P70/521

Abstract: Disclosed is a method for evaluating the performance of a solar cell which comprises a silicon semiconductor as the main component. This method comprises a current introduction step for introducing a direct current into a solar cell element constituting the solar cell in the forward direction, and an emission sensing step for sensing emission characteristics of the light emitted from the solar cell element due to the current introduction step. By this method, the photoelectric conversion performance of a solar cell can be simply and accurately evaluated without requiring large-sized equipment.

Abstract translation: 公开了以硅半导体为主要成分的太阳能电池的性能评价方法。 该方法包括：电流引入步骤，用于将直流电流引导到沿正向方向构成太阳能电池的太阳能电池元件;以及发射感测步骤，用于感测由于当前引入步骤而从太阳能电池元件发射的光的发射特性 。 通过这种方法，可以简单且准确地评估太阳能电池的光电转换性能，而不需要大型设备。

公开(公告)号：US07027340B2

公开(公告)日：2006-04-11

申请号：US10898238

申请日：2004-07-26

Applicant: Chao Sheng Huang

Inventor： Chao Sheng Huang

IPC: G01J1/12 ,  H03K19/096

CPC classification number: G11C7/106 ,  G11C7/065 ,  G11C7/1048 ,  G11C7/1051 ,  G11C7/1069

Abstract: An output device for static random access memory is disclosed, which has a precharger, a charge and discharge path circuit, a voltage hold circuit, an output inverter and a feedback path circuit. The charge and discharge path circuit connects to a common output node and generates a potential on its output terminal in accordance with a first grounding path on or not. The voltage hold circuit controls a voltage of the common output node in accordance with both a second grounding path on or not and the potential on the output terminal of the charge and discharge path circuit. The output inverter generates and next outputs an inverted voltage on its output terminal in accordance with the potential on the output terminal of the charge and discharge path circuit. The feedback path circuit connects to output terminals of the charge and discharge path circuit and the output inverter.

Abstract translation: 公开了一种用于静态随机存取存储器的输出装置，其具有预充电器，充电和放电路径电路，电压保持电路，输出反相器和反馈路径电路。 充电和放电路径电路连接到公共输出节点，并根据第一接地路径是否在其输出端产生电位。 电压保持电路根据充电和放电路径电路的输出端子上的第二接地路径和电位两者来控制公共输出节点的电压。 输出反相器根据充放电路径电路的输出端子上的电位产生并输出其输出端上的反相电压。 反馈路径电路连接到充放电路径电路和输出逆变器的输出端子。

公开(公告)号：US6016192A

公开(公告)日：2000-01-18

申请号：US992636

申请日：1997-12-18

Applicant: Walter W. Taylor

Inventor： Walter W. Taylor

IPC: G01J1/08 ,  G01J5/00 ,  H01J43/30 ,  G01J1/10 ,  G01J1/12

CPC classification number: G01J1/08 ,  H01J43/30 ,  G01J2005/0048

Abstract: An external calibration system for a photo multiplier tube is described. The calibration system uses a light emitting diode and a photo cell wherein the diode is domed shaped. The light sensitive face of the photo multiplier tube is contained in the plane disposed at an acute angle to the longitudinal axis of the light emitting diode, and the photo cell is mounted substantially perpendicular to the longitudinal axis. A source of electrical energy then illuminates the light emitting diode over a range from, for example, 0 to 5 volts to generate light of known intensity and the light being generated is simultaneously measured by the photo cell and the light sensitive face of the photo multiplier tube. A feedback circuit is provided and associated circuitry so that a number of readings can be taken over a wide variety of light intensities to generate a calibration for the photo multiplier tube.

Abstract translation: 描述了用于光电倍增管的外部校准系统。 校准系统使用发光二极管和光电池，其中二极管是圆顶形的。 光电倍增管的光敏面包含在与发光二极管的纵向轴线成锐角设置的平面中，并且光电池基本上垂直于纵向轴线安装。 然后，电能源在例如0至5伏的范围内照射发光二极管，以产生已知强度的光，并且由光电池和光电倍增管的光敏面同时测量所产生的光 管。 提供反馈电路和相关联的电路，使得可以在多种光强度下进行多个读数以产生用于光电倍增管的校准。