公开(公告)号：US20220405564A1

公开(公告)日：2022-12-22

申请号：US17893075

申请日：2022-08-22

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Anh Ly ,  Steven Lemke ,  Nha Nguyen ,  Vipin Tiwari ,  Nhan Do

IPC: G06N3/063 ,  G06N3/04 ,  G11C16/04 ,  G11C16/10 ,  G11C16/34

Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. In one example, a method comprises programming a plurality of analog neural non-volatile memory cells in an array of analog neural non-volatile memory cells to store one of N different values, where N is a number of different levels that can be stored in any of the analog neural non-volatile memory cells; measuring a current drawn by the plurality of analog neural non-volatile memory cells; comparing the measured current to a target value; and identifying the plurality of the analog neural non-volatile memory cells as bad if the difference between the measured value and the target value exceeds a threshold.

公开(公告)号：US20220391682A1

公开(公告)日：2022-12-08

申请号：US17885431

申请日：2022-08-10

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Nhan Do

IPC: G06N3/063 ,  G06N3/04 ,  G06F3/06 ,  G06F17/16 ,  G06N3/08 ,  G11C11/56 ,  G11C13/00 ,  G11C16/04 ,  G11C16/28

Abstract: Numerous embodiments are disclosed for compensating for differences in the slope of the current-voltage characteristic curve among reference transistors, reference memory cells, and flash memory cells during a read operation in an analog neural memory in a deep learning artificial neural network. In one embodiment, a method comprises receiving a first voltage, multiplying the first voltage by a coefficient to generate a second voltage, applying the first voltage to a gate of one of a reference transistor and a selected memory cell, applying the second voltage to a gate of the other of a reference transistor and a selected memory cell, and using the reference transistor in a sense operation to determine a value stored in the selected memory cell.

公开(公告)号：US20220383087A1

公开(公告)日：2022-12-01

申请号：US17885437

申请日：2022-08-10

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Nhan Do

IPC: G06N3/063 ,  G06N3/04 ,  G06F3/06 ,  G06F17/16 ,  G06N3/08 ,  G11C11/56 ,  G11C13/00 ,  G11C16/04 ,  G11C16/28

Abstract: Numerous embodiments are disclosed for compensating for differences in the slope of the current-voltage characteristic curve among reference transistors, reference memory cells, and flash memory cells during a read operation in an analog neural memory in a deep learning artificial neural network. In one embodiment, a method comprises receiving an input voltage, multiplying the input voltage by a coefficient to generate an output voltage, applying the output voltage to a gate of a selected memory cell, performing a sense operating using the selected memory cell and a reference device to determine a value stored in the selected memory cell, wherein a slope of a current-voltage characteristic curve of the reference device and a slope of the current-voltage characteristic curve of the selected memory cell are approximately equal during the sense operation.

公开(公告)号：US20220375952A1

公开(公告)日：2022-11-24

申请号：US17461981

申请日：2021-08-30

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Nhan Do

IPC: H01L27/11526 ,  H01L29/423 ,  G11C16/08 ,  G11C16/14

Abstract: Numerous embodiments are disclosed of a non-volatile memory cell array formed in a p-well, which is formed in a deep n-well, which is formed in a p-substrate. During an erase operation, a negative voltage is applied to the p-well, which reduces the peak positive voltage required to be applied to the cells to cause the cells to erase.

公开(公告)号：US11482530B2

公开(公告)日：2022-10-25

申请号：US16919697

申请日：2020-07-02

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: H01L27/11531 ,  G06N3/08 ,  G11C16/04 ,  H01L29/788

Abstract: Numerous embodiments of a precision tuning algorithm and apparatus are disclosed for precisely and quickly depositing the correct amount of charge on the floating gate of a non-volatile memory cell within a vector-by-matrix multiplication (VMM) array in an artificial neural network. Selected cells thereby can be programmed with extreme precision to hold one of N different values.

公开(公告)号：US20220319619A1

公开(公告)日：2022-10-06

申请号：US17839294

申请日：2022-06-13

Applicant: Silicon Storage Technology, Inc,

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Anh Ly ,  Steven Lemke ,  Nha Nguyen ,  Vipin Tiwari ,  Nhan Do

IPC: G11C16/34 ,  G11C16/10 ,  G06N3/063 ,  G06F3/06 ,  G06N3/08 ,  G11C16/26 ,  G11C29/10

Abstract: Circuitry and methods are disclosed for compensating for leakage in analog neural memory in deep learning artificial neural networks. In one example, a method is disclosed of compensating for leakage in an array of analog neural non-volatile memory cells, wherein the array is arranged in rows and columns, wherein each row is coupled to a word line and each column is coupled to a bitline, the method comprising measuring leakage for a column of analog neural non-volatile memory cells coupled to a bitline; storing the measured leakage value; and applying the measured leakage value during a read operation of the column of analog neural non-volatile memory cells to compensate for the leakage.

公开(公告)号：US11449741B2

公开(公告)日：2022-09-20

申请号：US16569647

申请日：2019-09-12

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Anh Ly ,  Steven Lemke ,  Nha Nguyen ,  Vipin Tiwari ,  Nhan Do

IPC: G06N3/063 ,  G06N3/04 ,  G11C16/04 ,  G11C16/10 ,  G11C16/34 ,  G11C16/08

Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.

公开(公告)号：US11409352B2

公开(公告)日：2022-08-09

申请号：US16354040

申请日：2019-03-14

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Mark Reiten ,  Nhan Do

IPC: G06F1/26 ,  G06F1/32 ,  G06F1/3234 ,  G11C16/04 ,  G06N3/08 ,  G06F17/16 ,  G11C11/54 ,  G06N3/04

Abstract: Numerous embodiments of power management techniques are disclosed for various operations involving one or more vector-by-matrix multiplication (VMM) arrays within an artificial neural network.

公开(公告)号：US11362100B2

公开(公告)日：2022-06-14

申请号：US17069563

申请日：2020-10-13

Applicant: Silicon Storage Technology, Inc.

Inventor： Feng Zhou ,  Xian Liu ,  Steven Lemke ,  Hieu Van Tran ,  Nhan Do

IPC: H01L27/11517 ,  H01L27/11529 ,  H01L29/788 ,  H01L29/423 ,  H01L29/66 ,  H01L27/11551

Abstract: Memory cells formed on upwardly extending fins of a semiconductor substrate, each including source and drain regions with a channel region therebetween, a floating gate extending along the channel region and wrapping around the fin, a word line gate extending along the channel region and wrapping around the fin, a control gate over the floating gate, and an erase gate over the source region. The control gates are a continuous conductive strip of material. First and second fins are spaced apart by a first distance. Third and fourth fins are spaced apart by a second distance. The second and third fins are spaced apart by a third distance greater than the first and second distances. The continuous strip includes a portion disposed between the second and third fins, but no portion of the continuous strip is disposed between the first and second fins nor between the third and fourth fins.

公开(公告)号：US11354562B2

公开(公告)日：2022-06-07

申请号：US15936983

申请日：2018-03-27

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Stanley Hong ,  Anh Ly ,  Thuan Vu ,  Hien Pham ,  Kha Nguyen ,  Han Tran

IPC: G06N3/04 ,  G06F17/16 ,  G06N3/063 ,  G06N3/08 ,  G11C16/04 ,  G11C11/54 ,  H03F3/45

Abstract: Numerous embodiments for processing the current output of a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. The embodiments comprise a summer circuit and an activation function circuit. The summer circuit and/or the activation function circuit comprise circuit elements that can be adjusted in response to the total possible current received from the VMM to optimize power consumption.