Abstract:
The circuit comprises a first switching circuit which receives at an input a system clock normally provided for the operation of the integrated circuit and produces at an output a machine clock normally coincident with the system clock, circuitry for clamping the first switching circuit responsive to a firing signal of the serial operational analysis device determines which state the machine clock is clamped in and second switching circuit which receives at an input the system clock and is responsive to the firing signal to produce a scanning clock which repeats the system clock in an inverted or non-inverted manner according to the state in which the machine clock has been clamped.
Abstract:
A method for recognizing geometric shapes in an image using fuzzy logic. The method includes determining an edge in the image and a gradient of the edge. The gradient is corrected by virtue of a first fuzzy logic process, and the number of points that belong to the curve are determined by virtue of a second fuzzy logic process. A fuzzy device for the recognition of geometric shapes in images that implementing the method includes an edge detector, a fuzzy gradient corrector to correct the gradient, and a fuzzy vote attributor to determine the number of points that belong to the curve.
Abstract:
A system for determining the programmed/non-programmed status of a memory cell includes a first branch for connecting a first load and a memory cell matrix and a second branch for connecting a second load and at least one virgin reference memory cell. A circuit for selecting a memory cell of the memory matrix and a circuit for selecting at least one virgin reference cell are included. Each one of the first and second branches has a transistor for enabling a flow of current, respectively, between the first load and the second load and the memory cell matrix and the at least one reference memory cell. The enabling transistors are controlled, respectively, by a first biasing structure and by a second biasing structure. The system includes at least one transistor for redistributing the current of the load on the first branch, which is connected in parallel to the enabling transistor, and a first equalization transistor that is controlled by a precharge signal for the equalization of opposite nodes of the first and second branches. The at least one current redistribution transistor provides a current imbalance in the first load and in the second load in order to sense a difference in conductivity between a memory cell of the memory matrix and the at least one reference cell in order to determine the programmed or non-programmed status of the memory cell of the memory matrix.
Abstract:
The present invention concerns an auto-saving circuit for programming configuration elements of non-volatile memory cells organized in a cells matrix in a memory device integrated on a semiconductor. The auto-saving circuit is inserted between a first and a second power supply reference voltage and is powered also by programming voltages generated inside the memory device to produce at an output programming signals of the configuration elements. The auto-saving circuit includes a first and a second circuit portion, one for each signal output and each powered by a respective programming voltage and each including a switching network with at least one high threshold transistor and decoupling elements to give inertia to the circuit against electrostatic discharges or accidental power supply variations.
Abstract:
The present invention relates to a memory circuit of the multi-level type, i.e. a memory circuit having a plurality of memory elements, each adapted to store more than one binary information unit, wherein the memory elements are utilized for storing a number of binary information units tied to an acceptable error rate for a particular application: typically, one bit where a low error rate is sought, and two bits where a higher error rate can be accepted.
Abstract:
A successive approximation shift register without redundancy for a finite-state machine of the sequential type, is also effective to store the machine states. The shift register comprises a chain of logic circuits of the bistable type (FF0,FF1, . . . ) having an input stage with selectable signal inputs which are feedback connected through logic OR gate circuits (OR0,OR1, . . . ,OR6).
Abstract:
N-channel LDMOS and p-channel MOS devices for high voltage integrated in a BiCMOS integrated circuit and exploiting a RESURF condition are provided with a buried region of the same type of conductivity of the epitaxial layer and a doping level intermediate between the doping level of the epitaxial layer and the doping level of a well region. The devices may be configured as source or drain followers without problems.
Abstract:
A process for manufacturing integrated capacitors in CMOS technology, comprising the steps of: producing, in a substrate of semiconductor material having a first type of conductivity, at least one well with the opposite type of conductivity, defining the active areas, producing insulation regions, depositing a first conducting layer of polycrystalline silicon adapted to form the gate regions and the lower plates of the capacitors, depositing a layer of silicon oxide at low temperature, to form the dielectric of the capacitors, depositing a second layer of polycrystalline silicon to form the second plate of the capacitors, shaping the polycrystalline silicon and silicon oxide layers, implanting and diffusing the source and drain regions of the CMOS transistors, providing the insulation layer, the metallic connecting layer, and final covering with a layer of protective insulation.
Abstract:
A coding device including an array of multibit registers, each being composed of a plurality of programmable nonvolatile memory cells connected to an OR configuration to a common sensing line of the register to which a single reading circuit is associated. A first, select/enable bus (SELbus) controls the connection of only one at a time of said programmable memory cells to said common sensing line of each multibit register. To each wire of a second, configuring bus (CODE bus) are connected in common the current terminals of as many programming transistors as the memory cells that compose each register, and to each wire of a third, contingently programming bus (PG bus) are connected the gates of the programming transistors of memory cells of the same order of said registers.
Abstract:
Cost-efficient integration of a fully-featured EEPROM memory block in a FLASH-EPROM memory device, fabricated according to a low supply voltage and low power consumption FLASH-EPROM process, is made possible by a special structure of the EEPROM cells whereby the capacitive coupling between the floating gate and the control gate of the cell is realized over the field oxide adjacent to the active area of the cell. The process of the invention permits an optimized modulation of the thicknesses of the different tunnel and gate oxides of the FLASH-EPROM and EEPROM cells, as well as of the transistors of the peripheral circuitry of the two memory blocks destined to work with a relatively low supply voltage or with a boosted voltage.