HETEROJUNCTION BIPOLAR TRANSISTORS WITH A CUT STRESS LINER

    公开(公告)号:US20240170561A1

    公开(公告)日:2024-05-23

    申请号:US17990931

    申请日:2022-11-21

    CPC classification number: H01L29/7378 H01L29/0817 H01L29/66242

    Abstract: Structures for a heterojunction bipolar transistor and methods of forming a structure for a heterojunction bipolar transistor. The structure comprises an emitter, a collector including a first section, a second section, and a third section positioned in a first direction between the first section and the second section, and an intrinsic base disposed in a second direction between the emitter and the third section of the collector. The structure further comprises a stress layer including a section positioned to overlap with the emitter, the intrinsic base, and the collector. The section of the stress layer is surrounded by a perimeter, and the first and second sections of the collector are each positioned adjacent to the perimeter of the stress layer.

    STRUCTURES FOR A VERTICAL VARACTOR DIODE AND RELATED METHODS

    公开(公告)号:US20240072180A1

    公开(公告)日:2024-02-29

    申请号:US17896711

    申请日:2022-08-26

    CPC classification number: H01L29/93 H01L29/1095 H01L29/66174

    Abstract: Structures for a varactor diode and methods of forming same. The structure comprises a first semiconductor layer including a section on a substrate, a second semiconductor layer on the section of the first semiconductor layer, a third semiconductor layer on the second semiconductor layer, and a doped region in the section of the first semiconductor layer. The section of the first semiconductor layer and the doped region have a first conductivity type, and the second semiconductor layer comprises silicon-germanium having a second conductivity type opposite to the first conductivity type, and the third semiconductor layer has the second conductivity type. The doped region contains a higher concentration of a dopant of the first conductivity type than the section of the first semiconductor layer. The second semiconductor layer abuts the first section of the first semiconductor layer along an interface, and the doped region is positioned adjacent to the interface.

    DIODE STRUCTURES WITH ONE OR MORE RAISED TERMINALS

    公开(公告)号:US20230067948A1

    公开(公告)日:2023-03-02

    申请号:US17540339

    申请日:2021-12-02

    Abstract: Structures for a diode and methods of fabricating a structure for a diode. The structure includes a layer comprised of a semiconductor material. The layer includes a first section, a second section, and a third section laterally positioned between the first section and the second section. The structure includes a first terminal having a raised semiconductor layer on the first section of the layer, a second terminal including a portion on the second section of the layer, and a gate on the third section of the layer.

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