摘要:
A guide rail assembly includes a guide rail, a slider that slides along the guide rail, a wire fixed to the slider, and upper and lower wire feeders located at the upper and lower ends of the guide rail. The guide rail assembly, a drum around which the wire is wound, and a motor for turning the drum are mounted on a base bracket to form a single unit which is attached to a door inner panel.
摘要:
In a conductive contact pin brought into contact with the external electrode of a semiconductor device to conduct a test on the electrical characteristics of the semiconductor device, an upper plunger 13 which is a contact pin coming in and out of a cylindrical body is made up of a base b which is in sliding contact with the cylindrical body and is not in contact with the external electrode and an end a which comes into contact with the external electrode. The base b has at least a surface layer made of a precious metal, and the end a has at least a surface layer made of one of a different metal from the base b and a metal alloy.
摘要:
The present invention provides a semiconductor integrated circuit device and a radio frequency module realizing reduction in high-order harmonic distortion or IMD. For example, a so-called antenna switch having a plurality of transistors between an antenna terminal and a plurality of signal terminals is provided with a voltage supply circuit. The voltage supply circuit is a circuit for supplying voltage from a voltage supply terminal to at least two signal terminals in the plurality of signal terminals via resistive elements. With the configuration, antenna voltage dropped due to a leakage or the like can be boosted and, for example, transistors in an off state can be set to a deep off state.
摘要:
An actuating assembly for an automotive door latch device comprises a housing that operatively installs therein basic elements that are commonly used in an override function unit and a child proof function unit. The override function unit has a function wherein a manipulation of an inside door handle induces cancellation of the engaged condition of the latch means irrespective of the condition of the locking/unlocking means. The child proof function unit has a function wherein the manipulation of the inside door handle is made inoperative irrespective of the condition of the locking/unlocking means, thereby to make the cancellation of the engaged condition of the latch means impossible. The actuating assembly further comprises a cover that is coupled to the housing and holds thereon a selected element that is exclusively used in either one of the override function unit and the child proof function unit.
摘要:
[Object] To provide an automatic transmission capable of providing a sufficient feeling of acceleration with a clear shift feeling at the time of shifting with acceleration by properly allocating step ratios between shift stages.[Means for Solution] In single pinion planetary gear mechanisms 21 and 22, a second sun gear S1 is linked to an input shaft 14 in a power-transmissible manner, a first sun gear S0 is linked to a third control brake B-3, and a first carrier C0 and a second ring gear R1 which are linked to each other are linked to a first control brake B-1. In single pinion planetary gear mechanisms 23 and 24, a third sun gear S2 and a fourth sun gear S3 which are linked to each other are linked to the input shaft 14 disengageably by a first control clutch C-1, and a third ring gear R2 and a fourth ring gear R3 are linked to a second control brake B-2 and a fourth control brake B-4, respectively. Furthermore, in the single pinion planetary gear mechanisms 23 and 24, a third carrier C2 is linked to the input shaft 14 disengageably by a second control clutch C-2 and a fourth carrier C3 is linked to an output shaft 17.
摘要:
[Task] To provide an automatic transmission apparatus for forward 8-speed, which keeps a transmission gear ratio step in good balance.[Solution] The apparatus includes: a first planetary gear device PG0 having a ring gear R0 connected to an input shaft; a second planetary gear device PG1 having a carrier C1 connected to a carrier C0 of the first planetary gear device, and a sun gear S1 connected to R0; a third planetary gear device PG2 having a ring gear R2 connected to C1; a fourth planetary gear device PG3 having a sun gear S3 connected to a sun gear S2 of the third planetary gear device; a first clutch C-1 that selectively connects S2 to the input shaft; a second clutch C-2 that selectively connects C2 to the input shaft; a first brake B-1 that selectively regulates the rotation of R0; a second brake B-2 that selectively regulates the rotation of R2; a third brake B-3 that selectively regulates the rotation of S0; and a fourth brake B-4 that selectively regulates the rotation of R3. The apparatus further includes a third clutch C-3 that connects R0 and S1 to the input shaft, or connects R2 to C1. PG0 to PG3 are each provided as a single pinion type.
摘要:
A vehicle mirror device includes a drive unit to turn a mirror unit with respect to a base unit. The drive unit includes a motor and a control circuit. The motor is driven with a battery voltage. A current supply to the motor is cut OFF when a motor current flowing in the motor exceeds a threshold, and the control circuit changes the threshold depending on the battery voltage.
摘要:
By correcting a data signal based on a current flowing through an EL element when an element driving transistor which controls a drive current to be supplied to the EL element is operated in a saturation region and the EL element is set to an emission level, it is possible to realize a rapid display variation inspection and a high precision display variation correction. By providing a current measuring function on an EL display apparatus, a characteristic variation after the apparatus is shipped can be handled and corrected.
摘要:
To provide an inspection method that makes it possible to inspect continuity or the like of a circuit element in a semiconductor device from observation with a scanning charged particle microscope such as an electron microscope without troublesome work like random access operation of a probe, and providing a system that realizes the inspection method.A method for inspecting an electronic circuit of the invention uses a composite apparatus including an electron gun 2, an ion beam gun 1, and a secondary charged particle detector 4 to observe on a micro-scale contrast change on a sample surface in the case in which the surface of a sample semiconductor device is irradiated with an electron beam or a positively charged ion beam to charge the sample surface highly, and in the case in which a desired pattern in an area in the highly charged state is irradiated with a charged ion beam or an electron beam of opposite charge.
摘要:
In an ultrasound probe including first and second acoustic matching layers between an acoustic lens and a piezoelectric oscillator, an electrode is arranged on a surface of a laminate element made of the first and second acoustic matching layers, the laminate element is interposed between the acoustic lens and the piezoelectric oscillator, and the piezoelectric oscillator and the electrode are electrically connected.