摘要:
A semiconductor memory includes a converter configured to convert each read-data of plural bits read from a memory core into serial data, respectively, in synchronization with a read clock to generate converted read-data. An output register holds the converted read-data in synchronization with the read clock. A selector selects one bit from each plural bits of the converted read-data, in accordance with a control data, and to supply the selected bit to the output register.
摘要:
An MOS-type semiconductor integrated circuit has two MOS transistors of the opposite conductivity channel types connected in series between a high-voltage potential terminal and a ground potential terminal. Those two MOS transistors constitute an inverter and their gates are connected together to an input node. As output nodes, first and second nodes are provided with a current path in between which includes transistors whose gates are connected to the high-voltage potential terminal. A current path including the first transistor which constitutes a switch is inserted between the first node and the output node, and a current path including the second transistor and a barrier transistor is inserted between the second node and the output node. The gates of the first and second transistors are respectively connected with complementary clock signals. The bate of the barrier transistor is connected to the high-voltage potential terminal.
摘要:
A semiconductor integrated circuit includes first and second MOS transistors and a capacitor. The first MOS transistor has a drain connected to an output terminal, a gate and a source. The second MOS transistor has a gate, a drain connected to the source of the first MOS transistor and a source and has the same conductivity type as the first MOS transistor. The capacitor has one electrode connected to the gate of the first MOS transistor and the other electrode connected to a node whose potential changes in a complementary fashion with respect to the drain potential of the first MOS transistor and functions to cancel out an influence, caused by the coupling of a mirror capacitor which exists between the gate and drain of the first MOS transistor, affecting the gate potential of the first MOS transistor.
摘要:
A semiconductor memory device comprises a memory cell array, a first latch circuit group, and a second latch circuit group. The first latch circuit group sequentially outputs n/2 bit read data of n-bit read data from the memory cell array in response to sequentially shifted read control signals. The second latch circuit group sequentially outputs the remaining n/2 bit read data in response to the sequentially shifted read control signal.
摘要:
A semiconductor memory device comprises a first core section including a plurality of memory cell arrays, a second core section including a plurality of memory cell arrays and provided below the first core section, a third core section including a plurality of memory cell arrays and provided in a right side of the first core section, and a fourth core section including a plurality of memory cell arrays and provided in a right side of the second core section, wherein at least a part of the memory cell arrays of the first core section and at least a part of the memory cell arrays of the fourth core section are simultaneously activated, and at least a part of the memory cell arrays of the second core section and at least a part of the memory cell arrays of the third core section are simultaneously activated.
摘要:
An semiconductor device includes an integrated circuit having first and second circuit sections formed on a semiconductor chip, at least one voltage stress testing pad formed on the semiconductor chip for supplying a voltage stress testing voltage or signal to the first circuit section, and a control circuit formed on the semiconductor chip for controlling and setting the second circuit section into a state corresponding to a voltage stress testing mode by using an input from the voltage stress testing pads.
摘要:
There is disclosed a substrate bias circuit including an oscillation circuit oscillating at a predetermined frequency; a control signal generation circuit operative to generate a control signal for changing, on the basis of an output from the oscillation circuit, a substrate potential in a direction to ensure a threshold level of a transistor so that it becomes greater; and a charge pump circuit including a capacitor and operative to control discharge of the capacitor by said control signal to thereby change the substrate potential.
摘要:
A method of boring a hole through a magnet made of an intermetallic compound, characterized in that the hole is formed by a laser machining. The magnet may be reinforced by impregnation with a nonmagnetic material such as a high polymeric substance or a metal having a low melting point before the hole is bored through the magnet by laser machining.
摘要:
According to one embodiment, a semiconductor integrated circuit includes first and second level shift circuits. The first level shifter includes a plurality of transistors and is connected to a power source voltage supply node of a first power source system and to which a first signal of a second power source system and a level inversion signal of the first signal are input. The second level shifter includes a plurality of transistors and is connected to the power source voltage supply node of the first power source system and to which the level inversion signal of the first signal of the second power source system and an output signal of the first level shifter are input. The first and second level shifters have substantially the same circuit configuration and driving abilities of corresponding ones of the transistors in the first and second level shifters are substantially set equal.
摘要:
A non-volatile semiconductor storage device includes: a memory cell array having memory cells arranged therein, the memory cells storing data in a non-volatile manner; and a plurality of transfer transistors transferring a voltage to the memory cells, the voltage to be supplied for data read, write and erase operations with respect to the memory cells. Each of the transfer transistors includes: a gate electrode formed on a semiconductor substrate via a gate insulation film; and diffusion layers formed to sandwich the gate electrode therebetween and functioning as drain/source layers. Upper layer wirings are provided above the diffusion layers and provided with a predetermined voltage to prevent depletion of the diffusion layers at least when the transfer transistors become conductive.