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公开(公告)号：US12228510B2
公开(公告)日：2025-02-18
申请号：US16885186
申请日：2020-05-27
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Alaa Fathy , Diaa Abdelmaguid Khalil , Tarik Bourouina , Bassam A. Saadany
Abstract: Aspects relate to a miniaturized gas cell that may be implemented into an integrated device for gas analysis. The miniaturized gas cell may be a multi-pass gas cell or a hollow waveguide gas cell. In some aspects, the miniaturized gas cell may include a bottom surface and sidewalls formed in a substrate (e.g., a silicon substrate or silicon on insulator (SOI) substrate). The gas cell further includes at least one gas inlet and at least one gas outlet coupled for injection of a gas into and out of the gas cell, respectively. In addition, the gas cell further includes an optical input and an optical output, each optically coupled to direct light into and out of the gas cell, respectively. In addition, a capping layer may be bonded to the substrate to form a top surface of the gas cell.
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公开(公告)号：US11953377B2
公开(公告)日：2024-04-09
申请号：US17671983
申请日：2022-02-15
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Amr O. Ghoname , Momen Anwar , Diaa Khalil
CPC classification number: G01J3/45 , G01J3/021 , G01J3/26 , G01N21/35 , G01N21/552 , G02B6/26 , G02B26/0833 , G02F1/29 , G01N2021/3595 , G02F2201/124
Abstract: Aspects relate to an integrated and compact attenuated total internal reflection (ATR) spectral sensing device. The spectral sensing device includes a substrate, a spectrometer, and a detector. The substrate includes an ATR element, a microfluidic channel, and a channel interface at a boundary between the ATR element and the microfluidic channel formed therein. The ATR element is configured to receive input light and to direct the input light to the channel interface for total internal reflection of the input light at the channel interface. An evanescent wave produced by a sample contained within the microfluidic channel based on the total internal reflection of the input light attenuates the light output from the ATR element and the resulting output light may be analyzed using the spectrometer and the detector.
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公开(公告)号：US20230014558A1
公开(公告)日：2023-01-19
申请号：US17857964
申请日：2022-07-05
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Bassem Mortada , Mohamed H. Al Haron , Momen Anwar , Mohamed Metwally Youssef , Mazen Erfan , Erik R. Deutsch
IPC: G01N33/00 , G01J3/10 , G01N21/3504 , G06N3/02 , B81B7/02
Abstract: Aspects relate to a compact and low-cost gas analyzer that can be used for different types of gas analysis, such as air quality analysis. The gas analyzer can include a light source, a gas cell configured to receive a sample (e.g., a gas under test), a spectral sensor including a spectrometer and a detector, and an artificial intelligence (AI) engine. Light can enter the gas cell and interact with the sample to produce output light that may be measured by the spectral sensor. The resulting spectrum produced by the spectral sensor may be analyzed by the AI engine to produce a result. The gas analyzer further includes a self-calibration component configured to enable calibration of the sample spectrum to compensate for spectral drift of the spectral sensor.
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公开(公告)号：US20220390277A1
公开(公告)日：2022-12-08
申请号：US17828747
申请日：2022-05-31
Applicant: Si-Ware Systems
Inventor： Mohamed Sadek Radwan , Shady Labib , Mostafa Medhat , Bassem Mortada , Tarek Mohamed Zeinah , Yasser M. Sabry , Bassam Saadany , Mohamed H. Al Haron , Mohamed Ahmed Gaber
IPC: G01J3/02
Abstract: Aspects relate to an optical device providing a large spot size spectrometer. The optical device includes an optical head, an optical window, and a spectrometer. The optical head includes a plastic molded part having an aperture and a plurality of reflectors around the aperture formed therein. Each reflector may include a respective lamp assembled therein. The optical window is configured to receive a sample, to pass input light from the lamps to the sample and to pass scattered light from the sample towards the aperture. The aperture is configured to filter a first portion of scattered light containing unusable sample information and to pass a second portion of the scattered light to the spectrometer.
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公开(公告)号：US20220260419A1
公开(公告)日：2022-08-18
申请号：US17671983
申请日：2022-02-15
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Amr O. Ghoname , Momen Anwar , Diaa Khalil
Abstract: Aspects relate to an integrated and compact attenuated total internal reflection (ATR) spectral sensing device. The spectral sensing device includes a substrate, a spectrometer, and a detector. The substrate includes an ATR element, a microfluidic channel, and a channel interface at a boundary between the ATR element and the microfluidic channel formed therein. The ATR element is configured to receive input light and to direct the input light to the channel interface for total internal reflection of the input light at the channel interface. An evanescent wave produced by a sample contained within the microfluidic channel based on the total internal reflection of the input light attenuates the light output from the ATR element and the resulting output light may be analyzed using the spectrometer and the detector.
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Patent Agency Ranking
公开(公告)号：US10782342B2
公开(公告)日：2020-09-22
申请号：US15818736
申请日：2017-11-20
Applicant: Si-Ware Systems
Inventor： Bassam Saadany , Mostafa Medhat , Muhammad Nagi , Ahmed Shebl , Yasser M. Sabry , Bassem Mortada , Diaa Khalil
Abstract: Aspects relate to an integrated optical probe card and a system for performing wafer testing of optical micro-electro-mechanical systems (MEMS) structures with an in-plane optical axis. On-wafer optical screening of optical MEMS structures may be performed utilizing one or more micro-optical bench components to redirect light between an out-of-plane direction that is perpendicular to the in-plane optical axis to an in-plane direction that is parallel to the in-plane optical axis to enable testing of the optical MEMS structures with vertical injection of the light.
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公开(公告)号：US20180143245A1
公开(公告)日：2018-05-24
申请号：US15818736
申请日：2017-11-20
Applicant: Si-Ware Systems
Inventor： Bassam Saadany , Mostafa Medhat , Muhammad Nagi , Ahmed Shebl , Yasser M. Sabry , Bassem Mortada , Diaa Khalil
Abstract: Aspects of the disclosure relate to an integrated optical probe card and a system for performing wafer testing of optical micro-electro-mechanical systems (MEMS) structures with an in-plane optical axis. On-wafer optical screening of optical MEMS structures may be performed utilizing one or more micro-optical bench components to redirect light between an out-of-plane direction that is perpendicular to the in-plane optical axis to an in-plane direction that is parallel to the in-plane optical axis to enable testing of the optical MEMS structures with vertical injection of the light.
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公开(公告)号：US09970819B2
公开(公告)日：2018-05-15
申请号：US15009755
申请日：2016-01-28
Applicant: Si-Ware Systems
Inventor： Diaa Khalil , Bassam A. Saadany , Yasser M. Sabry
CPC classification number: G01J3/45 , G01J3/0256 , G01J3/108 , G01J3/26 , G01J3/453 , G01J3/4531 , G01J3/4532 , G01J3/4535
Abstract: A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.
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39.发明授权Fourier transform micro spectrometer based on spatially-shifted interferogram bursts 有权基于空间位移干涉图脉冲的傅里叶变换微光谱仪公开(公告)号：US09429474B2
公开(公告)日：2016-08-30
申请号：US14047681
申请日：2013-10-07
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Diaa A. M. Khalil , Bassam A. Saadany
CPC classification number: G01J3/45 , G01J3/0218 , G01J3/0256 , G01J3/26 , G01J3/4535 , G01J2003/4538
Abstract: A spectrometer with improved resolution includes a spectral domain modulator having a periodic response in the spectral domain to modulate a wideband source spectrum and cause one or more shifted bursts in the interferogram.
Abstract translation: 具有改进的分辨率的光谱仪包括频谱调制器，其在频谱域中具有周期性响应以调制宽带源频谱并导致干涉图中的一个或多个移位的脉冲串。
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40.发明申请Fourier transform micro spectrometer based on spatially-shifted interferogram bursts 有权基于空间位移干涉图脉冲的傅里叶变换微光谱仪公开(公告)号：US20140098371A1
公开(公告)日：2014-04-10
申请号：US14047681
申请日：2013-10-07
Applicant: SI-WARE SYSTEMS
Inventor： Yasser M. Sabry , Diaa A. M. Khalil , Bassam A. Saadany
IPC: G01J3/45
CPC classification number: G01J3/45 , G01J3/0218 , G01J3/0256 , G01J3/26 , G01J3/4535 , G01J2003/4538
Abstract: A spectrometer with improved resolution includes a spectral domain modulator having a periodic response in the spectral domain to modulate a wideband source spectrum and cause one or more shifted bursts in the interferogram.
Abstract translation: 具有改进的分辨率的光谱仪包括频谱调制器，其在频谱域中具有周期性响应以调制宽带源频谱并导致干涉图中的一个或多个移位的脉冲串。
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