Voltage multiplier circuit with a common bulk and configured for positive and negative voltage generation

    公开(公告)号:US11183924B2

    公开(公告)日:2021-11-23

    申请号:US17021013

    申请日:2020-09-15

    发明人: Vikas Rana

    IPC分类号: H02M3/07 H03K19/096 G05F1/10

    摘要: A voltage doubler circuit supports operation in both a positive voltage boosting mode to positively boost voltage from a first node to a second node and a negative voltage boosting mode to negatively boost voltage from the second node to the first node. The voltage doubler circuit is formed by transistors of a same conductivity type that share a common bulk that is not tied to a source of any of the voltage doubler circuit transistors. A bias generator circuit is coupled to receive a first voltage from the first node and second voltage from the second node. The bias generator circuit operates to apply a lower one of the first and second voltages to the common bulk.

    Circuit for level shifting a clock signal using a voltage multiplier

    公开(公告)号:US10050524B1

    公开(公告)日:2018-08-14

    申请号:US15800896

    申请日:2017-11-01

    发明人: Vikas Rana

    摘要: A voltage multiplier circuit operates in response to a received clock signal to perform a voltage multiplication operation on an input voltage to generate an output voltage. The voltage multiplier circuit includes a pair of intermediate nodes that are capacitively coupled to receive, respectively, opposite phases of a clock signal. A first CMOS driver circuit is coupled to one of the intermediate nodes and has an output configured to generate one phase of a level shifted output clock signal. A second CMOS driver circuit is coupled to another one of the intermediate nodes and has an output configured to generate another phase of the level shifted output clock signal.

    Word-line driver for memory
    34.
    发明授权
    Word-line driver for memory 有权
    用于内存的字线驱动程序

    公开(公告)号:US09129685B2

    公开(公告)日:2015-09-08

    申请号:US14266468

    申请日:2014-04-30

    发明人: Vikas Rana

    摘要: A word-line driver includes first, second and third transistors. The first transistor includes a gate terminal driven by a first group selection signal, a first conduction terminal driven by a second sub-group selection signal and a second conduction terminal coupled to the word-line. The second transistor includes a gate terminal driven by a second group selection signal, a second conduction terminal driven by the second sub-group selection signal, and a first conduction terminal coupled to the word-line. The third transistor includes a gate terminal driven by a third the group selection signal, a first conduction terminal driven by a first sub-group selection signal, and a second conduction terminal coupled to the word-line.

    摘要翻译: 字线驱动器包括第一,第二和第三晶体管。 第一晶体管包括由第一组选择信号驱动的栅极端子,由第二子组选择信号驱动的第一导通端子和耦合到字线的第二导通端子。 第二晶体管包括由第二组选择信号驱动的栅极端子,由第二子组选择信号驱动的第二导通端子和耦合到字线的第一导电端子。 第三晶体管包括由组选择信号的第三组驱动的栅极端子,由第一子组选择信号驱动的第一导通端子和耦合到字线的第二导通端子。

    Charge pump regulation circuit to increase program and erase efficiency in nonvolatile memory

    公开(公告)号:US11070128B2

    公开(公告)日:2021-07-20

    申请号:US16715209

    申请日:2019-12-16

    IPC分类号: H02M3/07 G11C16/30 G11C5/14

    摘要: A charge pump circuit generates a charge pump output signal at a first node and is enabled by a charge pump control signal. A diode has first and second terminals coupled to first and second nodes. A comparator has an inverting input coupled to the second node and a non-inverting input coupled to a third node, and causes generation of the charge pump control signal. A first current mirror produces a first current at the second node, and a second current mirror produces a second current (equal in magnitude to the first current) at the third node. The first terminal and second terminals may be a cathode and an anode. The first current mirror may be a current sink sinking a first current from the second node. The second current mirror may be current source sourcing a second current (equal in magnitude to the first current) to the third node.

    High range positive voltage level shifter using low voltage devices

    公开(公告)号:US10284201B1

    公开(公告)日:2019-05-07

    申请号:US15877970

    申请日:2018-01-23

    发明人: Vikas Rana

    摘要: A voltage level shifter is provided. The voltage level shifter includes an input stage and at least one level shifting stage. The input stage receives an input voltage and a complementary input voltage and receives a first supply voltage and a ground voltage. The input stage outputs one of the first supply voltage and the ground voltage over a first output voltage node and a first complementary output voltage node based on the input voltage and the complementary input voltage. A level shifting stage is coupled to the input stage. The level shifting stage receives the first supply voltage and a second supply voltage and outputs one of the ground voltage, the first supply voltage and the second supply voltage over second and third output voltage nodes and second and third complementary output voltage nodes based on voltages of the first output voltage node and the first complementary output voltage node.

    Circuit for level shifting a clock signal using a voltage multiplier

    公开(公告)号:US10211727B1

    公开(公告)日:2019-02-19

    申请号:US16028814

    申请日:2018-07-06

    发明人: Vikas Rana

    摘要: A voltage multiplier circuit operates in response to a received clock signal to perform a voltage multiplication operation on an input voltage to generate an output voltage. The voltage multiplier circuit includes a pair of intermediate nodes that are capacitively coupled to receive, respectively, opposite phases of a clock signal. A first CMOS driver circuit is coupled to one of the intermediate nodes and has an output configured to generate one phase of a level shifted output clock signal. A second CMOS driver circuit is coupled to another one of the intermediate nodes and has an output configured to generate another phase of the level shifted output clock signal.

    Non-volatile memory (NVM) with dummy rows supporting memory operations

    公开(公告)号:US10127990B1

    公开(公告)日:2018-11-13

    申请号:US15652564

    申请日:2017-07-18

    发明人: Vikas Rana

    摘要: A memory array includes rows and columns with memory cell portion and a dummy cell portion. Bit lines are connected to the memory cells and to the dummy cell portion. The dummy cell portion includes a first row of dummy cells and a second row of dummy cells. The dummy cells in the first row have a first connection to a corresponding bit line of a first bit line group of the bit lines and a second connection to a first source line. The dummy cells in the second row have a first connection to a corresponding bit line of a second bit line group of the plurality of bit lines and a second connection to a second source line. The dummy cells are selectively actuated to couple voltages at the first and second source lines to the first and second bit line groups, respectively, depending on memory operating mode.