摘要:
A method of testing an electronic device including first and second semiconductor devices connected to each other with a plurality of bus lines. First, the first semiconductor device supplies a selected one of the bus lines with a first logical output signal. Then, the second semiconductor device acquires a first bus line signal from the selected bus line. The second semiconductor device inverts the first bus line signal to generate a second logical output signal. The second semiconductor device transmits the second logical output signal to the first semiconductor device. The first semiconductor device receives a second bus line signal from the selected bus line. The first semiconductor device compares the first logical output signal and the second bus line signal to detect a connection between the first semiconductor device and the second semiconductor device.
摘要:
A duplex memory control apparatus having a first control unit containing a first memory and a second control unit containing second memory, a first control unit and a second control unit connected to each other through a bus. The first control unit having a central processing unit writing write data in the first memory; a transmitter obtaining the write data to be written in the first memory by the central processing unit, a transmitter, when a write data can be specified based on another write data previously obtained, transmitting specific data smaller than a write data to the second control unit instead of the write data; a first bus mutually connecting the central processing unit, the first memory an the transmitter; a first direct memory access unit reading the write data held int eh first memory through the first but; a second bus connected with a first direct memory access unit; and an access limiter connected to the first bus and the second bus and limiting to use the first bus by the first direct memory access unit when the central processing unit uses the first bus. The second control unit having a data producing section receiving the specific data from the transmitter and producing an original write data based on the specific data; and a second direct memory access unit writing the original write data produced by the data producing section into the second memory.
摘要:
The sending/receiving unit of an STM switch is provided with a converting circuit for converting time division multiplexed frames of an STM network to cells of an ATM network and a converting circuit for converting cells of an ATM network to time division multiplexed frames of an STM network. The STM switch time division multiplexes data from terminals, converts the time division multiplexed frame to cells and sends the cells to an ATM switch. Cells switched by an ATM switch and sent to the STM switch are converted to time division multiplexed frames by the STM switch, whence the frames are sent to prescribed terminals.
摘要:
An exchange equipment using STM able to achieve an improvement of an efficiency of use and an improvement of ease of increase of terminal cards, that is, an STM type exchange, including a time switch, for performing exchange processing of time division multiplexed data, wherein a ring highway is connected via a terminal common unit to an upstream highway and a downstream highway coupled to this time switch via a highway interface unit or directly and wherein a plurality of terminal cards are connected to this ring highway. Each terminal card is provided with an add/drop unit which drops and adds the data from and to an assigned time slot on the ring highway according to control information indicating time slot assignment information determined by the control unit and adds the data and with a card control unit which controls the add/drop unit.
摘要:
The invention aims at securely generating an internal supply voltage when turning on the power supply of internal circuits in a semiconductor integrated circuit where the operation voltage is low, and securely resetting the internal circuits. The voltage generator generates an internal supply voltage supplied to the internal circuits based on the reference voltage by using the external supply voltage supplied from the exterior. That is, the voltage generator forcibly supplies the external supply voltage as internal supply voltage when the power-on reset signal is activated. Therefore, when the external supply voltage is low at the time of turning-on of the power, and the voltage generator does not operate normally, the internal supply voltage can be securely generated following the external supply voltage so as to be supplied to the internal circuits.
摘要:
A semiconductor device which is capable of shutting off the influence of noise introduced into a reference voltage while preventing an increase in die size. The semiconductor device including a reference potential generator, first and second filter, and first and second input circuit. The reference potential generator generates a reference potential in accordance with a first power supply. The first filter is connected to the first power supply and filters the reference potential to generate a first filtered reference potential. The second filter is connected to a second power supply and filters the reference potential to generate a second filtered reference potential. The first input circuit is connected to the first power supply and receives the first filtered reference potential to generate a first predetermined voltage. The second input circuit is connected to the second power supply and receives the second filtered reference potential to generate a second predetermined voltage.
摘要:
A semiconductor memory device writes data to memory cells contained in the memory device in response to an enable signal supplied thereto. The memory device includes, a pair of bit lines connected to the memory cells, and a sense amplifier connected to the pair of bit lines to latch cell data read from the memory cells. The pair of bit lines couples to a data writing circuit, which writes data to the memory cells in response to the first enable signal. The memory device also includes a switching circuit connected to the sense amplifier, for disabling the sense amplifier in response to the first enable signal.
摘要:
A data transfer system including an exchange, wherein the exchange transfers data by sharing a plurality of channels by a time division multiplex mode. In this case, the exchange transfers the data by variably allocating respective time slots to be occupied by the respective channels. That is, it is possible to allot any line speed to any channel and therefore possible to mix signals with different data transfer speeds in the frames. This results in an exchange network with a high degree of freedom of transfer for the subscriber terminal equipment.
摘要:
A packet data switching system having packet switching equipment and a plurality of transfer control units cooperating with the packet switching equipment exchanging packet data to be transferred through the transfer control units. In the system each packet data is divided into packet frames each having the same frame length and all the packet frames are processed synchronously in each of the transfer control units. Each of the packet frames is composed of a header area and data area. The header area is used for indicating transfer control information, such as an address of a destination transfer control unit and a continuous transmission flag which denotes that the related packet frame should be exchanged to the same destination as that of the preceding packet frame.
摘要:
Disclosed is a semiconductor memory device. A read control signal is externally input in read mode, and a test mode signal is externally input in a mode for testing memory cells. Based on the input read control signal, plural pieces of read data read out from a plurality of memory cells are latched by a plurality of latch circuits. Output signals of the latch circuits are input to a data compressor, which checks if the output signals of the latch circuits are the same and outputs a resultant signal in a form of compressed data of one bit. The output signal of the data compressor is input to an output circuit, which outputs the output signal of the data compressor based on the input test mode signal. A preset circuit allows the latch circuits to latch different pieces of data based on the test mode signal and the read control signal.