摘要:
Various embodiments for a multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample are disclosed. The multi-focal SIM system performs a focusing, scaling and summing operation on each generated multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.
摘要:
The invention relates to an optical measuring system (1) and to a method for measuring an object (9) in a three-dimensional manner. The measuring system (1) has at least one lens array (5), a first convex lens (6) arranged downstream, a second convex lens (8) which is arranged further downstream and which faces an object (9) to be measured, and additionally a means (7) which absorbs incident light or deflects incident light out of the illuminating beam path and which is arranged upstream of the second convex lens (8) or on the second convex lens (8) on a second convex lens (8) face facing the first convex lens (6) in the region of the optical axis (10).
摘要:
An actinic, through-pellicle EUV mask inspection or metrology system acquires image information by scanning an array of focused illumination spots across a photomask and detecting the mask reflectance signal from each spot in synchronization with the scan motion. The radiation from each spot is detected by a detector comprising four quadrant sensors to provide information on the angular reflectance distribution, which is sensitive to the reflectance phase. The focal spots are generated from achromatic EUV microlenses (phase-Fresnel, Schupmann doublets), enabling the use of a high-bandwidth, high-power, laser-produced-plasma EUV source for high-throughput operation. The microlens foci are projected through illumination optics (EUV mirrors) onto the focal spots at the mask, and the microlenses nullify the illumination optics' geometric aberrations for substantially aberration-free point imaging. Aberration-correcting micro-optics may also be used for the collection optics between the mask and the detector array.
摘要:
A device for increasing the depth discrimination of optical imaging systems includes elements for structuring illumination light in an illumination beam of the optical imaging system by application of a grating-like pattern in a conjugate object plane of the optical imaging system. The device further elements for varying the position of the grating-like patterns along an optical axis of the illuminating beam, and elements that vary the position of an image of the grating-like pattern on a specimen in an object plane. The invention may include a grating changer connected to an electronic control system or to a control program of the optical imaging system for automatically changing the grating-like pattern to at least one further grating-like pattern and/or for removing the grating like pattern from the illuminating beam path.
摘要:
The present invention relates to a method of obtaining multiple images with a spatially varying periodic fringe pattern produced by a digital light projector that is spatially and temporally synchronized to the rolling shutter exposure of a two-dimensional pixel array detector. Two or more images obtained with phase-shifted spatial fringe patterns are combined to form a composite image with the spatial fringes and other unwanted scattered light removed.
摘要:
The invention relates to a method for scanning along a continuous scanning trajectory with a scanner system (100) comprising a first pair of acousto-optic deflectors (10) for deflecting a focal spot of an electromagnetic beam generated by a consecutive lens system (200) defining an optical axis (z) in an x-z plane, and a second pair of acousto-optic deflectors (20) for deflecting the focal spot in a y-z plane being substantially perpendicular to the x-z plane, characterised by changing the acoustic frequency sweeps with time continuously in the deflectors (12, 12′) of the first pair of deflectors (10) and in the deflectors (22, 22′) of the second pair of deflectors (20) so as to cause the focal spot to move continuously along the scanning trajectory.
摘要:
Methods and systems are provided for suppressing speckle and/or diffraction artifacts in coherent structured illumination sensing systems. A coherent radiation pattern forms an interference pattern at an illumination image plane and illuminates an object. Radiation scattered or otherwise emitted by the object is detected to produce a signal, which is integrated in time. Coherent artifact suppression is attained by using a spatial modulator, such as an acousto-optic device, to vary a phase gradient at the illumination image plane during the signal integration time. Various embodiments are provided for purposes including without limitation: preserving the depth of field of the coherent illumination; using the same acousto-optic device for pattern generation and coherent artifact suppression; electronically controlling the effective spatial coherence of the illumination system; and reducing errors due to coherent artifacts in a laser-based three dimensional imaging system.
摘要:
The embodiments of this invention use a multi-point scanning geometry. This design maintains the high frame rate of the slit-scan system and still allows both grayscale and multi-spectral imaging. In a confocal configuration, the multi-point scanning system's confocal performance is close to that of a single point scan system and is expected to yield improved depth imaging when compared to a slit-scan system, faster imaging than a point scan system, and the capability for multi-spectral imaging not readily achievable in a Nipkow disk based confocal system.
摘要:
The invention relates to a device for increasing the depth discrimination of optical imaging systems. Such a device comprises means for structuring illumination light in an illumination beam of the optical imaging system by means of a grating-like pattern in a conjugated object plane of the optical imaging system. The device further comprises means for varying the position of the grating-like patterns along an optical axis of the illuminating beam, and means for varying the position of an image of the grating-like pattern on a specimen in an object plane.Such a device is characterized by a grating changer connected to an electronic control system or to a control program of the optical imaging system for automatically changing the grating-like pattern to at least one further grating-like pattern and/or for removing the grating-like pattern from the illuminating beam path.
摘要:
Method for measuring the shape of a section of a semi-transparent object such as one section of a tooth, using a light source for generating light with a broadband spectrum in a device for generating a multifocal illumination pattern, a lens with a large chromatic aberration for imaging foci of the illumination pattern onto the object, and a detection device for determining the wavelength spectra of the foci confocally imaged onto the object via the lens, wherein a spectral peak position of each focus is determined from the respective wavelength spectrum, from which position the extent of the object in the direction of the imaging beam (Z coordinate) is calculated.