Abstract:
Aspects of a tandem dispersive range monochromator are described herein. In one embodiment, the monochromator includes a light source that provides broadband light, a tandem diffraction grating including a first diffraction grating and a second diffraction grating, a grating drive motor that rotates the tandem diffraction grating to provide dispersed wavelengths of light, a detector that detects a portion of the dispersed wavelengths of light, and processing circuitry that controls a grating drive motor to regulate an angular velocity of the tandem grating based on an angular orientation of the tandem diffraction grating. By using a tandem diffraction grating having different dispersive surfaces, measurements of relatively high precision and quality may be taken throughout a wider spectral range. In another aspect, the processing circuitry controls a sample drive motor to vary an angle of incidence of the dispersed wavelengths of light onto a sample for evaluation.
Abstract:
A multimode local probe microscope having a resonator, a first electrode, and a second electrode, an excitation source adapted to generate mechanical resonance in the resonator, a metal tip fastened to the resonator, movement mechanism for imparting relative movement between the local probe and a sample and adapted to bring the end of the tip to within a distance Z lying in the range 0 to 100 nm, and detector for detecting at least one electrical signal representative of friction forces at the terminals of said electrodes. The metal tip is electrically connected to the output second electrode and the microscopy apparatus includes amplifier and filter for amplifying and filtering signals relating to the friction forces and to the tunnelling current in a single electronic circuit, and configured for regulating the distance Z between the end of the tip and the surface of the sample.
Abstract:
A spectral microscopy device includes a spectral detecting unit including a light source capable of controlling an output wavelength, a microscope section having an observation area illuminated with light output from the light source, and a signal detector that detects light from the observation area as spectral data; a moving unit configured to move the observation area; and a controller that performs a control operation to allow the spectral detecting unit and the moving unit to move in response to each other. The spectral microscopy device is controlled so that switching between different measurement conditions based on the number of measurement points is performed at an observation area movement time in which the observation area is moved by the moving unit and measurement is performed and at a an observation area movement stoppage time in which the observation area is fixed and measurement is performed, and spectral data is detected.
Abstract:
A transmission-reflectance swappable Raman device and a method thereof are disclosed. The excitation light is selectively directed to the sample in one direction for generating the transmission Raman signal in transmission mode or in another direction for generating the reflectance Raman signal in reflectance mode. The content of an analyte in a sample can be determined by analyzing transmission and reflectance Raman signal.
Abstract:
A monochromator has at least one optical grating which is rotatable in relation to incident light of a source of light, a drive unit to rotate the optical grating by a connected drive rod around a longitudinal axis, and a control unit to control the drive unit and thereby the rotation of the optical grating. The drive unit further has a first damping element with at least one electrical conductive surface, and a second damping element which provides at least one magnetic field having a magnetic axis which penetrates the electrical conductive surface. One of the first and second damping elements is fixed to the drive rod and is rotatable along with the drive rod around the longitudinal axis thereof in relation to the other one of the second or first damping element.
Abstract:
A spectrometer (1) comprises a light source (2), a monochromator (3) with at least one diffraction grating (4), a monochromator housing (5), an order sorting filter (7), a microplate receptacle (12) and a controller (6). The order sorting filter (7) of the spectrometer (1) comprises a substrate (23), a first optical thin film (24) and a second optical thin film (25), wherein, in a spatially partly overlapping and interference-free manner, the first optical thin film (24) is arranged on a first surface (26) and the second optical thin film (25) is arranged on a second surface (27) of the substrate (23). A spectrometer (1) equipped with a respective order sorting filter is used in a scanning method for detecting the absorption spectrum of samples examined in wells (14) of microplates (13).
Abstract:
The present invention relates to a multimode local probe microscope having a resonator (1), a first electrode (9), and a second electrode (8), an excitation source adapted to generate mechanical resonance in the resonator, a metal tip (4) fastened to the resonator, movement means for imparting relative movement between the local probe and a sample and adapted to bring the end of the tip to within a distance Z lying in the range 0 to 100 nm, and detector means for detecting at least one electrical signal representative of friction forces at the terminals of said electrodes (8, 9). According to the invention, said metal tip (4) is electrically connected to said output second electrode (9) and the microscopy apparatus includes amplifier and filter means for amplifying and filtering signals relating to the friction forces and to the tunnelling current in a single electronic circuit, and means for regulating the distance Z between the end of the tip and the surface of the sample.
Abstract:
A system and method for determining bias in a spectrometer is described. One embodiment includes a method for determining bias in a spectrometer system, the method comprising over-scanning a grating in a near-zero-response wavelength range; and determining a bias based on the over-scanning. This methodology allows for over-scanning a grating in a near-zero-response wavelength range as a substitute for using shutters or other mechanisms to block light from entering a detector in the system.
Abstract:
An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.
Abstract:
Exemplary systems and methods for filtering an electromagnetic radiation can be provided. For example, at least one first arrangement can be provided which is capable of receiving at least one first electro-magnetic radiation and forwarding at least one second electro-magnetic radiation at different angles with respect to a direction of incidence of the first electro-magnetic radiation. At least one second wavelength dispersion arrangement can be provided which is configured to receive the second electro-magnetic radiation, forward at least one third electro-magnetic radiation to the first arrangement and further receive at least one fourth electro-magnetic radiation. The third electro-magnetic radiation can be based on the second electro-magnetic radiation, and the fourth electro-magnetic radiation can be based on the third electro-magnetic radiation. For example, the second arrangement can be configured to forward the second electro-magnetic radiation at different angles with respect to a direction of incidence of the at least one particular electro-magnetic radiation. Exemplary embodiments of methods can be provided to implement such exemplary techniques.