Multisource infrared spectrometer
    481.
    发明授权
    Multisource infrared spectrometer 失效
    多源红外光谱仪

    公开(公告)号:US6034370A

    公开(公告)日:2000-03-07

    申请号:US176884

    申请日:1998-10-22

    Abstract: A spectrometer having a source of broad band infrared energy, a relay mirror that focuses the infrared energy at an intercepting mirror, a first object mirror that collimates the infrared energy from the intercepting mirror, a spatial light modulator that receives the collimated infrared energy and reflects it back to the first object mirror, the spatial light modulator including deformable mirror elements, and a controller that deforms the mirror elements according to a predetermined pattern. Deformable mirror elements obtain needed spectra while reducing the mechanical complexity of the spectrometer.

    Abstract translation: 具有宽带红外能量源的光谱仪,将红外能量聚焦在拦截镜处的中继镜,准直来自拦截镜的红外能量的第一物镜,接收准直红外能量并反射的空间光调制器 它回到第一物镜,包括可变形镜元件的空间光调制器和根据预定图案使镜元件变形的控制器。 可变形的镜子元件获得所需的光谱,同时降低光谱仪的机械复杂性。

    Interferometer having a micromirror
    482.
    发明授权
    Interferometer having a micromirror 失效
    干涉仪具有微镜

    公开(公告)号:US6025912A

    公开(公告)日:2000-02-15

    申请号:US853562

    申请日:1997-05-08

    CPC classification number: G01J3/45 G01J3/4535 G01J9/02

    Abstract: An interferometer includes a beamsplitter for splitting a source beam into a test beam and a reference beam, an imaging device for detecting an interference pattern, a mirror disposed in a path of the test beam for reflection of the test beam toward the imaging device, a micromirror disposed in a path of the reference beam for reflection of a portion of the reference beam toward the imaging device, and a focusing mechanism disposed for focusing the reference beam on the micromirror. The micromirror has a lateral dimension not exceeding the approximate lateral dimension of a central lobe of the reference beam focused thereon by the focusing mechanism. A spatial filter for reducing effects of aberration in a beam includes a reflector disposed upon a transparent base wherein the reflector has a lateral dimension not exceeding the approximate lateral dimension of a central lobe of the spatial intensity distribution of the beam focused upon the reflector. A method of filtering a beam in a wavefront measurement system is also provided. This method includes focusing the beam, reflecting a particular first portion of the focused beam, and transmitting a second portion of the beam.In accordance with Office policy under M.P.E.P. Sec. 608.01(b), Applicant submits herewith as a part of the submitted Substitute Specification, a separate sheet with the subject Abstract as currently rewritten.

    Abstract translation: 干涉仪包括用于将源束分解成测试光束和参考光束的分束器,用于检测干涉图案的成像装置,设置在测试光束的路径中以用于将测试光束反射到成像装置的反射镜, 设置在参考光束的路径中的微镜,用于将参考光束的一部分反射到成像装置;以及聚焦机构,设置成用于将参考光束聚焦在微镜上。 微镜的横向尺寸不超过由聚焦机构聚焦在其上的参考光束的中心波瓣的近似侧向尺寸。 用于减小光束中的像差影响的空间滤光器包括设置在透明基底上的反射器,其中反射器的横向尺寸不超过聚焦在反射器上的光束的空间强度分布的中心波瓣的近似侧向尺寸。 还提供了一种在波前测量系统中对波束进行滤波的方法。 该方法包括聚焦光束,反射聚焦光束的特定第一部分,以及透射光束的第二部分。 根据M.P.E.P.的办公室政策。 第 608.01(b),申请人作为提交的替代规范的一部分提交了与当前重写的主题摘要的单独的表格。

    Apparatus and method for interferometric measurements
    483.
    发明授权
    Apparatus and method for interferometric measurements 失效
    用于干涉测量的装置和方法

    公开(公告)号:US5910840A

    公开(公告)日:1999-06-08

    申请号:US892055

    申请日:1997-07-14

    CPC classification number: G01J3/26 G01J3/45

    Abstract: A light source supplies light to an interferometer or polarimetric sensor and a beam divider divides the emerging light into two or more beam paths. Interference filters having different central wavelengths are provided in the beam paths and can be used to bring the two uncoupled interference signals into quadrature, e.g. by suitable adjustment of the tilting angle. In each beam path, a measuring device for quantitatively measuring the received light is disposed, and the data from the measuring devices are supplied to a data-processing device.

    Abstract translation: 光源将光提供给干涉仪或偏振传感器,并且分束器将出射的光分成两个或更多个光束路径。 在波束路径中提供具有不同中心波长的干涉滤波器,并且可用于使两个非耦合干扰信号成正交。 通过适当调整倾斜角度。 在每个光束路径中,设置用于定量测量接收光的测量装置,并将来自测量装置的数据提供给数据处理装置。

    Method and apparatus for calibrating spectral radiometers
    484.
    发明授权
    Method and apparatus for calibrating spectral radiometers 失效
    用于校准光谱辐射计的方法和装置

    公开(公告)号:US5311273A

    公开(公告)日:1994-05-10

    申请号:US936483

    申请日:1992-08-28

    CPC classification number: G01J5/522 G01J3/45 G01J2003/2866

    Abstract: A method and an apparatus are provided for calibrating a spectrometer, in particular a Fourier transform spectrometer (FTS), in particular for the infrared spectral range. At least four black body radiators of different temperatures are provided, which are arranged horizontally, i.e. parallel to the surface of the earth, thereby avoiding temperature gradients due to convection. The temperature of the at least four radiators is determined by means of the calibrating method without a separate measurement. In the method according to the invention, at the same time the absorption of the atmosphere is considered as a characteristic of the spectrometer, thereby eliminating separate measurement and correction thereof. In addition, for Fourier transform spectrometers the calibration is carried out by means of complex spectra.

    Abstract translation: 提供了用于校准光谱仪,特别是傅里叶变换光谱仪(FTS)的方法和装置,特别是用于红外光谱范围。 提供了至少四个不同温度的黑体散热器,其水平布置,即平行于地球表面,从而避免由于对流而引起的温度梯度。 至少四个辐射器的温度通过校准方法确定,而不需要单独的测量。 在根据本发明的方法中,同时吸收大气被认为是光谱仪的特征,从而消除了单独的测量和校正。 此外,对于傅里叶变换光谱仪,校准是通过复谱进行的。

    Scanning sensor system including an FT-IR interferometer
    485.
    发明授权
    Scanning sensor system including an FT-IR interferometer 失效
    扫描传感器系统包括FT-IR干涉仪

    公开(公告)号:US5094535A

    公开(公告)日:1992-03-10

    申请号:US417961

    申请日:1989-10-06

    Abstract: An on-line scanning sensor system includes first and second horizontally extending guide members connected by side members to define a rigid box-like frame, and a support structure for suspending the box-like frame via vibration-absorbing devices such that vibrations are substantially attenuated before reaching the guide members. Further, the system includes a carriage mounted on the first guide member for scanning motion across a traveling web of sheet of material, and interferometer components mounted to the carriage for splitting and recombining infrared light and for directing a collimated beam of the recombined light onto the traveling sheet. Still further, the system includes a detector for receiving light from the interferometer components during scanning.

    Abstract translation: 在线扫描传感器系统包括通过侧面构件连接以限定刚性盒状框架的第一和第二水平延伸的引导构件,以及用于通过振动吸收装置悬挂盒状框架使得振动基本上衰减的支撑结构 在到达指导成员之前。 此外,该系统包括安装在第一引导构件上的滑架,用于跨越材料片的移动腹板扫描运动,以及安装到滑架上的干涉仪组件,用于分离和重新组合红外光并将重组光的准直束引导到 旅行单 此外,该系统包括用于在扫描期间从干涉仪部件接收光的检测器。

    Apparatus for the optical measurement of spectra distribution
    486.
    发明授权
    Apparatus for the optical measurement of spectra distribution 失效
    用于光谱分布光学测量的装置

    公开(公告)号:US4929080A

    公开(公告)日:1990-05-29

    申请号:US194391

    申请日:1988-05-16

    Inventor: Herschel Burstyn

    Abstract: An optical double-balanced quadrature mixer for analysis of optical spectra, particularly asymmetric optical spectra. Beam splitting means are used in conjunction with a quarter wavelength retardation plate to enable highly stable, accurate and precise spectral analysis. The invention is illustrated in the context of a generic light scattering test setup.

    Abstract translation: 一种光学双平衡正交混频器,用于分析光谱,特别是不对称光谱。 光束分束装置与四分之一波长延迟板一起使用,以实现高度稳定,精确和精确的光谱分析。 在通用光散射测试装置的上下文中说明本发明。

    ON-CHIP FOURIER TRANSFORM SPECTROMETER BASED ON DOUBLE-LAYER HELICAL WAVEGUIDE

    公开(公告)号:US20240337536A1

    公开(公告)日:2024-10-10

    申请号:US18413015

    申请日:2024-01-15

    CPC classification number: G01J3/45 G02F1/212 G02F1/2252 G01J2003/4538

    Abstract: An on-chip Fourier transform spectrometer based on a double-layer spiral waveguide comprises, in order, a waveguide input coupler, a 1×N optical splitter, N double-layer waveguide Y-branch structures, N double-layer spiral waveguides with incremental lengths, N double-layer waveguide Y-branch structures arranged in opposite directions, and N germanium-silicon detectors. The group index difference between the odd mode and the even mode in the double-layer waveguide makes the double-layer spiral waveguide function like an asymmetric Mach-Zehnder interferometer. N double-layer spiral waveguides with incremental lengths are used to achieve a spatial heterodyne based Fourier transform spectrometer. Spectral reconstruction from the measured interference fringes can be achieved by a regression algorithm. The invention meets the application need for miniaturization and portability of Fourier transform spectrometers, and has lower temperature sensitivity compared with the existing on-chip spectrometers on the silicon platform.

    MULTI-SECTIONED WINDOW FOR SPECTROSCOPIC DEVICE

    公开(公告)号:US20240247980A1

    公开(公告)日:2024-07-25

    申请号:US18159216

    申请日:2023-01-25

    CPC classification number: G01J3/021 G01J3/45 G02B1/11

    Abstract: The present disclosure includes an optical head for a spectroscopic device configured to produce a beam of light, a reference signal detector, and a signal detector. A mirror reflects the beam of light from the light source toward a multi-sectioned window having a top side and a bottom side. The bottom side includes an AR coating and the top side has a first section including an AR coating and a second section including a beam splitter with transmittance and reflectance. A first beam path for the beam of light is defined by the mirror, the second section of the multi-sectioned window, and the reference signal detector. A second beam path for the beam of light is defined by the mirror, the second section of the multi-sectioned window, a medium contained in the spectroscopic device, an additional mirror, the first section of the multi-sectioned window, and the signal detector.

    System and method for synchronized stage movement

    公开(公告)号:US12038375B2

    公开(公告)日:2024-07-16

    申请号:US17830327

    申请日:2022-06-01

    Inventor: Peter Steinberg

    Abstract: An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.

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