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公开(公告)号：US10725069B1
公开(公告)日：2020-07-28
申请号：US16134346
申请日：2018-09-18
发明人： John Nelson , Ranauld Perez , Jeffrey Sherry , Michael Andres , David Johnson
摘要： The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.
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公开(公告)号：US20180067145A1
公开(公告)日：2018-03-08
申请号：US15795829
申请日：2017-10-27
发明人： Michael Andres
CPC分类号： G01R1/06738 , G01R31/2887 , H05K3/00
摘要： A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the test pin is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested. The test pin has a hard stop edge which engages a hard stop wall which limits its rotation movement. The bottom of the pin has a shallow convex curvature preferably with a flat region and the tip of the test pin has a chisel edge.
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公开(公告)号：US20170023613A1
公开(公告)日：2017-01-26
申请号：US15055611
申请日：2016-02-28
发明人： Michael Andres
CPC分类号： G01R1/06738 , G01R31/2887 , H05K3/00
摘要： A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the test pin is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested. The test pin has a hard stop edge which engages a hard stop wall which limits its rotation movement. The bottom of the pin has a shallow convex curvature preferably with a flat region and the tip of the test pin has a chisel edge.
摘要翻译： 用于可安装到测试仪装置的负载板的测试装置中的触点。 用于将被测试设备的至少一个引线与负载板上的对应金属迹线电连接的接触件具有限定多个接触点的第一端。 当测试销围绕大致垂直于由触点限定的平面的轴线旋转时，连续的接触点被被测器件的引线依次接合。 测试销具有硬止动边缘，其与限制其旋转运动的硬止动壁接合。 销的底部具有较浅的凸曲率，优选地具有平坦区域，并且测试销的尖端具有凿子边缘。
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公开(公告)号：US20160370406A1
公开(公告)日：2016-12-22
申请号：US15249605
申请日：2016-08-29
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
CPC分类号： G01R1/0466 , G01R1/045 , G01R1/07307
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
摘要翻译： 公开了一种用于在被测器件（DUT）和提供轴向对准的上下接触点的负载板之间提供接触针的结构和方法。 销具有上部（30）和下部（32）部分以及在其间允许上部和下部接触（24/26）的挠曲的铰链（44/46），但是该轴向对准可以直接替代 POGO引脚，但具有更高的可靠性。 它还包括通过使用改进的铰链244a去除上销230的结构和方法。
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公开(公告)号：US20150123689A1
公开(公告)日：2015-05-07
申请号：US14594872
申请日：2015-01-12
发明人： John E. Nelson , Jeffrey C. Sherry , Patrick J. Alladio , Russell F. Oberg , Brian Warwick , Gary W. Michalko
CPC分类号： G01R31/2891 , G01R1/0416 , G01R1/06738 , G01R1/06744 , G01R1/0735 , G01R3/00 , G01R31/2887 , G01R31/2889 , H01R43/16 , Y10T29/49204
摘要： The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface.
摘要翻译： 被测器件的端子通过一系列导电引脚对临时电连接到负载板上的对应接触焊盘。 销对通过插入器膜保持在适当的位置，该插入器膜包括面向被测器件的顶部接触板，面向负载板的底部接触板以及位于顶部和底部接触板之间的垂直弹性的非导电部件。 每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。 顶部和底部销在相对于膜表面正常倾斜的界面处彼此接触。 当纵向压缩时，销沿着界面滑动朝向彼此平移。
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公开(公告)号：US20130342233A1
公开(公告)日：2013-12-26
申请号：US13921484
申请日：2013-06-19
发明人： Jathan Edwards , Charles Marks , Brian Halvorson
CPC分类号： G01R1/06733 , G01R1/07307 , G01R3/00 , G01R31/2601 , Y10T29/49204
摘要： A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). The elastomer is precompressed from its natural rest state between a top (22) plate and a bottom (70). Pre compression improves the resilient response of the pins. The pin crows (40) are maintained relatively coplanar by the engagement of at least one flang (44a-b) against an up-stop surface 90 of plate 20, thereby insuring coplanarity of the crowns. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.
摘要翻译： 公开了一种用于IC电路的晶片级测试的测试装置。 上销和下销（22,62）构造成彼此相对滑动并且被弹性体（80）保持电偏压接触。 弹性体从顶部（22）板和底部（70）之间的自然静止状态预压缩。 预压缩提高了引脚的弹性响应。 销鸦（40）通过至少一个凸缘（44a-b）与板20的上止止表面90的接合而保持相对共面，从而确保冠的共面性。 销引导件（12）通过建立配准角（506）而与保持器14保持对准，并且通过至少一个对角相对的拐角处的弹性体将引导件驱动到拐角中。
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公开(公告)号：US20240241153A1
公开(公告)日：2024-07-18
申请号：US18408107
申请日：2024-01-09
发明人： Valts Treibergs
CPC分类号： G01R1/06722 , G01R1/07314 , H01R13/2421
摘要： A compliant probe contact assembly for a testing system for testing integrated circuit devices is provided. The contact assembly includes an upper plunger including a first shoulder separating an upper shaft from a lower shaft, and a retainer proximate an end of the lower shaft. The contact assembly also includes a first receiver and a second receiver configured to engage with the upper plunger, each of the first and second receivers including a second shoulder having a shoulder stop. The contact assembly further includes a biasing member. When the contact assembly is assembled, the biasing member is captured between a bottom of the first shoulder and the shoulder stops of the first and second receivers. The upper plunger separates sides of upper portions of the first and second receivers. Sides of lower portions of the first and second receivers contact with each other.
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公开(公告)号：US11906576B1
公开(公告)日：2024-02-20
申请号：US17730391
申请日：2022-04-27
CPC分类号： G01R31/2886 , G01R1/06738 , G01R3/00
摘要： A contact assembly for a testing system for testing integrated circuit devices is disclosed. The contact assembly includes a first blade, a second blade, and an elastomer configured to retain the first blade and the second blade. The first blade and the second blade are electrically conductive. The first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape when assembled. The elastomer is at least columnar in part and non-conductive.
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公开(公告)号：US11821943B2
公开(公告)日：2023-11-21
申请号：US17494086
申请日：2021-10-05
发明人： Valts Treibergs , Pat Joyal , Leslie Fliegelman , Max A. Carideo
IPC分类号： G01R31/28
CPC分类号： G01R31/2889
摘要： A compliant ground block for a testing system for testing integrated circuit devices is disclosed. The compliant ground block includes a plurality of electrically conductive blades in a side by side generally parallel relationship. The blades are configured to be longitudinally slidable with respect to each other. The block also includes an elastomer configured to retain the plurality of blades. Each blade of the plurality of blades includes a first end and a second end opposite to the first end in the longitudinal direction. The plurality of blades is arranged so that the first end of each blade of the plurality of blades is opposite to the first end of an adjacent blade in the longitudinal direction so that the first end of one blade is adjacent the second end of the adjacent blade. The elastomer is at least tubular (e.g., hollow or solid cylindrical) in part and non-conductive.
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公开(公告)号：US11467183B2
公开(公告)日：2022-10-11
申请号：US17063279
申请日：2020-10-05
发明人： Jeffrey Sherry , Joël Erdman
摘要： A test socket for a device under test (DUT) is disclosed in several embodiments. One embodiment shows a test socket base (16) with apertures (30) for insertion of test pin insert blocks (28). The blocks are inserted top—in or bottom—in and are provided with registration bosses 80 and teeth 92 or other means for maintaining registration. Blocks are provided with dielectric constants to achieve different frequency response relative to other pins. To achieve great EMI and cross talk isolation, the socket may be made of aluminum with hard anodize coating to insulate test pins (32) from the housing.
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