摘要:
A high-speed clock-synchronous memory device is provided with a sense amplifier S/A shared by and between cell arrays, and a cell array controller unit CNTRLi, wherein input and output of data/command synchronous with the clock, access command supplies all address data bits (row and column) simultaneously. By acknowledging a change in bits observed between tow successive commands, regarding some of the address bits configuring an access address, the device judges whether the current access is made within the same cell array as the preceding access, between the neighboring cell arrays, or between remote cell arrays. According to the judgment, suitable command cycle is applied. At this time, the command cycle satisfies the relationship: S·N·F.
摘要:
The present invention relates to overdrive circuits for generating an operational potential of a sense amplifier. For example, a switch circuit is used to connect a drive node of the sense amplifier with a overdrive potential generation circuit for generating an overdrive potential to be applied to bit lines. A restoration potential generation circuit comprises a push-pull regulator circuit for generating a restoration potential to be applied to bit lines. Consequently, the restoration potential generation circuit can directly connect with the sense amplifier's drive node.
摘要:
A dynamic random access memory device includes a bit line, a memory cell coupled to the bit line, and a word line coupled to the memory cell. A read activation time between receiving a read command for a read operation in order to read data: from the memory cell and activating the word-line-may be different from a write activation time between receiving a write command for a write operation in order to write data to the memory cell and activating the word line.
摘要:
First transistors for charging respective one side nodes of a plurality of capacitors are connected to these nodes of the capacitors, respectively. Second transistors for outputting electric charge of each capacitor are connected between respective one side nodes of the capacitors and an output terminal, respectively. A plurality of third transistors for transferring the electric charge of the other side nodes of the capacitors to the other nodes are connected to the respective other nodes. The electric charge of each capacitor is serially transferred from nodes of a high electric potential to nodes of a lower electric potential through one path by sequentially controlling the third transistors, or the electric charge of each capacitor is parallel transferred between arbitrary nodes of a high electric potential and low nodes through a plurality of paths. By these operations, electric charge of each capacitor is recycled.
摘要:
A delay circuit produces an activation signal by delaying a clock signal by 270 degrees. A receiver circuit is responsive to the activation signal to capture a command latch enable signal indicating a command cycle and produce an internal signal corresponding to the command cycle. An AND circuit produces a command latch signal synchronized with the clock signal during an interval in which the internal signal is produced. Command receivers take command-forming signals only when the command latch signal is applied thereto. That is, these command receivers are activated only when the command latch signal is received but not at all times. This prevents power dissipation from increasing and allows a plurality of signals to be monitored reliably.
摘要:
This invention discloses the layout of word line driving circuits for driving word lines. A semiconductor memory device includes a memory cell array having a bit line, n memory cells connected to the bit line, and n word lines respectively connected to the n memory cells. The semiconductor memory device further includes n/2 first word line driving circuits for driving n/2 word lines of the n word lines, and n/2 second word line driving circuits for driving the remaining n/2 word lines of the n word lines. The second word line driving circuits are arranged at the positions where the second word line driving circuits face the first word line driving circuits via the memory cell array.
摘要翻译:本发明公开了用于驱动字线的字线驱动电路的布局。 一种半导体存储器件包括具有位线的存储单元阵列,+ E,连接到位线的uns n + EE存储器单元,以及分别连接到+ E,uns n + EE的+ E,uns n + EE字线 记忆细胞 半导体存储器件还包括用于驱动+ E,n n + EE字线的n / 2个字线的n / 2个第一字线驱动电路和用于驱动剩余n / 2个字的n / 2个第二字线驱动电路 行+ E,uns n + EE字线。 第二字线驱动电路被布置在第二字线驱动电路经由存储单元阵列面对第一字线驱动电路的位置。
摘要:
In a semiconductor memory system, an SDRAM comprises a memory cell array 101 which is divided into a plurality of cell array blocks, a column decoder, a row decoder, and a sense amplifier circuit. In the SDRAM, a first operation mode with a first cycle time is set when successive access within a cell array block is conducted, a second operation mode with a second cycle time shorter than the first cycle time is set when successive access covering the cell array blocks being apart from each other is conducted and a third operation mode with a medium cycle time is set when successive access covering the cell array blocks adjacent to each other is conducted. With the above constitution, a high speed access can be realized without provision of a specific accessory circuit while suppressing overhead for a semiconductor chip size.
摘要:
A plurality of memory cells are arranged at crosspoints between a plurality of word lines and a plurality of bit lines. The memory cells include not only normal cells but also spare cells for saving defects. The saving of the defect is effected by replacing the word line or bit line connected to the normal cell with the word line or bit line connected to the spare cell. The replacement is effected by a corresponding pair of fuse circuit and deciding circuit, that is, the fuse circuit for storing the address of a word line or bit line to be replaced and the deciding circuit for, based on the address, deciding whether or not an accessed word line or bit line be replaced. As such a pair use is made of a plurality of pairs and a plurality of kinds are provided as the word lines or bit lines for replacement and can be used in accordance with the size of defects. It is, therefore, possible to effectively save the defective word line or bit line, while avoiding any uneffective replacement.
摘要:
A MOS dynamic random access memory device has a memory cell array section formed on a semiconductor substrate, including memory cells each having a data storage capacitor and a transfer-gate transistor. Parallel bit lines are associated with the memory cell array section. Parallel word lines extend transverse to the bit lines, including a word line connected to the transfer-gate transistor. A booster circuit is arranged to provide a potentially raised voltage which is higher than a power supply voltage. A sense amplifier circuit is connected with a corresponding bit line pair of the word lines. A word-line driver circuit has an input connected to the booster circuit and an output connected to the word line. A bit-line restoring circuit is connected to the sense amplifier circuit. The restoring circuit includes a voltage-down converting metal oxide semiconductor field effect transistor having an insulated gate connected to the booster circuit, a drain coupled to the power supply voltage, and a source at which a potentially decreased voltage appears to be lower than the power supply voltage. The voltage-down converting transistor is same in channel conductivity type as the transfer-gate transistor.
摘要:
A dynamic random access memory has a substrate, plural pairs of parallel bit lines provided on the substrate, parallel word lines insulatively crossing the parallel bit lines to define cross points therebetween, and memory cells provided at the cross points. Each memory cell has a data storage capacitor and a transistor. Sense amplifiers are provided at bit line pairs, respectively, to sense a data voltage. A discharge control section, which is associated with the sense amplifiers, forms discharge paths branched between the bit line pairs and the substrate grounded to progress the discharging of charges, when a certain word line is designated and a memory cell is selected from those memory cells which are connected to the certain word line, whereby the operational speed of the memory is increased.