公开(公告)号：US08367968B2

公开(公告)日：2013-02-05

申请号：US11969000

申请日：2008-01-03

Applicant: James Cordingley ,  Dimitry Maltsev ,  Michael Plotkin

Inventor： James Cordingley ,  Dimitry Maltsev ,  Michael Plotkin

IPC: B23K26/38

CPC classification number: B23K26/0604 ,  B23K26/0624 ,  B23K26/40 ,  B23K2103/172 ,  H01L23/5258 ,  H01L2924/0002 ,  H01L2924/00

Abstract: Laser pulses are selected from a group of closely spaced laser pulses with an optical modulator by adjusting pulse timing relative to an impingement interval. An adjusted pulse is moved from an impingement interval to a non-impingement interval and is blocked. The blocked laser source is stabilized by running nearly continuously. Pulse selection with multiple laser sources is achieved with a single acousto-optic modulator.

Abstract translation: 通过相对于冲击间隔调整脉冲定时，通过光学调制器从一组紧密间隔的激光脉冲中选择激光脉冲。 调整脉冲从冲击间隔移动到非冲击间隔并被阻挡。 封闭的激光源通过几乎连续运行而稳定。 使用单个声光调制器实现具有多个激光源的脉冲选择。

公开(公告)号：US08259770B2

公开(公告)日：2012-09-04

申请号：US12577201

申请日：2009-10-11

Applicant: Boaz Tagansky ,  Michael Plotkin ,  Craig Breen

Inventor： Boaz Tagansky ,  Michael Plotkin ,  Craig Breen

IPC: H01S3/04 ,  H01S5/00 ,  B41J2/385 ,  B41J2/435 ,  G01D15/06 ,  G03G15/01

CPC classification number: B41J2/45 ,  H01S5/042 ,  H01S5/4025

Abstract: Electrophotographic print system, comprising a photosensitive medium, and a laser array being provided with a plurality of laser diodes arranged to emit light onto the photosensitive medium for varying an electrical potential on a surface of the photosensitive medium, and a plurality of heat dissipation diodes, each heat dissipation diode being arranged in proximity to a corresponding laser diode, wherein each laser diode and the corresponding heat dissipation diode are coupled to a common drive circuit and are arranged in opposite current flow directions with respect to each other, so that in use the current flows either through the laser diode or through the heat dissipation diode depending on the current flow direction in the drive circuit.

Abstract translation: 电子照相打印系统，包括感光介质和激光阵列，其设置有多个激光二极管，所述多个激光二极管被布置成将光发射到感光介质上以改变感光介质的表面上的电位，以及多个散热二极管， 每个散热二极管布置在相应的激光二极管附近，其中每个激光二极管和相应的散热二极管耦合到公共驱动电路并且相对于彼此以相反的电流流动方向布置，使得在使用中 电流根据驱动电路中的电流流动方向通过激光二极管或通过散热二极管流动。

公开(公告)号：US08085289B1

公开(公告)日：2011-12-27

申请号：US12258092

申请日：2008-10-24

Applicant: Dror Kella ,  Michael Plotkin ,  Shai Emanueli ,  Boris Aptekar ,  Haim Livne ,  Haim Vladomirski ,  David Kenney Towner

Inventor： Dror Kella ,  Michael Plotkin ,  Shai Emanueli ,  Boris Aptekar ,  Haim Livne ,  Haim Vladomirski ,  David Kenney Towner

IPC: B41J15/14 ,  B41J27/00

CPC classification number: B41J2/471 ,  B41J2/473 ,  G02B26/124 ,  G02B27/58

Abstract: An optical beam is selectively output towards a scanner in accordance with image data for a scan line of an image. The optical beam has a beam irradiance distribution that is elliptical in shape. The optical beam passes through an aperture stop, ordinarily creating side lobes within a focus irradiance distribution of the optical beam. The scanner scans the optical beam to form the scan line on a photosensitive surface by selectively exposing positions along the scan line in accordance with image data. The optical beam is modified before it reaches the photosensitive surface to substantially remove the side lobes that have been created within the focus irradiance distribution and/or to substantially prevent the side lobes from being created within the focus irradiance distribution of the optical beam.

Abstract translation: 根据图像的扫描线的图像数据，选择性地向扫描仪输出光束。 光束具有椭圆形的光束辐照度分布。 光束通过孔径光阑，通常在光束的聚焦辐照度分布内产生旁瓣。 通过根据图像数据选择性地暴露沿着扫描线的位置，扫描仪扫描光束以在感光表面上形成扫描线。 光束在其到达感光表面之前被修改以基本上去除已经在聚焦辐照度分布内产生的旁瓣，和/或基本上防止在光束的聚焦辐照度分布内产生旁瓣。

公开(公告)号：US20110210105A1

公开(公告)日：2011-09-01

申请号：US12976539

申请日：2010-12-22

Applicant: Dmitry N. Romashko ,  Michael Plotkin ,  Jonathan S. Ehrmann ,  James J. Cordingley ,  Shepard D. Johnson

Inventor： Dmitry N. Romashko ,  Michael Plotkin ,  Jonathan S. Ehrmann ,  James J. Cordingley ,  Shepard D. Johnson

IPC: B23K26/00

CPC classification number: H01L23/5258 ,  B23K26/042 ,  B23K26/0732 ,  B23K26/082 ,  H01L21/76892 ,  H01L2924/0002 ,  H01L2924/00

Abstract: Link processing systems and methods use controlled two dimensional deflection of a beam along an optical axis trajectory to process links positioned along and transverse to the trajectory during a pass of the optical axis along the trajectory. Predictive position calculations allow link blowing accuracy during constant velocity and accelerating trajectories.

Abstract translation: 链路处理系统和方法使用沿着光轴轨迹的光束的受控二维偏转，以在沿着轨迹的光轴的通过期间处理沿着和横向于轨迹定位的链接。 预测位置计算允许在恒定速度和加速轨迹期间的链接吹风精度。

公开(公告)号：US20110103813A1

公开(公告)日：2011-05-05

申请号：US12300084

申请日：2006-05-10

Applicant: Eyal Shelef ,  Michael Plotkin ,  Haim Livne ,  Craig Breen ,  Gideon Gidi Amir ,  Barak Markus ,  Maya Shalev ,  Gregory Braverman ,  Shlomo Harush

Inventor： Eyal Shelef ,  Michael Plotkin ,  Haim Livne ,  Craig Breen ,  Gideon Gidi Amir ,  Barak Markus ,  Maya Shalev ,  Gregory Braverman ,  Shlomo Harush

IPC: G03G15/00 ,  G03G15/043

CPC classification number: G03G15/0415 ,  G03G2215/0429

Abstract: A correction method for correcting unintended spatial variation in lightness across a physical image produced by a xerographic process, the method comprising producing a test image using the xerographic process, measuring a difference between actual lightness and intended lightness across at least part of the test image, and varying the light source level used subsequently in the xerographic process to correct for the measured unintended difference.

Abstract translation: 一种校正方法，用于校正通过静电复印印刷工艺产生的物理图像上的无意的空间变化，所述方法包括使用静电印刷工艺产生测试图像，测量穿过至少部分测试图像的实际亮度与预期亮度之间的差异， 并改变随后在静电印迹过程中使用的光源水平，以校正测量的非预期差异。

公开(公告)号：US20070019059A1

公开(公告)日：2007-01-25

申请号：US11187069

申请日：2005-07-22

Applicant: Craig Breen ,  Haim Livne ,  Michael Plotkin

Inventor： Craig Breen ,  Haim Livne ,  Michael Plotkin

IPC: B41J2/435 ,  B41J2/385

CPC classification number: B41J2/473 ,  G03G15/04072 ,  G03G15/55 ,  G03G2215/0404

Abstract: Skew compensation apparatus for compensating for skew of a multi-beam scanning source, comprises: delay commencement detector(s) for detecting the start of a beam scanner position, position detectors for detecting the position of the multiple beams at a predefined interval following the commencement, so that the position indicates skew of the respective beam, and compensating electronics for automatically inserting a compensation for the skew by altering a delay into a timing signal for switching the respective beam. The commencement detector can be an existing start of scan detector and the apparatus can be built into the writing head, particularly at the conjugate location to the focal plane or at the focal plane of a laser printer or the like to provide a self-calibrating printer.

Abstract translation: 用于补偿多光束扫描源的偏斜的偏斜补偿装置包括：用于检测光束扫描器位置的起始的延迟启动检测器，用于在开始之后的预定间隔检测多个光束的位置的位置检测器 ，使得该位置指示相应波束的偏斜，以及补偿电子装置，用于通过将延迟改变为用于切换相应波束的定时信号来自动插入对于偏斜的补偿。 启动检测器可以是扫描检测器的现有开始，并且该装置可以内置在写入头中，特别是在激光打印机等的焦平面或焦平面的共轭位置处，以提供自校准打印机 。

公开(公告)号：US20050184036A1

公开(公告)日：2005-08-25

申请号：US11114520

申请日：2005-04-26

Applicant: Bradley Hunter ,  Steven Cahill ,  Jonathan Ehrmann ,  Michael Plotkin

Inventor： Bradley Hunter ,  Steven Cahill ,  Jonathan Ehrmann ,  Michael Plotkin

IPC: B23K26/04 ,  B23K26/08 ,  B23K101/40 ,  G03F7/20 ,  H01L21/82 ,  B23K26/36 ,  B23K26/03

CPC classification number: B23K26/046 ,  B23K26/02 ,  B23K26/04 ,  B23K26/043 ,  B23K26/0853 ,  B23K2101/40 ,  G03F7/70041 ,  G03F7/70725

Abstract: A high-speed method and system for precisely positioning a waist of a material-processing laser beam to dynamically compensate for local variations in height of microstructures located on a plurality of objects spaced apart within a laser-processing site are provided. In the preferred embodiment, the microstructures are a plurality of conductive lines formed on a plurality of memory dice of a semiconductor wafer. The system includes a focusing lens subsystem for focusing a laser beam along an optical axis substantially orthogonal to a plane, an x-y stage for moving the wafer in the plane, and a first air bearing sled for moving the focusing lens subsystem along the optical axis. The system also includes a first controller for controlling the x-y stage based on reference data which represents 3-D locations of microstructures to be processed within the site, a second controller, and a first voice coil coupled to the second controller for positioning the first air bearing sled along the optical axis also based on the reference data. The reference data is generated by the system which includes a modulator for reducing power of the material-processing laser beam to obtain a probe laser beam to measure height of the semiconductor wafer at a plurality of locations about the site to obtain reference height data. A computer computes a reference surface based on the reference height data. A trajectory planner generates trajectories for the wafer and the waist of the laser beam based on the reference surface. The x-y stage and the first air bearing sled controllably move the wafer and the focusing lens subsystem, respectively, to precisely position the waist of the laser beam so that the waist substantially coincides with the 3-D locations of the microstructures within the site. The system also includes a spot size lens subsystem for controlling size of the waist of the laser beam, a second air bearing sled for moving the spot size lens subsystem along the optical axis, a third controller for controlling the second air bearing sled, and a second voice coil coupled to the third controller for positioning the second air bearing sled along the optical axis.

公开(公告)号：US06573473B2

公开(公告)日：2003-06-03

申请号：US10001104

申请日：2001-11-02

Applicant: Bradley L. Hunter ,  Steven P. Cahill ,  Jonathan S. Ehrmann ,  Michael Plotkin

Inventor： Bradley L. Hunter ,  Steven P. Cahill ,  Jonathan S. Ehrmann ,  Michael Plotkin

IPC: B23K2602

CPC classification number: B23K26/046 ,  B23K26/02 ,  B23K26/04 ,  B23K26/043 ,  B23K26/0853 ,  B23K2101/40 ,  G03F7/70041 ,  G03F7/70725

Abstract: A high-speed method and system for precisely positioning a waist of a material-processing laser beam to dynamically compensate for local variations in height of microstructures located on a plurality of objects spaced apart within a laser-processing site are provided. In the preferred embodiment, the microstructures are a plurality of conductive lines formed on a plurality of memory dice of a semiconductor wafer. The system includes a focusing lens subsystem for focusing a laser beam along an optical axis substantially orthogonal to a plane, an x-y stage for moving the wafer in the plane, and a first air bearing sled for moving the focusing lens subsystem along the optical axis.

Abstract translation: 提供了一种用于精确定位材料处理激光束的腰部以动态地补偿位于激光加工部位内间隔开的多个物体上的微结构的局部高度变化的高速方法和系统。 在优选实施例中，微结构是形成在半导体晶片的多个存储芯片上的多个导线。 该系统包括聚焦透镜子系统，用于沿着基本上垂直于平面的光轴聚焦激光束，用于在平面中移动晶片的x-y级，以及用于沿着光轴移动聚焦透镜子系统的第一空气轴承滑座。

公开(公告)号：US5570193A

公开(公告)日：1996-10-29

申请号：US360681

申请日：1995-02-27

Applicant: Benzion Landa ,  Yehuda Niv ,  Michael Plotkin ,  Peter Forgacs

Inventor： Benzion Landa ,  Yehuda Niv ,  Michael Plotkin ,  Peter Forgacs

IPC: G01N21/47 ,  G01N21/53 ,  G03G15/01 ,  G03G15/10 ,  G03G15/11 ,  G01N21/59

CPC classification number: G03G15/105 ,  G01N21/534 ,  G03G15/0121

Abstract: Apparatus for detecting concentrations of colored toner particles in the presence of black or other absorbing toner particles including a light source, a light detector having a field of view of less than about .+-.10 degrees and preferably less than .+-.5 degrees, apparatus for supplying a dispersion of colored toner particles optionally containing undesirable contamination by black toner particles between the light source and the detector and computing circuitry operative for determining the concentration of the colored toner particles utilizing output from the light detector.

Abstract translation: PCT No.PCT / NL92 / 00117 Sec。 371日期：1995年2月27日 102（e）日期1995年2月27日PCT提交1992年7月2日PCT公布。 公开号WO94 / 01809 日期1994年1月20日用于检测在存在黑色或其它吸收调色剂颗粒的情况下着色调色剂颗粒的浓度的装置，包括光源，具有小于约+/- 10度，优选小于+ 用于供应彩色调色剂颗粒的分散体的装置，任选地包含在光源和检测器之间的黑色调色剂颗粒的不期望的污染物，以及计算电路，用于利用来自光检测器的输出来确定着色调色剂颗粒的浓度。