Abstract:
In a method for supplying power supply voltages in a semiconductor memory device a first source voltage is applied to a memory cell of a memory cell array as a cell array internal voltage for operating a sense amplifier coupled to the memory cell. A second source voltage is applied as a word line drive voltage of the memory cell array. The second source voltage has a voltage level higher than a voltage level of the first source voltage. The second source voltage is also applied as a drive voltage of an input/output line driver to drive write data into an input/output line in a write operating mode.
Abstract:
A sense amplifier includes a reference signal providing unit and an internal sense amplification unit. The reference signal providing unit provides a reference bit line signal in response to a reference control signal. The internal sense amplification unit receives the reference bit line signal and data signals that correspond to the data. The received signals are provided through bit lines connected to the memory cell array. The internal sense amplification unit senses the received reference bit line signal and the data signals and amplifies the sensed signals. The sense amplifier senses data stored in memory cells connected to dummy bit lines of the outmost memory cell array of a semiconductor memory device such that the memory cells that are not used can be used. Accordingly, the design area and cost of the semiconductor memory device can be reduced.
Abstract:
A semiconductor memory device, having a test mode and a normal mode, includes a frequency multiplier and a test command sequence generator. The frequency multiplier receives a test clock signal in the test mode and generates multiple internal test clock signals, each of which has a frequency equal to a frequency of an operation clock signal in the normal mode. The test clock signal has a frequency lower than the frequency of the operation clock signal. The test command sequence generator generates at least one command signal in response to the internal test clock signals in the test mode. The at least one command signal corresponds to at least one operation timing parameter of the semiconductor memory device that is to be measured. The frequency multiplier may include a Phase Locked Loop (PLL) or a Delay Locked Loop (DLL).
Abstract:
A sense amplifier includes a reference signal providing unit and an internal sense amplification unit. The reference signal providing unit provides a reference bit line signal in response to a reference control signal. The internal sense amplification unit receives the reference bit line signal and data signals that correspond to the data. The received signals are provided through bit lines connected to the memory cell array. The internal sense amplification unit senses the received reference bit line signal and the data signals and amplifies the sensed signals. The sense amplifier senses data stored in memory cells connected to dummy bit lines of the outmost memory cell array of a semiconductor memory device such that the memory cells that are not used can be used. Accordingly, the design area and cost of the semiconductor memory device can be reduced.
Abstract:
The present invention relates to a novel diaminedithiol derivative or a pharmaceutically acceptable salt thereof; radiorhenium or radiotechneticum complex thereof; a composition for treating liver cancer comprising the radiorhenium complex and lipiodol; and, a preparative kit of the composition for treating liver cancer.In the composition according to the invention, the diaminedithiol derivative is a novel compound in which long chain alkyl groups were introduced to diaminedithiol, capable of forming a radiorhenium or radiotechnetium complex thereof with an ease and leading to stronger van der Waals bonds with lipiodol. As a result, the complex becomes more stable in a medium, lipiodol, whereby the composition of the invention exhibits a high accumulation rate in liver cancer tissue when injected via hepatic artery, thereby capable of achieving an efficient treatment of liver cancer.
Abstract:
A semiconductor memory device that minimizes chip area is provided. The semiconductor memory device includes local input/output (I/O) lines, global I/O lines, and a memory core that is coupled between a bit line and a complementary bit line. The memory core includes a memory cell array, a bit line equalizer circuit, a PMOS sense amplifier (S/A), a PMOS S/A driving circuit for driving the PMOS S/A, a transmission gate circuit, an NMOS S/A, and an NMOS S/A driving circuit for driving the NMOS S/A. First and second transistors for connecting the local I/O lines to the global I/O lines are installed between adjacent bit lines. The PMOS S/A driving circuit, which is a first driving transistor, and the NMOS S/A driving circuit, which is a second driving transistor, are also installed between adjacent bit lines. Because the semiconductor memory device arranges a PMOS S/A driving circuit, an NMOS S/A driving circuit, and a gating circuit for connecting local I/O lines to global I/O lines, between adjacent bit lines, the chip area is reduced.
Abstract translation:提供了最小化芯片面积的半导体存储器件。 半导体存储器件包括本地输入/输出(I / O)线,全局I / O线和耦合在位线和互补位线之间的存储器核。 存储器芯包括存储单元阵列,位线均衡器电路,PMOS读出放大器(S / A),用于驱动PMOS S / A的PMOS S / A驱动电路,传输门电路,NMOS S / A 以及用于驱动NMOS S / A的NMOS S / A驱动电路。 用于将本地I / O线连接到全局I / O线的第一和第二晶体管安装在相邻位线之间。 作为第一驱动晶体管的PMOS S / A驱动电路和作为第二驱动晶体管的NMOS S / A驱动电路也安装在相邻位线之间。 由于半导体存储器件在相邻位线之间配置PMOS S / A驱动电路,NMOS S / A驱动电路和用于将本地I / O线连接到全局I / O线的选通电路,芯片面积减小 。
Abstract:
A semiconductor memory device has independently controllable word lines, thereby allowing various background data patterns to be freely written to the memory cells to perform various wafer burn-in tests. This allows the leakage between adjacent memory cells to be efficiently tested by independently controllable word line activation signals, as well as the reliability of bit lines. A wafer burn-in test circuit for performing this improved burn-in test improves the reliability of the device by performing a level transition on the signals that drive the sub word line drivers, thereby eliminating the need to apply a high voltage to one transistor in the sub word line driver.
Abstract:
A magneto-resistive random access memory (MRAM) comprising an MRAM cell array having an MRAM cell, and a control and voltage generation unit configured to generate a back bias voltage for the MRAM cell. The control and voltage generation unit comprising a command decoder configured to generate a decoding signal in response to a command output from a memory controller, and a voltage controller and generator configured to generate the back bias voltage with a magnitude based on the decoding signal and a reset signal output from the memory controller.
Abstract:
A refresh method for a semiconductor memory device having more than one bank group is provided. The refresh method may include applying an all-refresh command to one the bank groups, determining if one of the bank groups includes a bank undergoing a refresh operation when the all-refresh command is received, and performing an all-refresh operation based on the determination.
Abstract:
A method and circuit are provided for driving a word line. The word line driving circuit includes first and second power drivers, a switching unit and a word line driver. The first power driver is driven to a boosting voltage level and the second power driver is driven to an internal power voltage level. The switching unit transfers a first output of the first power driver to the word line driver in response to a first switching signal and transfers a second output of the second power driver to the word line driver in response to a second switching signal. The word line driver alternately drives a word line to the first output and the second output transferred from the switching unit in response to a word line driving signal.