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公开(公告)号：US20060214828A1
公开(公告)日：2006-09-28
申请号：US11387441
申请日：2006-03-23
申请人： Makoto Shinohara
发明人： Makoto Shinohara
IPC分类号： H03M1/10
摘要： To provide a testing apparatus having a function of testing a D/A converter and so forth with a reduced testing time. The testing apparatus tests a converter having functionality of converting an input signal and outputting the signal thus converted. The testing apparatus comprises: a pattern generator which generates an input signal having a predetermined cycle; a clock generator which generates a measurement clock having a predetermined cycle; a measurement unit which receives the measurement clock, and sequentially measures the values of the output signal, synchronously with the measurement clock; and a storage unit which stores, at different corresponding addresses, the values thus sequentially measured by the measurement unit.
摘要翻译： 提供一种具有测试D / A转换器等功能的测试装置，同时减少测试时间。 测试装置测试具有转换输入信号并输出如此转换的信号的功能的转换器。 该测试装置包括：产生具有预定周期的输入信号的模式发生器; 时钟发生器，其生成具有预定周期的测量时钟; 测量单元，其接收测量时钟，并且与测量时钟同步地顺序地测量输出信号的值; 以及存储单元，其在不同的相应地址存储由测量单元依次测量的值。
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公开(公告)号：US07096691B2
公开(公告)日：2006-08-29
申请号：US10305401
申请日：2002-11-27
申请人： Masami Nishitani , Makoto Shinohara
发明人： Masami Nishitani , Makoto Shinohara
IPC分类号： C03B40/04
CPC分类号： C03B27/0431 , C03B23/0254 , C03B23/035 , C03B27/048 , C03B29/12 , C03B35/243
摘要： An apparatus for bending a glass sheet includes a final hearth bed. This final hearth bed has a top surface that is upwardly convexly curved along a plane perpendicular to an axis of the glass sheet. The top surface has an upstream end, a downstream end that is at a level lower than that of the upstream end, and an intermediate point defined therebetween. The top surface has (a) a first section that extends from the upstream end to the intermediate point and that is parallel with the axis or upwardly inclined relative to the axis and (b) a second section that extends from the intermediate point to the downstream end and that is downwardly inclined relative to the axis. The final hearth bed has a bottom surface that is along the first direction or inclined downwardly relative to the first direction.
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公开(公告)号：US07024889B2
公开(公告)日：2006-04-11
申请号：US10119705
申请日：2002-04-11
申请人： Masami Nishitani , Makoto Shinohara
发明人： Masami Nishitani , Makoto Shinohara
IPC分类号： C03B23/00
CPC分类号： C03B27/0431 , C03B23/035 , C03B27/048 , C03B29/12 , C03B35/24 , C03B35/243
摘要： For bending a glass sheet so that the glass sheet has a compound curvature, an apparatus comprises a furnace including hearth beds on a bed support and a quenching unit provided with upper and lower air blowers. The final hearth bed may have a top surface with a simple curvature, be provided with one upstream corner cut away thereby defining a cut surface section and arranged in such a manner that the cut surface section is nearly parallel to the hearth bed adjacent to the final hearth bed. Alternatively, the final hearth bed may have a top surface with a compound curvature, so that the glass sheet is bent under the conditions set by controlling a temperature in a downstream part of the furnace, adjusting the inclination of the lower air blower and/or rotating final hearth bed so as to reverse the upstream and downstream ends thereof.
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公开(公告)号：US6137115A
公开(公告)日：2000-10-24
申请号：US233472
申请日：1999-01-20
CPC分类号： G01Q10/06 , B82Y15/00 , B82Y35/00 , G01N21/8422 , G01N21/9501
摘要： A film inspecting apparatus is used for inspecting fine roughness and particle state on a surface of a thin film. In inspecting the thin film surface, shape data of the thin film are obtained by a scanning type probe microscope. The obtained shape data are analyzed to identify individual particles, and the fine roughness and particle state on the thin film surface are inspected based on the particle data obtained by the shape data analysis. The film inspecting apparatus includes a particle analyzing device for inspecting the fine roughness and particle state on the thin film surface by using the shape data obtained by the scanning type probe microscope. The particle analyzing device includes a particle extracting device for extracting the particles on the film surface from the shape data, and a particle data calculating device for calculating the particle data based on the data extracted by the particle extracting device.
摘要翻译： 薄膜检查装置用于检查薄膜表面的细微粗糙度和颗粒状态。 在检查薄膜表面时，通过扫描型探针显微镜获得薄膜的形状数据。 对获得的形状数据进行分析以识别单个颗粒，并且基于通过形状数据分析获得的颗粒数据来检查薄膜表面上的细微粗糙度和颗粒状态。 膜检查装置包括通过使用由扫描型探针显微镜获得的形状数据来检查薄膜表面上的细微粗糙度和颗粒状态的颗粒分析装置。 颗粒分析装置包括：粒子提取装置，用于从形状数据中提取膜表面上的颗粒;以及粒子数据计算装置，用于基于由粒子提取装置提取的数据计算粒子数据。
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公开(公告)号：US5588133A
公开(公告)日：1996-12-24
申请号：US460780
申请日：1995-06-02
摘要： A semiconductor device including a register bank circuit includes a register array for storing data. The register array has a matrix structure which is formed of a plurality of banks arranged in a row of the matrix structure and a plurality of registers arranged in a column thereof. A bank selector selects one of the banks while the one to be selected is specified. A register selector selects one of the registers in the one bank selected by the bank selector means, so that the selected register is coupled to a bus.
摘要翻译： 包括寄存器组电路的半导体器件包括用于存储数据的寄存器阵列。 寄存器阵列具有矩阵结构，该矩阵结构由布置在矩阵结构的一行中的多个组形成，并且多个寄存器布置在其列中。 银行选择器选择一个银行，同时指定要选择的银行。 寄存器选择器选择由存储体选择器装置选择的一个存储体中的一个寄存器，使得所选择的寄存器耦合到总线。
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公开(公告)号：US5450566A
公开(公告)日：1995-09-12
申请号：US52287
申请日：1993-04-26
摘要： A semiconductor device including a register bank circuit including a register array for storing data. The register array has a matrix structure formed by a plurality of banks arranged in a row and a plurality of registers arranged in a column. Each bank is a group of a predetermined number of registers. A bank selector selects one of the banks, and a register selector selects a register corresponding to the bank selected by the bank selector. The selected register is coupled to a bus.
摘要翻译： 一种包括具有用于存储数据的寄存器阵列的寄存器组电路的半导体器件。 寄存器阵列具有由布置在一行中的多个单元组成的矩阵结构以及排列成列的多个寄存器。 每个存储体是一组预定数量的寄存器。 存储体选择器选择一个存储区，寄存器选择器选择与存储体选择器选择的存储体对应的寄存器。 所选寄存器耦合到总线。
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47.发明授权
公开(公告)号：US4358552A
公开(公告)日：1982-11-09
申请号：US185765
申请日：1981-09-10
CPC分类号： H01L23/295 , C08K3/34 , H01B3/40 , H01L2924/0002 , Y10T428/31511
摘要： An improved epoxy molding composition for encapsulating microelectronic devices wherein the molding composition, after conversion to a thermoset condition, i.e., infusible state, by the application of heat and pressure, displays a low coefficient of thermal expansion and a high thermal conductivity. The dual properties of low coefficient of thermal expansion and high thermal conductivity are imparted to the molding composition by the incorporation therein of a specific anisotropic, polycrystalline, sintered ceramic product which is relatively non-abrasive and free of ionic contaminants and which has cordierite as its primary phase, consisting essentially on an analytical oxide basis of 11.5 to 16.5% RO, 33 to 41% Al.sub.2 O.sub.3 and 46.6 to 53% SiO.sub.2.
摘要翻译： 用于封装微电子器件的改进的环氧模塑组合物，其中模塑组合物在转化为热固性状态即不可熔状态之后，通过施加热和压力显示出低热膨胀系数和高导热性。 通过在其中加入特定的各向异性多晶的烧结陶瓷产品，其具有低的热膨胀系数和高热导率的双重特性，该特定的各向异性多晶的烧结陶瓷产品相对不磨蚀并且不含离子污染物，并且其具有堇青石 初级相，主要基于11.5至16.5％RO，33至41％Al 2 O 3和46.6至53％SiO 2的分析氧化物基础。
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48.发明授权公开(公告)号：US09566360B2
公开(公告)日：2017-02-14
申请号：US13637139
申请日：2010-10-25
IPC分类号： A01N59/00 , A61L2/16 , A61L2/18 , A61L2/22 , A61L2/232 , B09C1/08 , C02F1/72 , B09C1/02 , C09K11/07 , A01N59/16 , B01J31/00 , B01J23/745
CPC分类号： A61L2/16 , A01N59/00 , A01N59/16 , A61L2/18 , A61L2/186 , A61L2/22 , A61L2/232 , A62D3/38 , B01J23/745 , B01J31/00 , B09C1/02 , B09C1/08 , C02F1/725 , C02F2303/04 , C02F2305/026 , C09K11/07 , C09K2211/1044 , Y02W10/37 , A01N25/22 , A01N65/08 , A01N2300/00
摘要： A Fenton reaction catalyst including a reaction product as an active component, in which the reaction product is obtained by using roasted and ground coffee beans (in particular, coffee grounds) or tea leaves (in particular, tea dregs) as feedstocks for supplying a component having a reduction effect, and mixing the feedstocks for supplying the component having a reduction effect with an iron-supplying source containing divalent or trivalent iron in the presence of water. The Fenton reaction catalyst can be used to generate hydroxy radicals from hydrogen peroxide. The Fenton reaction catalyst can maintain iron in a divalent state for a long period of time.
摘要翻译： 一种Fenton反应催化剂，其包括作为活性组分的反应产物，其中通过使用焙炒和研磨的咖啡豆（特别是咖啡渣）或茶叶（特别是茶渣）获得反应产物作为供应组分的原料 具有还原效果，并且在水的存在下将用于供给具有还原效果的组分的原料与含有二价或三价铁的铁供应源混合。 芬顿反应催化剂可用于由过氧化氢产生羟基。 芬顿反应催化剂可以将铁维持在二价状态长时间。
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公开(公告)号：US09004656B2
公开(公告)日：2015-04-14
申请号：US13975669
申请日：2013-08-26
申请人： Hiroshi Takahagi , Makoto Shinohara , Hideaki Mamiya , Takeshi Shimizu , Takashi Tomita , Hiroshi Azami
发明人： Hiroshi Takahagi , Makoto Shinohara , Hideaki Mamiya , Takeshi Shimizu , Takashi Tomita , Hiroshi Azami
IPC分类号： B41J2/175
CPC分类号： B41J2/175
摘要： An ink-jet recording head includes a recording head and pressure damper assembly module including a recording head part at a lower position having nozzle holes on an under surface and an ink passage communicating with the nozzle holes, and a pressure damper part higher than the recording head part having an ink containing chamber inside. The ink-jet recording head further includes first flexible tube supplying ink in the ink containing chamber to the ink passage and connecting an ink discharge part communicating with the ink containing chamber and an ink supply part at one end side in the recording head part communicating with one end of the ink passage; and a second flexible tube connected with another end side in the recording head part and communicating with another end of the ink passage. At least the inside of the first flexible tube is filled with the ink.
摘要翻译： 一种喷墨记录头，包括记录头和压力阻尼器组件模块，该模块包括在下表面具有喷嘴孔的记录头部分和与喷嘴孔连通的油墨通道，以及与记录头相比较高的压力阻尼器部分 头部具有内部的墨水容纳室。 喷墨记录头还包括第一柔性管，其将油墨容纳室中的油墨供应到油墨通道，并将与油墨容纳室连通的油墨排出部分和与记录头部分的一端侧的供墨部分连通 墨水通道的一端; 以及与记录头部分中的另一端侧连接并与墨通道的另一端连通的第二柔性管。 至少第一柔性管的内部填充有油墨。
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公开(公告)号：US08775118B2
公开(公告)日：2014-07-08
申请号：US13234025
申请日：2011-09-15
申请人： Makoto Shinohara
发明人： Makoto Shinohara
IPC分类号： G01C19/00
CPC分类号： G01D5/2448 , G01D5/2451
摘要： According to one embodiment, in the angle detection apparatus, the first A-D converter unit receives the first signal, and performs analog-to-digital conversion of the first signal. The second A-D converter unit receives the second signal orthogonal to the first signal, and performs analog-to-digital conversion of the second signal. The first delay circuit receives a third signal outputted by the first A-D converter unit, and performs a phase adjustment of the third signal. The second delay circuit receives a fourth signal outputted by the second A-D converter unit, and performs a phase adjustment of the fourth signal. The phase detection adjustment unit monitors phases of signals outputted by the first and second delay circuits, and gives phase adjustment commands to the first and second delay circuits, when a phase shift occurs.
摘要翻译： 根据一个实施例，在角度检测装置中，第一A-D转换器单元接收第一信号，并执行第一信号的模数转换。 第二A-D转换器单元接收与第一信号正交的第二信号，并执行第二信号的模数转换。 第一延迟电路接收由第一A-D转换器单元输出的第三信号，并执行第三信号的相位调整。 第二延迟电路接收由第二A-D转换器单元输出的第四信号，并执行第四信号的相位调整。 相位检测调整单元监视第一和第二延迟电路输出的信号的相位，并且当相移发生时，给相位调整命令给第一和第二延迟电路。
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