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公开(公告)号:US20220230965A1
公开(公告)日:2022-07-21
申请号:US17716955
申请日:2022-04-08
Applicant: Intel Corporation
Inventor: Robert Alan MAY , Islam A. SALAMA , Sri Ranga Sai BOYAPATI , Sheng LI , Kristof DARMAWIKARTA , Robert L. SANKMAN , Amruthavalli Pallavi ALUR
IPC: H01L23/538 , H01L21/56 , H01L21/683 , H01L23/31 , H01L23/00 , H01L25/065
Abstract: A microelectronic device is formed to include an embedded die substrate on an interposer; where the embedded die substrate is formed with no more than a single layer of transverse routing traces. In the device, all additional routing may be allocated to the interposer to which the embedded die substrate is attached. The embedded die substrate may be formed with a planarized dielectric formed over an initial metallization layer supporting the embedded die.
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公开(公告)号:US20220223527A1
公开(公告)日:2022-07-14
申请号:US17712944
申请日:2022-04-04
Applicant: Intel Corporation
Inventor: Kristof DARMAWIKARTA , Hiroki TANAKA , Robert MAY , Sameer PAITAL , Bai NIE , Jesse JONES , Chung Kwang Christopher TAN
IPC: H01L23/538 , H01L23/00 , H01L23/522
Abstract: Embodiments include an electronic package with an embedded multi-interconnect bridge (EMIB) and methods of making such packages. Embodiments include a first layer, that is an organic material and a second layer disposed over the first layer. In an embodiment, a cavity is formed through the second layer to expose a first surface of the first layer. A bridge substrate is in the cavity and is supported by the first surface of the first layer. Embodiments include a first die over the second layer that is electrically coupled to a first contact on the bridge substrate, and a second die over the second layer that is electrically coupled to a second contact on the bridge substrate. In an embodiment the first die is electrically coupled to the second die by the bridge substrate.
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公开(公告)号:US20220199515A1
公开(公告)日:2022-06-23
申请号:US17690964
申请日:2022-03-09
Applicant: Intel Corporation
Inventor: Srinivas V. PIETAMBARAM , Jung Kyu HAN , Ali LEHAF , Steve CHO , Thomas HEATON , Hiroki TANAKA , Kristof DARMAWIKARTA , Robert Alan MAY , Sri Ranga Sai BOYAPATI
IPC: H01L23/498 , H01L23/538 , H01L25/18 , H01L21/48 , H01L23/00 , H01L25/00
Abstract: A package assembly includes a substrate and at least a first die having a first contact array and a second contact array. First and second via assemblies are respectively coupled with the first and second contact arrays. Each of the first and second via assemblies includes a base pad, a cap assembly, and a via therebetween. One or more of the cap assembly or the via includes an electromigration resistant material to isolate each of the base pad and the cap assembly. Each first cap assembly and via of the first via assemblies has a first assembly profile less than a second assembly profile of each second cap assembly and via of the second via assemblies. The first and second cap assemblies have a common applied thickness in an application configuration. The first and second cap assemblies have a thickness variation of ten microns or less in a reflowed configuration.
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44.
公开(公告)号:US20220084965A1
公开(公告)日:2022-03-17
申请号:US17528049
申请日:2021-11-16
Applicant: Intel Corporation
Inventor: Aleksandar ALEKSOV , Telesphor KAMGAING , Sri Ranga Sai BOYAPATI , Kristof DARMAWIKARTA , Eyal FAYNEH , Ofir DEGANI , David LEVY , Johanna M. SWAN
IPC: H01L23/66 , H01L21/48 , H01L23/538 , H01L23/00 , H01L25/065 , H01L25/00
Abstract: In-package radio frequency (RF) waveguides as high bandwidth chip-to-chip interconnects and methods for using the same are disclosed. In one example, an electronic package includes a package substrate, first and second silicon dies or tiles, and an RF waveguide. The first and second silicon dies or tiles are attached to the package substrate. The RF waveguide is formed in the package substrate and interconnects the first silicon die or tile with the second silicon die or tile.
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45.
公开(公告)号:US20210320066A1
公开(公告)日:2021-10-14
申请号:US17355301
申请日:2021-06-23
Applicant: Intel Corporation
Inventor: Robert Alan MAY , Kristof DARMAWIKARTA , Sri Ranga Sai Sai BOYAPATI
IPC: H01L23/532 , H01L23/29 , H01L23/522
Abstract: A die interconnect substrate comprises a bridge die comprising at least one bridge interconnect connecting a first bridge die pad of the bridge die to a second bridge die pad of the bridge die. The die interconnect substrate comprises a multilayer substrate structure comprising a substrate interconnect. The bridge die is embedded in the multilayer substrate structure. The substrate interconnect extends from a level above the bridge die to a level below the bridge die. The multilayer substrate structure further comprises an electrically insulating layer comprising a first electrically insulating material. The multilayer substrate structure further comprises an electrically insulating filler structure located laterally between the bridge die and the electrically insulating layer, wherein the electrically insulating filler structure comprises a second electrically insulating material different from the first electrically insulating material.
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公开(公告)号:US20210134727A1
公开(公告)日:2021-05-06
申请号:US16473598
申请日:2017-03-30
Applicant: INTEL CORPORATION
Inventor: Robert A. May , Sri Ranga Sai BOYAPATI , Kristof DARMAWIKARTA , Hiroki TANAKA , Srinivas V. PIETAMBARAM , Frank TRUONG , Praneeth AKKINEPALLY , Andrew J. BROWN , Lauren A. LINK , Prithwish CHATTERJEE
IPC: H01L23/538 , H01L21/48
Abstract: An apparatus system is provided which comprises: a photoimageable dielectric layer; a first interconnect structure formed through the photoimageable dielectric, the first interconnect structure formed at least in part using a lithography process; and a second interconnect structure formed through the photoimageable dielectric, the second interconnect structure formed at least in part using a laser drilling process.
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47.
公开(公告)号:US20210134723A1
公开(公告)日:2021-05-06
申请号:US16474585
申请日:2017-03-31
Applicant: Intel Corporation
Inventor: Robert Alan MAY , Kristof DARMAWIKARTA , Sri Ranga Sai Sai BOYAPATI
IPC: H01L23/532 , H01L23/29 , H01L23/522
Abstract: A die interconnect substrate comprises a bridge die comprising at least one bridge interconnect connecting a first bridge die pad of the bridge die to a second bridge die pad of the bridge die. The die interconnect substrate comprises a multilayer substrate structure comprising a substrate interconnect. The bridge die is embedded in the multilayer substrate structure. The substrate interconnect extends from a level above the bridge die to a level below the bridge die. The multilayer substrate structure further comprises an electrically insulating layer comprising a first electrically insulating material. The multilayer substrate structure further comprises an electrically insulating filler structure located laterally between the bridge die and the electrically insulating layer, wherein the electrically insulating filler structure comprises a second electrically insulating material different from the first electrically insulating material.
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48.
公开(公告)号:US20200343049A1
公开(公告)日:2020-10-29
申请号:US16392028
申请日:2019-04-23
Applicant: Intel Corporation
Inventor: Sameer PAITAL , Gang DUAN , Srinivas PIETAMBARAM , Kristof DARMAWIKARTA
IPC: H01G4/33 , H01L23/498 , H01L23/538 , H01G4/30 , H01G4/38 , H01G4/224 , H01L23/00
Abstract: Embodiments disclosed herein include an electronic package and methods of forming an electronic package. In an embodiment, the electronic package comprises a package substrate, an organic layer over the package substrate, and a capacitor embedded in the organic layer. In an embodiment, the capacitor comprises, a first electrode, where the first electrode comprises a seam between a first conductive layer and a second conductive layer, a dielectric layer over the first electrode, and a second electrode over the dielectric layer.
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公开(公告)号:US20200005990A1
公开(公告)日:2020-01-02
申请号:US16024721
申请日:2018-06-29
Applicant: Intel Corporation
Inventor: Sameer PAITAL , Srinivas PIETAMBARAM , Yonggang LI , Bai NIE , Kristof DARMAWIKARTA , Gang DUAN
Abstract: Embodiments herein relate to systems, apparatuses, or processes for embedding a magnetic core or a magnetic inductor in a substrate layer by applying a copper layer to a portion of the substrate layer, creating a structure in the substrate layer on top of at least part of the copper layer to identify a defined region within the substrate layer, and inserting a magnetic paste into the defined region where the copper layer identifies a side of the defined region and where the structure is to contain the magnetic paste within the defined region while the magnetic paste cures.
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公开(公告)号:US20190206781A1
公开(公告)日:2019-07-04
申请号:US15859309
申请日:2017-12-29
Applicant: Intel Corporation
Inventor: Aleksandar ALEKSOV , Kristof DARMAWIKARTA , Haobo CHEN , Changhua LIU , Sri Ranga Sai BOYAPATI , Bai NIE
IPC: H01L23/498 , H01L21/48
CPC classification number: H01L23/49838 , H01L21/4857 , H01L23/49822
Abstract: Apparatuses, systems and methods associated with package substrate design with variable height conductive elements within a single layer are disclosed herein. In embodiments, a substrate may include a first layer, wherein a trench is located in the first layer, and a second layer located on a surface of the first layer. The substrate may further include a first conductive element located in a first portion of the second layer adjacent to the trench, wherein the first conductive element extends to fill the trench, and a second conductive element located in a second portion of the second layer, wherein the second conductive element is located on the surface of the first layer. Other embodiments may be described and/or claimed.
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