公开(公告)号：US20210082852A1

公开(公告)日：2021-03-18

申请号：US16572354

申请日：2019-09-16

Applicant: Intel Corporation

Inventor： Bradon C. MARIN ,  Jung Kyu HAN ,  Thomas HEATON ,  Ali LEHAF ,  Rahul MANEPALLI ,  Srinivas PIETAMBARAM ,  Jacob VEHONSKY

IPC: H01L23/00 ,  C25D3/38 ,  C25D7/12 ,  C25D5/02

Abstract: Embodiments of the present disclosure may generally relate to systems, apparatus, and/or processes directed to manufacturing a package having a substrate with a first side and a second side opposite the first side, where a copper layer is coupled with a first region of the first side of the substrate and includes a plurality of bumps coupled with the first region of the first side of the substrate where one or more second regions on the first side of the substrate not coupled with a copper layer, and where a layout of the one or more second regions on the first side of the substrate is to vary a growth, respectively, of each of the plurality of bumps during a plating process by modifying a local copper density of each of the plurality of bumps.

公开(公告)号：US20230091379A1

公开(公告)日：2023-03-23

申请号：US17482275

申请日：2021-09-22

Applicant: Intel Corporation

Inventor： Liang HE ,  Yeasir ARAFAT ,  Jung Kyu HAN ,  Ali LEHAF ,  Gang DUAN ,  Steve S. CHO ,  Yue DENG

IPC: H01L23/00 ,  H01L23/498 ,  H01L23/532 ,  H01L23/528

Abstract: Embodiments disclosed herein include electronic packages with first level interconnects that comprise a first layer. In an embodiment, the electronic package comprises a package substrate and a pad on the package substrate. In an embodiment, the pad comprises copper. In an embodiment, a first layer is over the pad. In an embodiment, the first layer comprises iron. In an embodiment, a solder is over the first layer, and a die is coupled to the package substrate by the solder.

公开(公告)号：US20240243088A1

公开(公告)日：2024-07-18

申请号：US18622486

申请日：2024-03-29

Applicant: Intel Corporation

Inventor： Brandon C. MARIN ,  Jung Kyu HAN ,  Thomas HEATON ,  Ali LEHAF ,  Rahul MANEPALLI ,  Srinivas PIETAMBARAM ,  Jacob VEHONSKY

IPC: H01L23/00 ,  C25D3/38 ,  C25D5/02 ,  C25D7/12

CPC classification number: H01L24/14 ,  C25D3/38 ,  C25D5/022 ,  C25D7/12 ,  H01L24/11 ,  H01L24/13 ,  H01L2224/1111 ,  H01L2224/11462 ,  H01L2224/13147 ,  H01L2224/1403

Abstract: Embodiments of the present disclosure may generally relate to systems, apparatus, and/or processes directed to manufacturing a package having a substrate with a first side and a second side opposite the first side, where a copper layer is coupled with a first region of the first side of the substrate and includes a plurality of bumps coupled with the first region of the first side of the substrate where one or more second regions on the first side of the substrate not coupled with a copper layer, and where a layout of the one or more second regions on the first side of the substrate is to vary a growth, respectively, of each of the plurality of bumps during a plating process by modifying a local copper density of each of the plurality of bumps.

公开(公告)号：US20230015619A1

公开(公告)日：2023-01-19

申请号：US17952080

申请日：2022-09-23

Applicant: Intel Corporation

Inventor： Kristof DARMAWAIKARTA ,  Robert MAY ,  Sashi KANDANUR ,  Sri Ranga Sai BOYAPATI ,  Srinivas PIETAMBARAM ,  Steve CHO ,  Jung Kyu HAN ,  Thomas HEATON ,  Ali LEHAF ,  Ravindranadh ELURI ,  Hiroki TANAKA ,  Aleksandar ALEKSOV ,  Dilan SENEVIRATNE

IPC: H01L23/00 ,  H01L23/522 ,  H01L21/768

Abstract: Embodiments described herein include electronic packages and methods of forming such packages. An electronic package includes a package substrate, first conductive pads formed over the package substrate, where the first conductive pads have a first surface area, and second conductive pads over the package substrate, where the second conductive pads have a second surface area greater than the first surface area. The electronic package also includes a solder resist layer over the first and second conductive pads, and a plurality of solder resist openings that expose one of the first or second conductive pads. The solder resist openings of the electronic package may include conductive material that is substantially coplanar with a top surface of the solder resist layer. The electronic package further includes solder bumps over the conductive material in the solder resist openings, where the solder bumps have a low bump thickness variation (BTV).

公开(公告)号：US20210035901A1

公开(公告)日：2021-02-04

申请号：US17075533

申请日：2020-10-20

Applicant: Intel Corporation

Inventor： Srinivas V. PIETAMBARAM ,  Jung Kyu HAN ,  Ali LEHAF ,  Steve CHO ,  Thomas HEATON ,  Hiroki TANAKA ,  Kristof DARMAWIKARTA ,  Robert Alan MAY ,  Sri Ranga Sai BOYAPATI

IPC: H01L23/498 ,  H01L23/538 ,  H01L25/18 ,  H01L21/48 ,  H01L23/00 ,  H01L25/00

Abstract: A package assembly includes a substrate and at least a first die having a first contact array and a second contact array. First and second via assemblies are respectively coupled with the first and second contact arrays. Each of the first and second via assemblies includes a base pad, a cap assembly, and a via therebetween. One or more of the cap assembly or the via includes an electromigration resistant material to isolate each of the base pad and the cap assembly. Each first cap assembly and via of the first via assemblies has a first assembly profile less than a second assembly profile of each second cap assembly and via of the second via assemblies. The first and second cap assemblies have a common applied thickness in an application configuration. The first and second cap assemblies have a thickness variation of ten microns or less in a reflowed configuration.

公开(公告)号：US20240105575A1

公开(公告)日：2024-03-28

申请号：US17953206

申请日：2022-09-26

Applicant: Intel Corporation

Inventor： Jason M. GAMBA ,  Haifa HARIRI ,  Kristof DARMAWIKARTA ,  Srinivas V. PIETAMBARAM ,  Hiroki TANAKA ,  Kyle MCELHINNY ,  Xiaoying GUO ,  Steve S. CHO ,  Ali LEHAF ,  Haobo CHEN ,  Bai NIE ,  Numair AHMED

IPC: H01L23/498 ,  C25D3/12 ,  C25D3/48 ,  C25D3/50 ,  C25D7/12 ,  H01L21/48

CPC classification number: H01L23/49838 ,  C25D3/12 ,  C25D3/48 ,  C25D3/50 ,  C25D7/123 ,  H01L21/481 ,  H01L21/4846 ,  H01L23/49866 ,  H01L24/16

Abstract: Embodiments disclosed herein include package substrates and methods of forming package substrates. In an embodiment, the package substrate comprises a core, and a pad over the core, where the pad has a first width. In an embodiment, a surface finish is over the pad, where the surface finish has a second width that is substantially equal to the first width. In an embodiment, the package substrate further comprises a solder resist over the pad, where the solder resist comprises an opening that exposes a portion of the surface finish. In an embodiment, the opening has a third width that is smaller than the second width.

公开(公告)号：US20240079530A1

公开(公告)日：2024-03-07

申请号：US17903126

申请日：2022-09-06

Applicant: Intel Corporation

Inventor： Jacob VEHONSKY ,  Onur OZKAN ,  Vinith BEJUGAM ,  Mao-Feng TSENG ,  Nicholas HAEHN ,  Andrea NICOLAS FLORES ,  Ali LEHAF ,  Benjamin DUONG ,  Joshua STACEY

IPC: H01L33/48 ,  H01L33/00 ,  H01L33/60 ,  H01L33/62

CPC classification number: H01L33/486 ,  H01L33/005 ,  H01L33/60 ,  H01L33/62 ,  H01L2933/0058 ,  H01L2933/0066

Abstract: Embodiments of an integrated circuit (IC) package are disclosed. In some embodiments, the IC package includes a semiconductor die, a glass substrate, and a package substrate. The semiconductor die includes a micro light emitting diode (LED). The semiconductor die is at least partially embedded within the glass substrate and the glass substrate including a through glass via (TGV) embedded in the glass substrate wherein the TGV is electrically coupled to the semiconductor die to provide power to the micro LED. The package substrate that is coupled to the TGV.

公开(公告)号：US20220199515A1

公开(公告)日：2022-06-23

申请号：US17690964

申请日：2022-03-09

Applicant: Intel Corporation

Inventor： Srinivas V. PIETAMBARAM ,  Jung Kyu HAN ,  Ali LEHAF ,  Steve CHO ,  Thomas HEATON ,  Hiroki TANAKA ,  Kristof DARMAWIKARTA ,  Robert Alan MAY ,  Sri Ranga Sai BOYAPATI

IPC: H01L23/498 ,  H01L23/538 ,  H01L25/18 ,  H01L21/48 ,  H01L23/00 ,  H01L25/00

Abstract: A package assembly includes a substrate and at least a first die having a first contact array and a second contact array. First and second via assemblies are respectively coupled with the first and second contact arrays. Each of the first and second via assemblies includes a base pad, a cap assembly, and a via therebetween. One or more of the cap assembly or the via includes an electromigration resistant material to isolate each of the base pad and the cap assembly. Each first cap assembly and via of the first via assemblies has a first assembly profile less than a second assembly profile of each second cap assembly and via of the second via assemblies. The first and second cap assemblies have a common applied thickness in an application configuration. The first and second cap assemblies have a thickness variation of ten microns or less in a reflowed configuration.