Alignment method and semiconductor exposure method
    42.
    发明授权
    Alignment method and semiconductor exposure method 失效
    对准方法和半导体曝光方法

    公开(公告)号:US5695897A

    公开(公告)日:1997-12-09

    申请号:US564615

    申请日:1995-11-29

    IPC分类号: G03F7/20 G03F9/00

    摘要: An alignment method or an exposure method in an exposure process in which a first stepper having a first reduction magnification and a second stepper having a second reduction magnification, higher than the first reduction magnification, are used in combination. For a global alignment through the first stepper on the basis of alignment marks having been defined through the second stepper in relation to shots thereof, in every shot of the first stepper the position of such alignment mark or marks to be measured is made variable with respect to the shot center.

    摘要翻译: 组合使用具有第一缩小倍率的第一步进机和具有高于第一减速倍率的第二减速倍率的第二步进机的曝光处理中的对准方法或曝光方法。 对于通过第一步进机进行的全局对准,其基于已经通过第二步进器相对于其镜头定义的对准标记,在第一步进机的每次镜头中,使这样的对准标记或待测量的标记的位置相对于 到射击中心。

    Surface examining apparatus for detecting the presence of foreign
particles on the surface
    45.
    发明授权
    Surface examining apparatus for detecting the presence of foreign particles on the surface 失效
    用于检测表面上外来颗粒的存在的表面检查装置

    公开(公告)号:US4795911A

    公开(公告)日:1989-01-03

    申请号:US14033

    申请日:1987-02-12

    IPC分类号: G01N21/94 G01N21/88

    CPC分类号: G01N21/94

    摘要: An apparatus usable with an object having a surface with a pattern, for examining the state of the surface, includes a projecting system for directing a light beam to the surface of the object, and a collecting system for collecting scattered light from the surface of the object. A projection of the optical axis of the collecting system onto the surface of the object extends in a direction different from a projection onto the surface of the object of a major portion of light diffracted from the pattern. A light-receiving unit receives the scattered light as collected by the collecting system and for producing an output corresponding to the state of the surface of the object.

    摘要翻译: 可用于具有用于检查表面状态的具有图案的表面的物体的装置包括用于将光束引导到物体的表面的投影系统和用于从该物体的表面收集散射光的收集系统 目的。 将收集系统的光轴投射到物体表面上的方向不同于从图案衍射的大部分光的物体的表面上的投影。 光接收单元接收由收集系统收集的散射光并产生与物体表面的状态对应的输出。

    ULTRASONIC FLOWMETER APPARATUS
    46.
    发明申请
    ULTRASONIC FLOWMETER APPARATUS 有权
    超声波流量计装置

    公开(公告)号:US20120318069A1

    公开(公告)日:2012-12-20

    申请号:US13499947

    申请日:2011-06-20

    申请人: Eiichi Murakami

    发明人: Eiichi Murakami

    IPC分类号: G01F1/66

    CPC分类号: G01F1/667 G01F1/662

    摘要: An ultrasonic flowmeter apparatus, which can be mounted on a conduit flowing a fluid whose flow rate is to be measured, has two housing halves coupled swingably about an axis. Free ends of the housing halves include a clamp mechanism for closing and locking the halves in position. The halves have formed therein grooves 1a and 2a, respectively, and a pair of ultrasonic wave transmission and reception elements are provided on an inner wall of the groove 1a. When the conduit is clamped between the grooves, the conduit is urged against the inner walls and deformed into a substantially square cross sectional configuration. An ultrasonic wave beam B is projected from one of the elements into a fluid passing through the conduit, the beam is reflected by an opposite surface of the conduit urged against the groove 2a, and the reflected beam is received by the other element.

    摘要翻译: 超声波流量计装置可以安装在流过要测量流体的流体的导管上,具有围绕轴线可摆动地联接的两个壳体半部。 外壳半部的自由端包括用于将半部闭合并锁定就位的夹紧机构。 半部分别形成有槽1a,2a,在槽1a的内壁上设置一对超声波收发元件。 当导管夹紧在凹槽之间时,导管被推靠在内壁上并变形成基本正方形的横截面构型。 超声波波束B从元件中的一个突出到通过导管的流体中,该波束被导管的相对表面反射,并且反射的波束被另一个元件接收。