Wafer transport method
    3.
    发明授权
    Wafer transport method 失效
    晶圆输送方式

    公开(公告)号:US5562800A

    公开(公告)日:1996-10-08

    申请号:US308442

    申请日:1994-09-19

    Abstract: A wafer transport method includes the steps of preparing a semiconductor process equipment having a transport chamber and a process chamber. An interface means connects the transport chamber to the process chamber. A transport means transports a semiconductor wafer from the transport chamber to the process chamber by way of the interface means. The transport means mounting a substrate is inserted into a communicating corridor including a supply means and an exhaust means. The substrate is transported while performing the supply and exhaust by sequentially controlling a supply shutoff means, an exhaust shutoff means, and a communicating shutoff means according to the position of a conductance part formed of a gap between the transport means and the communicating corridor. Thus, the substrate is transported at a high throughput without contamination of the substrate while keeping the different atmospheric conditions for the transport chamber and the process chamber, thereby manufacturing a semiconductor device with high performance capabilities.

    Abstract translation: 晶片输送方法包括准备具有输送室和处理室的半导体工艺设备的步骤。 接口装置将输送室连接到处理室。 传送装置通过接口装置将半导体晶片从传送室传送到处理室。 安装基板的输送装置被插入到包括供给装置和排气装置的通信走廊中。 通过根据由输送装置和通信走廊之间的间隙形成的电导部分的位置依次控制供给切断装置,排气关闭装置和通信切断装置,在进行供给和排出的同时运送基板。 因此,在保持输送室和处理室的不同大气条件的同时,以高通量输送基板而不污染基板,从而制造具有高性能的半导体器件。

    Fine displacement transducer employing plural optical fibers
    10.
    发明授权
    Fine displacement transducer employing plural optical fibers 失效
    采用多根光纤的精细位移传感器

    公开(公告)号:US4739161A

    公开(公告)日:1988-04-19

    申请号:US870814

    申请日:1986-06-05

    CPC classification number: G01B11/026

    Abstract: A fine displacement transducer, wherein either end of a first and a second optical fibers which are mutually adjacent are respectively provided in alignment with each other opposed to the reflection surface and the illuminating light is made incident from the one end of the first optical fiber and the light irradiated from the other end of the first optical fiber is made to illuminate its reflection surface, while the reflected light therefrom is received by the second optical fiber, so that the amount of displacement of the reflection surface relative to both end surfaces of the second optical fiber can be detected from the variation of intensity of the received light, and a measuring system wherein the reflected light from the reflection surface is received by either of the second or a separately provided third optical fiber to detect the intensity of received light for converting it into the electric signal.

    Abstract translation: 精细位移传感器,其中彼此相邻的第一和第二光纤的任一端分别设置成与反射表面相对准,并且照明光从第一光纤的一端入射, 使从第一光纤的另一端照射的光照射其反射面,同时其反射光被第二光纤接收,使得反射面相对于第二光纤的两个端面的位移量 可以从接收光的强度的变化来检测第二光纤,以及测量系统,其中来自反射表面的反射光由第二光纤或单独提供的第三光纤中的任一个接收,以检测接收光的强度 将其转换为电信号。

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