Embedding class hierarchy into object models for multiple class inheritance
    41.
    发明授权
    Embedding class hierarchy into object models for multiple class inheritance 有权
    将类层次结构嵌入到多类继承的对象模型中

    公开(公告)号:US08707278B2

    公开(公告)日:2014-04-22

    申请号:US13251463

    申请日:2011-10-03

    IPC分类号: G06F9/45

    摘要: A model is provided for transforming a program with a priori given class hierarchy that is induced by inheritance. An inheritance remover is configured to remove inheritance from a given program to produce an analysis-friendly program which does not include virtual-function pointer tables and runtime libraries associated with inheritance-related operations. The analysis-friendly program preserves the semantics of the given program with respect to a given class hierarchy. A clarifier is configured to identify implicit expressions and function calls and transform the given program into at least one intermediate program having explicit expressions and function calls.

    摘要翻译: 提供了一个模型,用于使用由继承引发的先验给定的类层次结构来转换程序。 继承去除器配置为从给定的程序中删除继承,以生成一个不包含与继承相关的操作相关联的虚拟函数指针表和运行时库的分析友好的程序。 分析友好的程序保留给定程序相对于给定类层次结构的语义。 澄清器被配置为识别隐式表达式和函数调用,并将给定程序转换成具有显式表达式和函数调用的至少一个中间程序。

    Multi-cell vertical memory nodes
    43.
    发明授权
    Multi-cell vertical memory nodes 有权
    多单元垂直内存节点

    公开(公告)号:US08508997B2

    公开(公告)日:2013-08-13

    申请号:US12646847

    申请日:2009-12-23

    IPC分类号: G11C11/34

    摘要: Embodiments of the invention pertain to vertical memory structures. Embodiments of the invention describe memory nodes comprising two memory cells on opposing sides of a vertical channel separating a source region and a drain region. Embodiments of the invention may utilize floating gate NAND memory cells, polysilicon diodes, MiM diodes, or MiiM diodes. Embodiments of the invention may be used to form flash memory, RRAM, Memristor RAM, Oxide Ram or OTPROM.

    摘要翻译: 本发明的实施例涉及垂直存储器结构。 本发明的实施例描述了在分离源区和漏区的垂直沟道的相对侧上包括两个存储单元的存储器节点。 本发明的实施例可以利用浮动栅极NAND存储器单元,多晶硅二极管,MiM二极管或者MiiM二极管。 本发明的实施例可用于形成闪速存储器,RRAM,忆阻器RAM,氧化物Ram或OTPROM。

    Methods of forming electrically conductive structures
    44.
    发明授权
    Methods of forming electrically conductive structures 有权
    形成导电结构的方法

    公开(公告)号:US08431184B2

    公开(公告)日:2013-04-30

    申请号:US13103050

    申请日:2011-05-07

    申请人: Nishant Sinha

    发明人: Nishant Sinha

    IPC分类号: B05D5/12

    摘要: Some embodiments include methods of forming conductive material within high aspect ratio openings and low aspect ratio openings. Initially, the high aspect ratio openings may be filled with a first conductive material while the low aspect ratio openings are only partially filled with the first conductive material. Additional material may then be selectively plated over the first conductive material within the low aspect ratio openings relative to the first conductive material within the high aspect ratio openings. In some embodiments, the additional material may be activation material that only partially fills the low aspect ratio opening, and another conductive material may be subsequently plated onto the activation material to fill the low aspect ratio openings.

    摘要翻译: 一些实施例包括在高纵横比开口和低纵横比开口内形成导电材料的方法。 首先,高纵横比开口可以填充第一导电材料,而低纵横比开口仅部分地填充有第一导电材料。 然后可以在高纵横比开口内相对于第一导电材料,在低纵横比开口内的第一导电材料上选择性地镀覆附加材料。 在一些实施例中,附加材料可以是仅部分填充低纵横比开口的活化材料,并且可以随后将另一种导电材料电镀到活化材料上以填充低纵横比开口。

    EMBEDDING CLASS HIERARCHY INTO OBJECT MODELS FOR MULTIPLE CLASS INHERITANCE
    45.
    发明申请
    EMBEDDING CLASS HIERARCHY INTO OBJECT MODELS FOR MULTIPLE CLASS INHERITANCE 有权
    嵌入层次分类到多个类别的对象模型中

    公开(公告)号:US20120117547A1

    公开(公告)日:2012-05-10

    申请号:US13251463

    申请日:2011-10-03

    IPC分类号: G06F9/45

    摘要: A model is provided for transforming a program with a priori given class hierarchy that is induced by inheritance. An inheritance remover is configured to remove inheritance from a given program to produce an analysis-friendly program which does not include virtual-function pointer tables and runtime libraries associated with inheritance-related operations. The analysis-friendly program preserves the semantics of the given program with respect to a given class hierarchy. A clarifier is configured to identify implicit expressions and function calls and transform the given program into at least one intermediate program having explicit expressions and function calls.

    摘要翻译: 提供了一个模型,用于使用由继承引发的先验给定的类层次结构来转换程序。 继承去除器配置为从给定的程序中删除继承,以生成一个不包含与继承相关的操作相关联的虚拟函数指针表和运行时库的分析友好的程序。 分析友好的程序保留给定程序相对于给定类层次结构的语义。 澄清器被配置为识别隐式表达式和函数调用,并将给定程序转换成具有显式表达式和函数调用的至少一个中间程序。

    PRECISE THREAD-MODULAR SUMMARIZATION OF CONCURRENT PROGRAMS
    46.
    发明申请
    PRECISE THREAD-MODULAR SUMMARIZATION OF CONCURRENT PROGRAMS 有权
    精确的目前程序的线性模块化概述

    公开(公告)号:US20110078511A1

    公开(公告)日:2011-03-31

    申请号:US12894710

    申请日:2010-09-30

    IPC分类号: G06F11/08 G06F11/00

    CPC分类号: G06F11/3604

    摘要: Methods and systems for concurrent program verification. A concurrent program is summarized into a symbolic interference skeleton (IS) using data flow analysis. Sequential consistency constraints are enforced on read and write events in the IS. Error conditions are checked together with the IS using a processor.

    摘要翻译: 并发程序验证的方法和系统。 使用数据流分析将并发程序总结为符号干扰骨架(IS)。 在IS中的读写事件上执行顺序一致性约束。 使用处理器与IS一起检查错误状况。

    POLISHING SYSTEMS AND METHODS FOR REMOVING CONDUCTIVE MATERIAL FROM MICROELECTRONIC SUBSTRATES
    47.
    发明申请
    POLISHING SYSTEMS AND METHODS FOR REMOVING CONDUCTIVE MATERIAL FROM MICROELECTRONIC SUBSTRATES 有权
    用于从微电子基板去除导电材料的抛光系统和方法

    公开(公告)号:US20100025854A1

    公开(公告)日:2010-02-04

    申请号:US12185675

    申请日:2008-08-04

    申请人: Nishant Sinha

    发明人: Nishant Sinha

    IPC分类号: H01L23/48 H01L21/44

    摘要: Polishing systems and methods for removing conductive material (e.g., noble metals) from microelectronic substrates are disclosed herein. Several embodiments of the methods include forming an aperture in a substrate material, disposing a conductive material on the substrate material and in the aperture, and disposing a fill material on the conductive material. The fill material at least partially fills the aperture. The substrate material is then polished to remove at least a portion of the conductive material and the fill material external to the aperture during which the fill material substantially prevents the conductive material from smearing into the aperture during polishing the substrate material.

    摘要翻译: 本文公开了用于从微电子衬底去除导电材料(例如贵金属)的抛光系统和方法。 所述方法的若干实施例包括在基底材料中形成孔,将导电材料设置在基底材料和孔中,并将填充材料设置在导电材料上。 填充材料至少部分地填充孔。 然后抛光衬底材料以去除导电材料和孔的外部的填充材料的至少一部分,在此期间,填充材料在抛光衬底材料期间基本上防止导电材料污染到孔中。

    Compositions of Matter, and Methods of Removing Silicon Dioxide
    48.
    发明申请
    Compositions of Matter, and Methods of Removing Silicon Dioxide 有权
    物质组成和去除二氧化硅的方法

    公开(公告)号:US20090275208A1

    公开(公告)日:2009-11-05

    申请号:US12114174

    申请日:2008-05-02

    申请人: Nishant Sinha

    发明人: Nishant Sinha

    IPC分类号: H01L21/306 C23F1/12

    CPC分类号: H01L21/3081 H01L21/31111

    摘要: Some embodiments include methods of removing silicon dioxide in which the silicon dioxide is exposed to a mixture that includes activated hydrogen and at least one primary, secondary, tertiary or quaternary ammonium halide. The mixture may also include one or more of thallium, BX3 and PQ3, where X and Q are halides. Some embodiments include methods of selectively etching undoped silicon dioxide relative to doped silicon dioxide, in which thallium is incorporated into the doped silicon dioxide prior to the etching. Some embodiments include compositions of matter containing silicon dioxide doped with thallium to a concentration of from about 1 weight % to about 10 weight %.

    摘要翻译: 一些实施方案包括去除其中二氧化硅暴露于包括活性氢和至少一种伯,仲,叔或季铵卤化物的混合物的二氧化硅的方法。 混合物还可以包括铊,BX 3和PQ 3中的一种或多种,​​其中X和Q是卤化物。 一些实施方案包括相对于掺杂二氧化硅选择性地蚀刻未掺杂二氧化硅的方法,其中在蚀刻之前将铊掺入掺杂的二氧化硅中。 一些实施方案包括含有掺杂铊的二氧化硅至约1重量%至约10重量%的浓度的物质的组合物。

    Process and integration scheme for fabricating conductive components, through-vias and semiconductor components including conductive through-wafer vias
    50.
    发明授权
    Process and integration scheme for fabricating conductive components, through-vias and semiconductor components including conductive through-wafer vias 有权
    用于制造导电部件,通孔和半导体部件的工艺和集成方案,包括导电贯通晶片通孔

    公开(公告)号:US07345350B2

    公开(公告)日:2008-03-18

    申请号:US10668914

    申请日:2003-09-23

    申请人: Nishant Sinha

    发明人: Nishant Sinha

    摘要: A method for forming a conductive via in a semiconductor component is disclosed. The method includes providing a substrate having a first surface and an opposing, second surface. At least one hole is formed in the substrate extending between the first surface and the opposing, second surface. A seed layer is formed on a sidewall defining the at least one hole of the substrate and coated with a conductive layer, and a conductive or nonconductive filler material is introduced into the remaining space within the at least one hole. A method of forming a conductive via through a substrate using a blind hole is also disclosed. Semiconductor components and electronic systems having substrates including the conductive via of the present invention are also disclosed.

    摘要翻译: 公开了一种在半导体部件中形成导电通孔的方法。 该方法包括提供具有第一表面和相对的第二表面的基底。 在基板上形成至少一个孔,该孔在第一表面和相对的第二表面之间延伸。 种子层形成在限定基底的至少一个孔并且涂覆有导电层的侧壁上,并且导电或非导电填充材料被引入至少一个孔内的剩余空间中。 还公开了使用盲孔通过基板形成导电通孔的方法。 还公开了具有包括本发明的导电通孔的基板的半导体元件和电子系统。