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41.发明申请Carbon nanotube substrates and catalyzed hot stamp for polishing and patterning the substrates 失效碳纳米管基底和用于抛光和图案化基底的催化热印公开(公告)号：US20080105648A1
公开(公告)日：2008-05-08
申请号：US11300031
申请日：2005-12-14
CPC分类号： B82Y40/00 , B82Y30/00 , C01B32/168 , C01B2202/02 , Y10S977/745
摘要： The present invention is generally directed to catalyzed hot stamp methods for polishing and/or patterning carbon nanotube-containing substrates. In some embodiments, the substrate, as a carbon nanotube fiber end, is brought into contact with a hot stamp (typically at 200-800° C.), and is kept in contact with the hot stamp until the morphology/patterns on the hot stamp have been transferred to the substrate. In some embodiments, the hot stamp is made of material comprising one or more transition metals (Fe, Ni, Co, Pt, Ag, Au, etc.), which can catalyze the etching reaction of carbon with H2, CO2, H2O, and/or O2. Such methods can (1) polish the carbon nanotube-containing substrate with a microscopically smooth finish, and/or (2) transfer pre-defined patterns from the hot stamp to the substrate. Such polished or patterned carbon nanotube substrates can find application as carbon nanotube electrodes, field emitters, and field emitter arrays for displays and electron sources.
摘要翻译： 本发明一般涉及用于研磨和/或构图含碳纳米管的基底的催化热印方法。 在一些实施方案中，作为碳纳米管纤维端的基底与热印模（通常在200-800℃）接触，并且与热印模保持接触，直到热的形态/图案 印章已经转移到基材上。 在一些实施例中，热压印由包含一种或多种过渡金属（Fe，Ni，Co，Pt，Ag，Au等）的材料制成，其可以催化碳与H 2的蚀刻反应， CO 2，H 2 O和/或O 2。 这样的方法可以（1）用微观平滑光洁度抛光含碳纳米管的基材，和/或（2）将预定义的图案从热印刷转印到基材上。 这种抛光或图案化的碳纳米管基底可以用作碳纳米管电极，场致发射体和用于显示器和电子源的场发射极阵列。
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42.发明授权Method and apparatus for determining the length of single-walled carbon nanotubes 失效用于确定单壁碳纳米管长度的方法和装置公开(公告)号：US06962092B2
公开(公告)日：2005-11-08
申请号：US10836551
申请日：2004-04-30
申请人： Matteo Pasquali , Virginia A. Davis , Ingrid Stepanek-Basset , A. Nicholas G. Parra-Vasquez , Robert H. Hauge
发明人： Matteo Pasquali , Virginia A. Davis , Ingrid Stepanek-Basset , A. Nicholas G. Parra-Vasquez , Robert H. Hauge
CPC分类号： B82Y30/00 , B82Y15/00 , B82Y40/00 , C01B32/15 , C01B2202/02 , C01B2202/34 , G01N11/00 , Y10S977/88
摘要： The present invention is directed to at least one method and at least one apparatus for determining the length of single-wall carbon nanotubes (SWNTs). The method generally comprises the steps of: dispersing a sample of SWNTs into a suitable dispersing medium to form a solvent-suspension of solvent-suspended SWNTs; determining the mean SWNT diameter of the solvent-suspended SWNTs; introducing the solvent-suspended SWNTs into a viscosity-measuring device; obtaining a specific viscosity for the SWNT solvent-suspension; and determining the length of the SWNTs based upon the specific viscosity by solving, for example, the Kirkwood-Auer equation corrected by Batchelor's formula for the drag on a slender cylinder for “L,” to determine the length of the SWNTs. The apparatus generally comprises: a SWNT sample introduction mechanism; a dispersal chamber; a SWNT radius-determination chamber; and a viscosity determining chamber, wherein the SWNT sample introduction mechanism, the dispersal chamber, the SWNT radius-determination chamber, and the viscosity determination chamber are each operatively connected to at least one of the others.
摘要翻译： 本发明涉及用于确定单壁碳纳米管（SWNT）的长度的至少一种方法和至少一种装置。 该方法通常包括以下步骤：将SWNT样品分散到合适的分散介质中以形成溶剂悬浮的SWNT的溶剂 - 悬浮液; 确定溶剂悬浮的SWNT的平均SWNT直径; 将溶剂悬浮的SWNT引入粘度测量装置中; 获得SWNT溶剂 - 悬浮液的比粘度; 以及通过解决例如通过Batchelor公式修正的Kirkwood-Auer方程式来确定SWNTs的长度，以便通过在“L”的细长圆筒上拖动来确定SWNT的长度。 该装置通常包括：SWNT样品引入机构; 分散室; SWNT半径测定室; 和粘度确定室，其中SWNT样品引入机构，分散室，SWNT半径确定室和粘度确定室各自可操作地连接到至少其中之一。
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公开(公告)号：US5316795A
公开(公告)日：1994-05-31
申请号：US696769
申请日：1991-05-07
CPC分类号： C23C16/27 , C23C16/277 , Y10S427/103 , Y10T428/30
摘要： The present invention is directed to a method for depositing diamond films and particles on a variety of substrates by flowing a gas or gas mixture capable of supplying (1) carbon, (2) hydrogen, (3) a halogen and, preferably, (4) a chalcogen through a reactor over the substrate material. The reactant gases may be premixed with an inert gas in order to keep the overall gas mixture composition low in volume percent of carbon and rich in hydrogen. Pre-treatment of the reactant gases to a high energy state is not required as it is in most prior art processes for chemical vapor deposition of diamond. Since pretreatment is not required, the process may be applied to substrates of virtually any desired size, shape or configuration.
摘要翻译： 本发明涉及一种通过使能够供应（1）碳，（2）氢，（3）卤素和（4）卤素的气体或气体混合物的气体或气体混合物，优选地（4） ）硫属元素通过基底材料上的反应器。 反应物气体可以与惰性气体预混合，以保持总体气体混合物组合物的体积百分比低且富含氢气。 不需要将反应物气体预处理至高能量状态，如在金刚石的化学气相沉积的大多数现有技术方法中。 由于不需要预处理，所以该方法可以应用于几乎任何所需尺寸，形状或构型的基底。
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44.发明授权Method and apparatus to simultaneously measure emissivities and thermodynamic temperatures of remote objects 失效同时测量远程物体的发射率和热力学温度的方法和装置
公开(公告)号：US5011295A
公开(公告)日：1991-04-30
申请号：US422644
申请日：1989-10-17
CPC分类号： G01J5/58 , G01J4/04 , G01J5/0003 , G01J5/0096 , G01J5/04 , G01J5/047 , G01J5/08 , G01J5/0809 , G01J5/0825 , G01J5/0834 , G01J5/0846 , G01J5/0896 , G01J2005/0048 , G01J2005/0074 , G01J2005/0077 , G01N2021/1793 , G01N21/21 , G01N2201/0696
摘要： Method and apparatus for accurately and instantaneously determining the thermodynamic temperature of remote objects by continuous determination of the emissivity, the reflectivity, and optical constants, as well as the apparent or brightness temperature of the sample with a single instrument. The emissivity measurement is preferably made by a complex polarimeter including a laser that generates polarized light, which is reflected from the sample into a detector system. The detector system includes a beamsplitter, polarization analyzers, and four detectors to measure independently the four Stokes vectors of the reflected radiation. The same detectors, or a separate detector in the same instrument, is used to measure brightness temperature. Thus, the instrument is capable of measuring both the change in polarization upon reflection as well as the degree of depolarization and hence diffuseness. This enables correction for surface roughness of the sample and background radiation, which could otherwise introduce errors in temperature measurement.
摘要翻译： 通过用单个仪器连续测定样品的发射率，反射率和光学常数以及样品的表观或亮度温度来准确和瞬时地确定远程物体的热力学温度的方法和设备。 发射率测量优选由包括产生偏振光的激光器的复合旋光计来进行，该偏振光从样品反射到检测器系统中。 检测器系统包括分束器，偏振分析器和四个检测器，以独立地测量反射辐射的四个斯托克斯矢量。 相同的检测器或相同仪器中的单独检测器用于测量亮度温度。 因此，该仪器能够测量反射时的极化的变化以及去极化的程度，从而测量扩散度。 这样可以校正样品的表面粗糙度和背景辐射，否则会导致温度测量误差。
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