摘要:
A semiconductor memory device according to the invention includes a memory cell array (8) connected to a data bus through a first selector circuit (6), a second selector circuit (7) responsive to a first control signal (.phi. 0, .phi. X), a third selector circuit (8) responsive to a second control signal (.phi. 1 to .phi. 8), a row address buffer (17) responsive to activation of a row address strobe signal, an address fetching circuit (21) for instructing fetching of a column address every time of a specified number of toggled CAS signals, a column address buffer (19) responsive to a third control signal from the address fetching circuit (21), a nibble decoder (38) for generating the first and the second control signals, and a gate control circuit (39). A column address used to access a next memory cell is fetched during an activating period of the row address strobe signal after the column address is fetched.
摘要:
A semiconductor memory device comprises a memory cell array including a plurality of memory cells, a plurality of word lines and bit lines connected to the memory cells, a data bus for carrying data to be written in and/or read out from a selected memory cell, an addressing circuit for selecting one of the word lines and bit lines, an input buffer for outputting the electric signal indicative of the data to be written on the data bus, a current-mirror amplifier connected to the data bus for amplifying the electric signals that are read out from the memory cell on the data bus, and a limiter circuit connected to the data bus for limiting a voltage swing of the electric signals on the data bus. The limiter circuit maintains the data bus at a predetermined voltage level and limits the voltage level of the electric signals supplied to the current-mirror amplifier, wherein the limiter circuit changes the predetermined voltage level in response to a voltage level of a supply voltage that powers the current-mirror amplifier.
摘要:
A process for preparing a particulate ceramic material comprising the steps of:(a) adding carbon dioxide or an aqueous solution of a soluble carbonate to first aqueous solution of a nitrate or chloride of Ba, Sr, Ca or Mg in a first vessel to adjust the pH of said first aqueous solution to between 7 and 10 thereby forming a carbonate precipitate;(b) adding an aqueous solution of a soluble hydroxide to a second aqueous solution of a nitrate or chloride of Ti, Zr, Sn or Pb in a second vessel to adjust the pH of said second aqueous solution to between 7 and 10 thereby forming a hydroxide precipitate;(c) combining slurries containing the precipitates formed in said first and second vessels;(d) mixing the combined slurries;(e) passing the slurries through a filter;(f) washing the filter cake with water;(g) drying the filter cake to form a powder;(h) calcining the dried powder; and(i) grinding the calcined powder.
摘要:
A moisture-permeable waterproof fabric which has a well-balanced combination of moisture permeability and waterproofing properties and has excellent strength, in particular, tensile strength, is provided without increasing environmental burden. A synthetic-polymer solution comprising a synthetic polymer consisting mainly of a polyurethane, fine inorganic particles, and a polar organic solvent is applied to one surface of a fibrous fabric and then brought into contact with a gaseous phase in which waterdrops having an average particle diameter of 1-30 μm have been evenly dispersed, thereby making the synthetic polymer semisolid. The fabric is then immersed in water to completely solidify the polymer and thereby obtain a moisture-permeable waterproof fabric comprising the fibrous fabric and, united to one surface thereof, a microporous film of a single-layer structure comprising the synthetic polymer consisting mainly of a polyurethane (the number of micropores having a pore diameter of 0.1-5 μm is (5-200)×104/mm2 in a vertical cross-section, and the film has a tensile strength of 3-80 MPa, a moisture permeability as measured by the calcium chloride method of 6,000 g/m2·24 hr or higher or a moisture permeability as measured by the potassium acetate method of 6,000 g/m2·24 hr or higher, and a water pressure resistance of 60 kPa or higher).
摘要翻译:具有良好的透湿性和防水性的组合的透湿性防水布,具有优异的强度,特别是拉伸强度,而不会增加环境负担。 将包含主要由聚氨酯,无机微粒和极性有机溶剂组成的合成聚合物的合成聚合物溶液施加到纤维织物的一个表面上,然后与气相接触,其中具有平均粒径 均匀分散,从而制成合成聚合物半固体。 然后将织物浸入水中以完全固化聚合物,从而获得包含纤维织物的透湿性防水织物,并且在其一个表面上与单一结构的微孔膜结合,其包含主要由 聚氨酯(垂直截面中孔径为0.1-5μm的微孔数为(5-200)×104 / mm2),该膜的拉伸强度为3-80MPa,测得的透湿度 通过6,000g / m 2·24小时以上的氯化钙法或通过醋酸钾法测定的透水性为6,000g / m 2·24hr以上,耐水压性为60kPa以上)。
摘要:
A memory interface circuit includes a gating circuit that starts detection of a logic level of a data strobe signal in accordance with a data read command. A clamp circuit clamps the data strobe signal to a first logic level after the data read command is issued. A detection circuit detects a logic level of the data strobe signal, which is driven by the memory, in accordance with the data read command.
摘要:
The present invention provides a semiconductor memory device which reduces current consumption in a standby state owing to a suitable refresh-thinning-out function, and a refresh control method thereof. When the refresh-thinning-out function is added while a refresh operation and an external access operation are being executed independently of each other, a refresh address counter outputs a refresh address Add(C) and inputs predetermined high-order bits thereof to a refresh-thinning-out control as a high-order refresh address Add(C) (m), where judgment as to whether the refresh operation is performed, is made. A refresh permission signal RFEN corresponding to the result of judgment is inputted to a word driver to activate and control the word driver. The process of judgment by the refresh-thinning-out control circuit can be embedded in an access time of a row system.
摘要:
A switch station including an ATM switch; a memory storing control data for operations of the switch station; an intra-station device, accommodating a subscriber line, performing communication operation on subscriber ATM cell; a control processor generating control information in link access protocol (LAP) format; and an interface unit converting LAP control information into ATM cell to the intra-station device through the ATM switch, wherein the control information is communicated according to LAP, the intra-station device receives the control information and transmits a direct memory access request to obtain control data stored in the memory, the interface unit obtains and converts the data format of the control data into ATM cell to transmit to the intra-station device through the switch, and the intra-station device performs the communication operation on the subscriber ATM cell based on the control data received through the switch.
摘要:
There is provided memory control device and memory control method, which can prevent wiring complication by many crossing wirings, and reduction of yield and quality. When a memory control device CC1 selects a memory chip CC2, an internal circuit of a select circuit 27 is changed by a switch signal SWS2. In this case, the changeover is made so that a select signal S2 outputted from an internal circuit 40 is inputted to a predetermined memory terminal of the memory chip CC2. The select signal S2 is inputted to the corresponding predetermined memory terminal of the memory chip CC2, and thereby, the memory chip CC2 is activated, and set to a state capable of inputting and outputting control signals 21 to 25. The control signals 21 to 25 are assigned to control terminals P21 to P27 after being hanged by the select circuit 27 in signal sequence corresponding to terminal array sequence of memory terminals 21a to 27a of the memory chip CC2.
摘要:
An object is to provide a semiconductor device in which it is possible to determine whether or not a minute delay time given by a delay circuit is within a specified value or not, and a method of testing the semiconductor device. In response to a data strobe signal TDQS for testing, the delay circuits DC0 and DC1 produce delay data strobe signals IDQS0 and IDQS1 delayed by delay times DT0 and DT1. Outputted as a reverse signal from the inverter INV0, is a reverse data strobe signal RIDQS0 in response to the delay data strobe signal IDQS0, and delayed by an allowable delay time IT. Inputted into the NAND gate ND0, are the reverse data strobe signal RIDQS0 and the delay data strobe signal IDQS1. When, in comparison with the phase of the delay data strobe signal IDQS0, the phase of the delay data strobe signal IDQS1 is delayed by the allowable delay time IT or more, a pulse signal PL0 is not outputted from the NAND gate ND0.