公开(公告)号：US4768886A

公开(公告)日：1988-09-06

申请号：US686424

申请日：1984-12-26

Applicant: Tomas B. Hirschfeld ,  Gilbert R. Haugen

Inventor： Tomas B. Hirschfeld ,  Gilbert R. Haugen

IPC: G01D5/26 ,  G01K11/32 ,  G01L1/24 ,  G01L11/02 ,  G01K11/20

CPC classification number: G01D5/268 ,  G01K11/3213 ,  G01L1/248 ,  G01L11/02

Abstract: Method and apparatus are provided for simultaneously measuring temperature and pressure in a class of crystalline materials having anisotropic thermal coefficients and having a coefficient of linear compression along the crystalline c-axis substantially the same as those perpendicular thereto. Temperature is determined by monitoring the fluorescence half life of a probe of such crystalline material, e.g., ruby. Pressure is determined by monitoring at least one other fluorescent property of the probe that depends on pressure and/or temperature, e.g., absolute fluorescent intensity or frequency shifts of fluorescent emission lines.

Abstract translation: 提供了一种用于同时测量具有各向异性热系数的一类结晶材料中的温度和压力的方法和装置，并且沿着与其垂直的结晶C轴基本上相同的晶体C轴具有线性压缩系数。 通过监测这种结晶材料（例如红宝石）的探针的荧光半衰期来确定温度。 通过监测取决于压力和/或温度的探针的至少一个其它荧光性质，例如荧光发射线的绝对荧光强度或频移来确定压力。

公开(公告)号：US4541059A

公开(公告)日：1985-09-10

申请号：US406240

申请日：1982-08-03

Applicant: Fukuhara Toshihiko

Inventor： Fukuhara Toshihiko

IPC: G01L1/00 ,  G01L1/24 ,  G01N3/06 ,  G01N3/32 ,  G01M7/00

CPC classification number: G01N3/32 ,  G01L1/248 ,  G01N3/068

Abstract: An external force is periodically applied to an object to be measured, a two-dimensional surface of the object is resolved and scanned by suitable infrared radiation detection means, and the infrared radiation at the times of maximum and minimum loading by the external force are detected for the respective resolved zones. The difference between the infrared radiation at the maximum and the minimum loading times is then calculated for every resolved zone. Further, the calculated values are multiplied by correction values corresponding to the shape, material, infrared radiation rate and so forth of the object. The thus obtained values are suitably visibly indicated in the positions of the respective zones. This indication is ordered by suitably slicing the levels of the thus obtained values to identify and display them in accordance with an ordering scheme.

Abstract translation: PCT No.PCT / JP81 / 00365 Sec。 371日期1982年8月3日 102（e）日期1982年8月3日PCT 1991年12月4日PCT PCT。 公开号WO82 / 01939 日期：1982年6月10日。外部力量周期性地施加到被测量物体上，物体的二维表面被适当的红外辐射检测装置解析并扫描，并且红外辐射在最大和最小时 针对相应的分辨区域检测外力的载荷。 然后对于每个分辨区域计算最大红外辐射与最小加载时间之间的差异。 此外，将计算出的值乘以与物体的形状，材料，红外线辐射率等对应的校正值。 由此获得的值适当地在各个区域的位置上显示。 通过适当地对由此获得的值的电平进行切片来排序该指示，以根据排序方案来识别和显示它们。

公开(公告)号：US3614889A

公开(公告)日：1971-10-26

申请号：US3614889D

申请日：1969-11-20

Applicant: DERRITRON ELECTRONICS LTD

Inventor： GEARING JAMES WALTER

IPC: G01L1/24 ,  G01M7/02 ,  G01N29/00

CPC classification number: G01M7/025 ,  G01L1/248

Abstract: IN A METHOD OF LOCATING STRESSES IN A SPECIMEN BEING VIBRATED BY AN ELECTRO-MECHANICAL VIBRATOR, THE INFRA-RED RADIATION FROM DIFFERENT POINTS ON THE SPECIMEN SURFACE, DUE TO VARIATIONS OF TEMPERATURE CAUSED BY STRESS, IS DETECTED BY SCANNING THE IMAGE OF A DETECTOR OVER THE SURFACE. THE VARIATION MAY BE INDICATED OR RECORDED BY USING THE DETECTOR OUTPUT TO CONTROL AN ELECTRON BEAM WHICH IS SIMILARLY SCANNED OVER A SCEEN.

公开(公告)号：US20240118149A1

公开(公告)日：2024-04-11

申请号：US18535479

申请日：2023-12-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Gae Hwang LEE ,  Youngjun YUN ,  Jong Won CHUNG ,  Yeongjun LEE ,  Won-Jae JOO ,  Yasutaka KUZUMOTO

IPC: G01L1/24 ,  G01B11/16 ,  G01L11/02

CPC classification number: G01L1/248 ,  G01B11/16 ,  G01L11/02

Abstract: A stretchable strain sensor includes a light-emitting element, an optical structure, and a photo-detective element. The stretchable strain sensor is located in a path of light emitted from the light-emitting element. The optical structure is configured to have optical properties that change in response to stretching of at least a portion of the stretchable strain sensor. The photo-detective element is configured to detect light transmitted through the optical structure or reflected through the optical structure.

公开(公告)号：US11885700B2

公开(公告)日：2024-01-30

申请号：US17339140

申请日：2021-06-04

Applicant: Samsung Electronics Co., Ltd.

Inventor： Gae Hwang Lee ,  Youngjun Yun ,  Jong Won Chung ,  Yeongjun Lee ,  Won-Jae Joo ,  Yasutaka Kuzumoto

IPC: G01L1/24 ,  G01L11/02 ,  G01B11/16

CPC classification number: G01L1/248 ,  G01B11/16 ,  G01L11/02

Abstract: A stretchable strain sensor includes a light-emitting element, an optical structure, and a photo-detective element. The stretchable strain sensor is located in a path of light emitted from the light-emitting element. The optical structure is configured to have optical properties that change in response to stretching of at least a portion of the stretchable strain sensor. The photo-detective element is configured to detect light transmitted through the optical structure or reflected through the optical structure.

公开(公告)号：US11650112B1

公开(公告)日：2023-05-16

申请号：US17969944

申请日：2022-10-20

Applicant: Hebei University of Technology

Inventor： Longbang Qing ,  Ru Mu ,  Li Wang ,  Guorui Cao

IPC: G01L1/24 ,  G01N3/06 ,  G06T7/11

CPC classification number: G01L1/248 ,  G01N3/068 ,  G06T7/11 ,  G01N2203/0066 ,  G06T2207/10048

Abstract: A discontinuous deformation measurement method based on infrared and visible light cameras may include: preparing a conductive film and a random speckle pattern on a surface of the conductive film; obtaining a visible image and an infrared image under a loading stage; applying a crack boundary detection to the visible image to obtain an initial coordinate of a micro-crack, determining an range of the micro-crack based on a temperature-rising region from the infrared image and the initial coordinate; setting a position corresponding to the range of the micro-crack in the visible image as a new region of interest; obtaining full-field principal tensile strains by a DIC method, and locating an accurate boundary of the micro-crack based on gradient distribution of the full-field principal tensile strains; analyzing displacement and strain fields around the micro-crack using the DIC method.

公开(公告)号：US20190101465A1

公开(公告)日：2019-04-04

申请号：US16085888

申请日：2017-04-27

Applicant: SENSOBRIGHT INDUSTRIES, LLC

Inventor： UTKU BUYUKSAHIN

IPC: G01L5/22 ,  G01L1/24

CPC classification number: G01L5/228 ,  B25J13/084 ,  G01L1/242 ,  G01L1/248 ,  G06F3/0414 ,  G06F3/042

Abstract: A structure which detects the application point, intensity and area of the force and the pressure applied, along with the touch, and the forces applied in vertical direction to the sensor as well as the combined forces, which has reduced power consumption. The sensing system has an intermediate layer; a light source located under the intermediate layer; an image sensor located under the intermediate layer; a first fiber optic bundle; a second fiber optic bundle; a control unit which analyzes the image captured by the image sensor using image processing techniques; and a data link for data communication between the image sensor and the control unit.

公开(公告)号：US20170360279A1

公开(公告)日：2017-12-21

申请号：US15183501

申请日：2016-06-15

Applicant: President and Fellows of Harvard College

Inventor： Joshua Gafford ,  Conor J. Walsh ,  Robert J. Wood

IPC: A61B1/00 ,  G01L1/24 ,  A61B1/06 ,  G01L5/00 ,  A61B1/005

CPC classification number: A61B1/00096 ,  A61B1/00006 ,  A61B1/0008 ,  A61B1/005 ,  A61B1/0676 ,  A61B34/30 ,  A61B2017/00022 ,  A61B2034/301 ,  A61B2090/065 ,  G01B11/16 ,  G01L1/248 ,  G01L5/0038

Abstract: A light-intensity-based forced sensor comprises a Sarrus linkage, a biasing mechanism, a light emitter, and a light detector includes a first plate, a second plate, and at least one collapsible linkage pivotably coupled to both the first and the second plates. The biasing mechanism biases the collapsible linkage toward an extended configuration. The light emitter is coupled with and displaceable with the first plate; and the light detector is coupled with and displaceable with the second plate and configured to receive light emitted from the light emitter and generate an electrical signal in response to light received from the light emitter, wherein the generated electrical signal provides an indication of the distance between the first plate and the second plate. The sensor can be distally mounted on, e.g., an endoscope to provide haptic feedback at the distal end of the endoscope.

公开(公告)号：US20160222290A1

公开(公告)日：2016-08-04

申请号：US14917659

申请日：2014-06-24

Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Nao TERASAKI ,  Chao-Nan XU

IPC: C09K11/77

CPC classification number: C09K11/7792 ,  F21K2/04 ,  G01L1/248 ,  G01N21/70

Abstract: Provided is a mechanoluminescent material which can radiate near-infrared light. The mechanoluminescent material includes an aluminate co-doped with Eu2+, Cr3+, and an ion or ion cluster of at least any one rare earth metal element selected from Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, or Lu. In addition, in the mechanoluminescent material, the aluminate is an aluminate represented by Formula MAl2O4 (provided that, M is any of Mg, Ca, Sr, or Ba) and Eu2+, Cr3+, and the ion or ion cluster of a rare earth metal element are co-doped at a concentration at which M in the aluminate is substituted by from 0.25 to 10%.

Abstract translation: 提供可以辐射近红外光的机械发光材料。 机械发光材料包括与Eu2 +，Cr3 +共掺的铝酸盐，以及选自Sc，Y，La，Ce，Pr，Nd，Pm，Sm，Eu，Gd中的至少一种稀土金属元素的离子或离子簇 ，Tb，Dy，Ho，Er，Tm，Yb或Lu。 此外，在机械发光材料中，铝酸盐是由式MAl 2 O 4表示的铝酸盐（条件是M是Mg，Ca，Sr或Ba中的任一种）和Eu 2+，Cr 3+，以及稀土金属的离子或离子簇 元素以铝酸盐中的M被0.25至10％代替的浓度共掺杂。

公开(公告)号：US09255853B2

公开(公告)日：2016-02-09

申请号：US14398799

申请日：2013-03-14

Applicant: R. Bruce Weisman ,  Paul A. Withey ,  Sergei M. Bachilo ,  Satish Nagarajaiah ,  Venkata Srivishnu M. Vemuru

Inventor： R. Bruce Weisman ,  Paul A. Withey ,  Sergei M. Bachilo ,  Satish Nagarajaiah ,  Venkata Srivishnu M. Vemuru

IPC: G01J5/02 ,  G01L1/24 ,  G01L1/25 ,  G01N21/359

CPC classification number: G01L1/248 ,  G01L1/25 ,  G01N21/359 ,  G01N2201/06113 ,  G01N2203/0629 ,  G01N2203/0652

Abstract: In some embodiments, the present invention provides methods of detecting strain associated with an object by: (1) irradiating a composition that has been applied to the object, where the composition comprises semiconducting single-walled carbon nanotubes; (2) measuring an emission from the irradiated composition, where the emission comprises near infrared emission; and (3) correlating the near infrared emission to the presence or absence of strain associated with the object. In some embodiments, the aforementioned steps occur without physically contacting the object or the composition. In some embodiments, the aforementioned steps occur without utilizing Raman spectroscopy. Further embodiments of the present invention also include a step of applying the composition to the object.

Abstract translation: 在一些实施方案中，本发明提供了通过以下步骤检测与物体相关的菌株的方法：（1）照射已经施用于物体的组合物，其中所述组合物包含半导体单壁碳纳米管; （2）测量辐射组合物的发射，其中发射包括近红外发射; 和（3）将近红外发射与存在或不存在与物体相关联的应变相关联。 在一些实施方案中，上述步骤在物理接触物体或组合物的情况下发生。 在一些实施方案中，上述步骤在不使用拉曼光谱的情况下进行。 本发明的其它实施方案还包括将组合物施用于物体的步骤。