公开(公告)号：US20240192059A1

公开(公告)日：2024-06-13

申请号：US18554076

申请日：2022-05-06

Applicant: trinamiX GmbH

Inventor： Tobias BAUMGARTNER ,  Sourabh KULKARNI ,  Celal Mohan OEGUEN

IPC: G01J5/28 ,  G01J5/06 ,  G01J5/52

CPC classification number: G01J5/28 ,  G01J5/06 ,  G01J5/52 ,  G01J2005/065 ,  G01J2005/283

Abstract: The present invention refers to a device (112) for monitoring an emission temperature of at least one radiation emitting element (114), a heating system (110) for heating at the least one radiation emitting element (114) to emit thermal radiation at an emission temperature, a method for monitoring an emission temperature of at least one radiation emitting element (114) and method for heating the at least one radiation emitting element (114) to emit thermal radiation at an emission temperature. Herein, the device (112) for monitoring an emission temperature of at least one radiation emitting element (114) comprises—at least one light source (125), wherein the light source is configured to emit optical radiation at least partially towards the at least one radiation emitting element (114); —at least one radiation sensitive element (126), wherein the at least one radiation sensitive element (126) has at least one sensor region (128), wherein the at least one sensor region (128) comprises at least one photosensitive material selected from at least one photoconductive material, wherein the at least one sensor region (128) is designated for generating at least one sensor signal depending on an intensity of the thermal radiation emitted by the at least one radiation emitting element (114) and received by the sensor region (128) within at least one wavelength range, wherein the sensor region (128) is further designated for generating at least one further sensor signal depending on an intensity of the optical radiation emitted by the at least one light source (125) and received by the sensor region (128) within at least one further wavelength range, wherein the at least one radiation sensitive element (126) is arranged in a manner that the thermal radiation travels through at least one transition material (116) prior to being received by the at least one radiation sensitive element (126), wherein at least one of the at least one light source (125) and the at least one radiation sensitive element (126) is arranged in a manner that the optical radiation travels through the at least one transition material (116) and impinges the at least one radiation emitting element (114) prior to being received by the at least one radiation sensitive element (126); and—at least one evaluation unit (138), wherein the at least one evaluation unit (138) is configured to determine the emission temperature of the at least one radiation emitting element (114) by using values for the intensity of the thermal radiation and the optical radiation.

公开(公告)号：US10996107B2

公开(公告)日：2021-05-04

申请号：US16577127

申请日：2019-09-20

Applicant: University of Electronic Science and Technology of China

Inventor： Longcheng Que ,  Daogang Min ,  Kai Yang ,  Yi Zhang ,  Jian Lv ,  Yun Zhou ,  Yadong Jiang

IPC: G01J1/44 ,  G01J5/28 ,  H01L31/024 ,  H04N5/33

Abstract: The present disclosure relates to an exponential model based uncooled infrared focal plane array readout circuit, including: a first microbolometer unit and a second microbolometer unit, for obtaining a detection signal and a reference signal; a conversion unit, connected with the first and second microbolometer units, and configured for converting the detection signal and reference signal to obtain a linear detection signal and linear reference signal; a subtraction unit, connected with the conversion unit, and configured for calculating a difference between the detection signal and the reference ratio signal to obtain a difference signal; and an integration unit, connected to the subtraction unit, and configured for integrating the difference signal to obtain an electrical signal for characterizing the infrared light signal of the to-be-detected object.

公开(公告)号：US10798315B2

公开(公告)日：2020-10-06

申请号：US16290347

申请日：2019-03-01

Applicant: Owens-Brockway Glass Container Inc.

Inventor： Stephen M. Graff ,  Karl Johnston

IPC: H04N5/33 ,  G06T5/00 ,  G06T5/50 ,  G01J5/28 ,  G01J5/00

Abstract: A method for thermal imaging includes extracting pixel intensity data from a plurality of images corresponding to electromagnetic radiation emitted from one or more targets, creating an array for each image pixel in the plurality of images, wherein each pixel array represents a distribution of intensity data from corresponding pixels in each of the images, removing from each pixel array an amount of intensity data such that a remaining amount of intensity data represents an approximate equivalent to a distribution of intensity data uncontaminated by interference; and generating a thermal image representing the one or more targets based on the remaining amount of intensity data in each pixel array.

公开(公告)号：US20200280687A1

公开(公告)日：2020-09-03

申请号：US16290347

申请日：2019-03-01

Applicant: Owens-Brockway Glass Container Inc.

Inventor： Stephen M. Graff ,  Karl Johnston

IPC: H04N5/33 ,  G06T5/00 ,  G06T5/50 ,  G01J5/28

Abstract: A method for thermal imaging includes extracting pixel intensity data from a plurality of images corresponding to electromagnetic radiation emitted from one or more targets, creating an array for each image pixel in the plurality of images, wherein each pixel array represents a distribution of intensity data from corresponding pixels in each of the images, removing from each pixel array an amount of intensity data such that a remaining amount of intensity data represents an approximate equivalent to a distribution of intensity data uncontaminated by interference; and generating a thermal image representing the one or more targets based on the remaining amount of intensity data in each pixel array.

公开(公告)号：US10680124B2

公开(公告)日：2020-06-09

申请号：US15775709

申请日：2016-11-14

Applicant: UVic Industry Partnerships Inc.

Inventor： Thomas E. Darcie ,  Reuven Gordon ,  Afshin Jooshesh

IPC: H01L31/0232 ,  H01L27/14 ,  H01L31/00 ,  G01J5/08 ,  G01J5/28 ,  G01J1/04 ,  G01J1/42 ,  H01L27/144 ,  H01L31/0304 ,  H01L31/09 ,  H01Q1/38 ,  H01Q9/16 ,  H01Q9/28

Abstract: Disclosed are systems and methods for improving applications involving the generation and detection of electromagnetic radiation at terahertz (THz) frequencies. Embodiments of the systems and methods include the fabrication and use of plasmonic devices that enhance light-matter interaction at the nanometer scale by extreme focusing with nanostructured metals. This plasmonic enhancement is used to produce high efficiency THz photoconductive switches that combine the benefits of low-temperature grown GaAs while using mature 1.55 μm femtosecond lasers operating with photon energy below the GaAs band-gap.

公开(公告)号：US10456092B2

公开(公告)日：2019-10-29

申请号：US15877761

申请日：2018-01-23

Applicant: MITAKA KOHKI CO., LTD.

Inventor： Toshio Yamazaki

IPC: G01B11/25 ,  A61B5/00 ,  G02B21/00 ,  G01J5/28 ,  G08B21/18 ,  H04N5/33 ,  A61B90/30 ,  A61B5/01 ,  G01J5/00 ,  G02B21/02 ,  G16H40/63

Abstract: A surgical microscope system includes an infrared thermocamera that directly obtains temperature data on an illuminating spot. If the obtained temperature data indicates a higher temperature than a temperature represented by reference temperature data, an alarm unit generates an alarming sound to notify in advance a risk of overheating so that a counteraction such as stopping an illuminating beam can be taken to surely prevent the overheating of the illuminating spot.

公开(公告)号：US20170131148A1

公开(公告)日：2017-05-11

申请号：US15156115

申请日：2016-05-16

Applicant: Massachusetts Institute of Technology ,  Trustees of Boston University

Inventor： Harold Y. Hwang ,  Mengkun Liu ,  Richard D. Averitt ,  Keith A. Nelson ,  Aaron Sternbach ,  Kebin Fan

IPC: G01J5/28 ,  H01L27/146 ,  G01J5/20

CPC classification number: G01J5/28 ,  G01J5/20 ,  G01J2005/0077 ,  G01J2005/202 ,  G01J2005/283 ,  G01J2005/286 ,  H01L27/14636 ,  H01L27/1464 ,  H01L27/14669 ,  H01L31/09

Abstract: An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.

公开(公告)号：US09296641B2

公开(公告)日：2016-03-29

申请号：US13666644

申请日：2012-11-01

Applicant: Owens-Brockway Glass Container Inc.

Inventor： Roger P. Smith ,  Carol A. Click ,  Rebecca Mullen ,  Stephen Daniel Barton

IPC: C03C4/02 ,  C03B32/00 ,  G01J5/28 ,  C03C3/087 ,  G01N33/38 ,  G01N21/90

CPC classification number: G01N21/958 ,  C03B32/00 ,  C03C3/087 ,  C03C4/02 ,  G01J5/28 ,  G01N21/8806 ,  G01N21/909 ,  G01N33/386 ,  G01N2021/8845 ,  Y10T428/131

Abstract: A soda-lime-silica glass container and related methods of manufacturing. A black-strikable glass composition having a base glass portion and a latent colorant portion is prepared. The base glass portion includes soda-lime-silica glass materials and one or more blue colorant materials, and the latent colorant portion includes cuprous oxide (Cu2O), stannous oxide (SnO), bismuth oxide (Bi2O3), and carbon (C). Glass containers may be formed from the black-strikable glass composition, and these glass containers may be heated to a temperature greater than 600 degrees Celsius to strike black therein. The glass containers formed from the black-strikable glass composition may be inspected—before or after striking—by infrared inspection equipment.

Abstract translation: 钠钙硅玻璃容器及相关制造方法。 制备具有基底玻璃部分和潜着色剂部分的黑色可蚀刻玻璃组合物。 基础玻璃部分包括钠钙石英玻璃材料和一种或多种蓝色着色剂材料，潜着色剂部分包括氧化亚铜（Cu 2 O），氧化亚锡（SnO），氧化铋（Bi 2 O 3）和碳（C）。 玻璃容器可以由黑色玻璃组合物形成，并且这些玻璃容器可以被加热到大于600摄氏度的温度以在其中发黑。 由黑色可见玻璃组合物形成的玻璃容器可以在通过红外检测设备打击之前或之后进行检查。

公开(公告)号：US20150285687A1

公开(公告)日：2015-10-08

申请号：US14634307

申请日：2015-02-27

Applicant: Massachusetts Institute of Technology ,  Trustees of Boston University

Inventor： Harold Y. Hwang ,  Mengkun Liu ,  Richard D. Averitt ,  Keith A. Nelson ,  Aaron Sternbach ,  Kebin Fan

IPC: G01J5/28 ,  G01J5/20

CPC classification number: G01J5/28 ,  G01J5/20 ,  G01J2005/0077 ,  G01J2005/202 ,  G01J2005/283 ,  G01J2005/286 ,  H01L27/14636 ,  H01L27/1464 ,  H01L27/14669 ,  H01L31/09

Abstract: An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.

Abstract translation: 提供一种用于检测目标频率范围内的电磁辐射的装置。 该装置包括衬底和设置在衬底上的一个或多个谐振器结构。 衬底可以是电介质或半导体材料。 一个或多个谐振器结构中的每一个具有小于目标频率范围内的目标电磁辐射的波长的至少一个维度，并且每个谐振器结构都包括由间隔隔开的至少两个导电结构。 当谐振器结构暴露于目标电磁辐射时，电荷载流子在衬底附近被感应。 由于感应的电荷载体导致的衬底的电导率变化的测量提供了目标电磁辐射的存在的指示。

公开(公告)号：US09025943B2

公开(公告)日：2015-05-05

申请号：US13177705

申请日：2011-07-07

Applicant: Toru Kuroiwa

Inventor： Toru Kuroiwa

IPC: G01J5/10 ,  G01J5/28 ,  F27B5/18 ,  F27D19/00 ,  F27B17/00 ,  G01J5/02 ,  G01J5/00 ,  H01L21/67

CPC classification number: F27B17/0025 ,  F27B5/18 ,  F27D2019/0003 ,  G01J5/0007 ,  G01J5/026 ,  H01L21/67115 ,  H01L21/67248

Abstract: Radiant energy from a semiconductor wafer which is determined from the theoretical value of black body radiation and the actually measured result of an output from a photodiode are brought into correspondence with each other, and a table showing a correlation therebetween is acquired and stored on a magnetic disk. When a semiconductor wafer to be treated is irradiated with flashes of light from flash lamps, the photodiode receives radiant light emitted from the semiconductor wafer. A controller determines, from the output from the photodiode, the radiant energy emitted per unit time from the semiconductor wafer irradiated with flashes of light, based on the acquired table. The controller further determines the surface temperature of the semiconductor wafer from the determined radiant energy.

Abstract translation: 从黑体辐射的理论值确定的半导体晶片的辐射能和来自光电二极管的输出的实际测量结果彼此对应，并且获取表示其之间的相关性的表并将其存储在磁 磁盘。 当要被处理的半导体晶片被来自闪光灯的闪光灯照射时，光电二极管接收从半导体晶片发出的辐射光。 控制器根据光电二极管的输出，根据所获取的表，确定从闪光灯照射的半导体晶片每单位时间发射的辐射能。 控制器还从确定的辐射能量确定半导体晶片的表面温度。