Abstract:
The invention is directed to a method for controlling the emission current of an electron source and to a correspondingly controlled electron source. For this purpose, a parallel circuit comprising resistors 6 and field-effect transistors 7 is connected in the high-voltage circuit between the cathode 1 and the control electrode 2. The supply voltage for the field-effect transistors 7 is generated by voltage dividing the voltage across the resistors 6. The measurement of the emission current takes place at low-voltage potential and a control signal obtained from the measuring signal is optically transmitted via a light-conducting fiber or a light waveguide to the control circuit in the high-voltage part. The emission current control at high-voltage potential is provided without additional voltage supplies. Additional insulating transformers are therefore not required.
Abstract:
A particle beam column for high-resolution imaging and measurement of topographic and material features on a specimen. The particle beam column includes a particle source for providing a primary beam along a primary beam axis for impinging on the specimen so as to release secondary electrons and backscattered electrons therefrom. The particle beam column also includes an objective lens for focussing the electrons so as to provide a radial dispersion of electrons relative to the primary beam axis, the radial dispersion of electrons including an inner annulus of backscattered electrons and an outer annulus of secondary electrons. The particle beam column still further includes a backscattered electron detector for detecting the inner annulus of backscattered electrons and a secondary electron detector for detecting the outer annulus of secondary electrons.
Abstract:
A high power, solid state power supply is described for producing a controllable, constant high voltage output under varying and arcing loads suitable for powering an electron beam gun or other ion source. The present power supply is most useful for outputs in a range of about 100-400 kW or more. The power supply is comprised of a plurality of discrete switching type dc-dc converter modules, each comprising a voltage regulator, an inductor, an inverter for producing a high frequency square wave current of alternating polarity, an improved inverter voltage clamping circuit, a step up transformer, and an output rectifier for producing a dc voltage at the output of each module. The inputs to the converter modules are fed from a common dc rectifier/filter and are linked together in parallel through decoupling networks to suppress high frequency input interactions. The outputs of the converter modules are linked together in series and connected to the input of the transmission line to the load through a decoupling and line matching network. The dc-dc converter modules are phase activated such that for n modules, each module is activated equally 360.degree./n out of phase with respect to a successive module. The phased activation of the converter modules, combined with the square current waveforms out of the step up transformers, allows the power supply to operate with greatly reduced output capacitance values which minimizes the stored energy available for discharge into an electron beam gun or the like during arcing. The present power supply also provides dynamic response to varying loads by controlling the voltage regulator duty cycle using simulated voltage feedback signals and voltage feedback loops. Circuitry is also provided for sensing incipient arc currents reflected at the output of the power supply and for simultaneously decoupling the power supply circuitry from the arcing load.
Abstract:
A high-power power supply produces a controllable, constant high voltage put under varying and arcing loads. The power supply includes a voltage regulator, an inductor, an inverter for producing a high frequency square wave current of alternating polarity, an improved inverter voltage clamping circuit, a step up transformer, an output rectifier for producing a dc voltage at the output of each module, and a current sensor for sensing output current. The power supply also provides dynamic response to varying loads by controlling the voltage regulator duty cycle and circuitry is provided for sensing incipient arc currents at the output of the power supply to simultaneously decouple the power supply circuitry from the arcing load. The power supply includes a plurality of discrete switching type dc--dc converter modules.
Abstract:
An electron beam instrument typified by a scanning electron microscope. The instrument does not suffer from defocus if the accelerating voltage is varied. The instrument has an objective lens, an electron gun emitting an electron beam, a control unit, an accelerating voltage-setting portion, first and second reference voltage sources. The control unit digitizes the accelerating voltage set by the accelerating voltage-setting portion and applies the digital voltage to the two reference voltage sources. The first voltage source consists of a first ROM and a first D/A converter. Similarly, the second voltage source consists of a second ROM and a second D/A converter. A signal V.sub.ref1 indicating the optimum objective lens current at a first working distance is stored in the first ROM. A signal .DELTA.V indicating the difference between the optimum objective lens current at a second working distance and the optimum objective lens current at the first working distance is stored in the second ROM. The output voltage from the second voltage source is applied to one end of a variable resistor acting as a focus-adjusting means. The first reference voltage is applied to one input terminal of an adder. The output voltage from the variable resistor is applied to the other input terminal of the adder. The output voltage from the adder can be varied from V.sub.ref1 (V.sub.H1) to V.sub.ref1 (V.sub.H1)+.DELTA.V(V.sub.H1) by adjusting the movable contact of the variable resistor. Hence, the focus can be adjusted.
Abstract:
In a charged particle beam device, comprising a charged particle source for emitting a charged particle beam, a column comprising particle-optical elements which are enclosed by a column jacket and which serve to accelerate and focus the charged particle beam, the charged particle source comprising an emitter which is accommodated in an emitter chamber, a vibration-insensitive suspension of the emitter is achieved by connecting the emitter chamber to the column jacket via a tubular electrode system. Because the pumping device cooperating with the emitter chamber is arranged above the emitter chamber and in the prolongation of the column, disturbing effects of the pumping device on the emitter are reduced. Because the power supply unit is arranged in the vicinity of the emitter, high-voltage supply leads can be dispensed with, so that interference signals cannot reach the emitter via the supply leads. The use of optical communication via optical fibres prevents the occurrence of undesirable potentials in the equipment.
Abstract:
Electron beam welding apparatus, suitable as a mobile welding apparatus, having a solid dielectric insulator for the high voltage electrical conductors and also having liquid coolants for cooling the conductors and the insulator which are heated by the cathode. The apparatus also includes a valve for sealing the cathode and the anode in an outer housing in one position of the valve and for allowing the passage therethrough of an electron beam in another position of the valve and for providing precision television optical viewing of the welded seam. The apparatus also includes high-voltage connecting apparatus including a plug having a resilient tapered insulating member and a socket in the solid dielectric insulator, and having the shape of a tapered opening for the plug for exerting laterally compressive forces on the plug as the plug is inserted into the socket to avoid trapping air in the socket. The electron beam gun includes a conductive cartridge having a housing for disposition around a conductive base member and having a bayonet lock protruding internally therefrom for locking in the recess of the base member. The cartridge allows changing of the cartridge in a few minutes or changing of the cathode filament in a few minutes.
Abstract:
An electron beam generating system provides a high degree of steadiness of the beam current and comprises a heated cathode, an auxiliary electrode lying at a more negative potential than the cathode, and a transpierced anode. A diaphragm surrounding the beam and connected to a precision resistor is further provided at that side of the auxiliary electrode facing away from the cathode. A portion of the beam current influenced by the control electrode is blanked out by the diaphragm. The precision resistor is connected as an actual value generator to a regulator which is connected to a reference voltage, the output of the regulator influencing the potential of the control electrode over a final control element for the purpose of maintaining the beam current measured by the diaphragm constant.
Abstract:
The invention contemplates lead-through structure for the high-voltage electrode of an electron microscope or the like, in conjunction with shaping of the high-voltage electrode and of the body of insulating material via which the lead-through is supported, in reference to metal envelope structure. The high-voltage electrode has a step-wise enlargement, and the surface of the insulating material which is exposed to the vacuum commences at the start of the step-wise enlargement. As a result, the field strength along the vacuum-exposed insulator surface is so influenced that a minimum electric field strength is produced at the boundary line between the vacuum and the high-voltage electrode. The further result is to prevent occurrence of microdischarges.
Abstract:
A field emission gun, for either electron or positive ion emission, in which the beam current between source and sample is measured at accelerating voltage potential between two concentric shields that enclose the gun, its power supplies, and the measuring circuitry. The outer shield is directly connected to the high voltage terminal of the accelerating voltage supply while the inner shield is at the local ground reference of the emission source and associated components. The current between the concentric shields is measured, converted to a proportional voltage signal, compared with the reference voltage, and applied to a field strength controlling electrode in the vicinity of the emission source to modulate the emission and to maintain a constant beam current.