OXIDE FLUORESCENT MATERIAL, LIGHT EMITTING DEVICE, AND METHOD FOR PRODUCING OXIDE FLUORESCENT MATERIAL

    公开(公告)号:US20240052240A1

    公开(公告)日:2024-02-15

    申请号:US18259267

    申请日:2021-11-08

    摘要: Provided is an oxide fluorescent material having a light emission peak in a wavelength range from red light to near-infrared light.
    The oxide fluorescent material has a composition including: a first element M1 being at least one element selected from the group consisting of Li, Na, K, Rb, and Cs; a second element M2 being at least one element selected from the group consisting of Ca, Sr, Mg, Ba, and Zn; Ge; O (oxygen); and Cr, the composition optionally including: a third element M3 being at least one element selected from the group consisting of Si, Ti, Zr, Sn, Hf, and Pb; and a fourth element M4 being at least one element selected from the group consisting of Eu, Ce, Tb, Pr, Nd, Sm, Yb, Ho, Er, Tm, Ni, and Mn. When the molar ratio of Ge, or the total molar ratio of the third element M3 and Ge in the case of comprising the third element M3, in 1 mol of the composition of the oxide fluorescent material is 6, the molar ratio of the first element M1 is 1.5 or more and 2.5 or less, the molar ratio of the second element M2 is 0.7 or more and 1.3 or less, the molar ratio of the third element M3 is 0 or more and 0.4 or less, the molar ratio of O (oxygen) is 12.9 or more and 15.1 or less, and the molar ratio of Cr is 0.2 or less. The oxide fluorescent material has a light emission peak wavelength of 700 nm or more and 1,050 nm or less in a light emission spectrum of the oxide fluorescent material.

    LIGHT-ABSORBING MATERIAL, METHOD FOR PRODUCING THE SAME, AND SOLAR CELL INCLUDING THE SAME

    公开(公告)号:US20190270648A1

    公开(公告)日:2019-09-05

    申请号:US16416253

    申请日:2019-05-19

    IPC分类号: C01G17/00 H01L51/42 H01G9/20

    摘要: A light-absorbing material includes a compound, wherein the compound has a perovskite crystal structure represented by the formula AMX3 where a Cs+ ion is located at an A-site, a Ge2+ ion is located at an M-site, and I− ions are located at X-sites, and at least a part of the compound has an orthorhombic perovskite crystal structure. An X-ray diffraction pattern of the compound measured using Cu Kα radiation may have a first peak at a diffraction angle (2θ) of 25.4° or more and 25.8° or less and a second peak at a diffraction angle (2θ) of 24.9° or more and 25.3° or less, and an intensity of the first peak may be 30% or more of an intensity of the second peak.