摘要:
A method and related circuit for adjusting the duration of a pulse synchronization signal for the reading phase of memory cells in electronic memory devices which are integrated on semiconductors are discussed. The pulse synchronization signal is produced by a pulse generator when it detects a logical state commutation on at least one input terminal of a plurality of addressing input terminals of the memory cells. The method produces a logical sum between the signal produced by the generator and a pulse signal having a predetermined duration. The logical sum is used to start up the reading phase.
摘要:
A method for reading memory cells that includes supplying simultaneously two memory cells, both storing a respective unknown charge condition; generating two electrical quantities, each correlated to a respective charge condition of the respective memory cell; comparing the two electrical quantities with each other; and generating a two-bit signal on the basis of the result of the comparison. A reading circuit includes a two-input comparator having two branches in parallel, each branch being connected to a respective memory cell by a current/voltage converter. Both the two-input comparator and the current/voltage converter comprise low threshold transistors.
摘要:
A data storage device stores a data unit in a memory page of a storage block along with an error correction code unit for the data unit. Additionally, the data storage device stores an error correction code unit for the data unit in a memory page of another storage block. In various embodiments, one or both of the error correction code units form an error correction code for correcting data bit errors in the data unit. Because the memory page containing the data unit does not have a storage capacity for simultaneously storing the error correction code and the data unit, the data storage device is capable of correcting a greater number of data bit errors in the data unit by using the error correction code in comparison to using an error correction code that would fit in the memory page.
摘要:
In various embodiments, a data correction system has a data path including search modules. Each of the search modules has a respective bit error capacity for locating a number of data bit errors in a data unit based on a locator polynomial. The data correction system generates a syndrome based on an input data unit, generates a locator polynomial based on the syndrome, and determines a number of data bit errors in the input data unit based on the locator polynomial. Additionally, the data correction system selects one of the search modules having a bit error capacity of at least the number of data bit errors in the input data unit. The selected search module generates an error indicator based on the locator polynomial. The data correction system corrects each data bit error in the input data unit based on the error indicator.
摘要:
A circuit comprises at least one memory cell adapted to store data in terms of values of an electrical characteristic thereof, which exhibits a variability with temperature according to a first variation law; a voltage generator is provided for generating a voltage to be supplied to the at least one memory cell for retrieving the data stored therein, the voltage generator including first means adapted to cause the generated voltage take a value in a set of target values including at least one target value, corresponding to an operation to be performed on the memory cell. The voltage generator comprises second means for causing the value taken by the generated voltage vary with temperature according to a prescribed second variation law exploiting a compensation circuit element having said electrical characteristic.
摘要:
A circuit comprises at least one memory cell adapted to store data in terms of values of an electrical characteristic thereof, which exhibits a variability with temperature according to a first variation law; a voltage generator is provided for generating a voltage to be supplied to the at least one memory cell for retrieving the data stored therein, the voltage generator including first means adapted to cause the generated voltage take a value in a set of target values including at least one target value, corresponding to an operation to be performed on the memory cell. The voltage generator comprises second means for causing the value taken by the generated voltage vary with temperature according to a prescribed second variation law exploiting a compensation circuit element having said electrical characteristic.
摘要:
A page buffer for an electrically programmable memory is provided. The page buffer includes a plurality of memory cells, a plurality of distinct programming states defined for each memory cell, corresponding to a number N>=2 of data bits storable in each memory cell, wherein the data bits include at least a first data bits group and a second data bits group and at least one read/program unit having a coupling line operatively associable with selected memory cells. The read/program unit is adapted to at least temporarily store data bits read from or to be written into selected memory cells and comprises programming state change enabling means for selectively enabling a change in programming state of a selected memory cell by causing the coupling line to take one among a program enabling potential and a program inhibition potential. The programming state change enabling means comprises reading means for retrieving, from the selected memory cell, an indication of an existing data value already stored in the second group of data bits, receiving means for receiving an indication of a target data value to be stored in the first group of data bits of the selected memory cell, combining means activatable during a combining phase for combining the indication of the existing data value with the indication of the received target data value, so as to obtain a modified indication corresponding to a target programming state for the memory cell and conditioning means for causing a potential of the coupling line to take the program enabling potential or the program inhibition potential depending on the modified indication. The combining means includes a coupling electrical path between the reading means and the receiving means, said coupling electrical line being kept isolated from the coupling electrical path during said combining phase.
摘要:
A high-voltage switch has a high-voltage input terminal, receiving a high voltage, and an output terminal. A pass transistor, having a control terminal, is connected between the high-voltage input terminal and the output terminal. The output of a voltage-multiplying circuit of the charge-pump type is connected to the control terminal. The voltage-multiplying circuit is of a symmetrical type, has first and second charge-storage means, receiving a clock signal of a periodic type, and has a first circuit branch and a second circuit branch, which are symmetrical to one another and operate in phase opposition with respect to the clock signal.
摘要:
A sensing circuit is provided for sensing semiconductor memory cells. The sensing circuit includes at least one first circuit branch, a feedback-controlled circuit element in the first circuit branch, a current-to-voltage conversion circuit in the first branch, and at least one comparator. The first circuit branch is coupled to a memory cell to be sensed so as to be run through by a current corresponding to a memory cell state. The feedback-controlled circuit element controls a memory cell access voltage, and the current-to-voltage conversion circuit converts the current into a corresponding converted voltage signal that is indicative of the memory cell state. The comparator compares the converted voltage signal with a comparison voltage for discriminating among at least two different states of the memory cell. The converted voltage signal corresponds to a control signal of the feedback-controlled circuit element. Also provided is a method of sensing a memory cell.
摘要:
The invention relates to a method for erasing non-volatile memory cells, and to a corresponding non-volatile memory device of the programmable and electrically erasable type implementing the method, and comprising a memory cell array organized in a row-and-column layout, and divided in array sectors, including at least one row decode circuit portion being supplied positive and negative voltages. The method is applied whenever the issue of the erase algorithm is negative, and comprises the following steps: forcing an incompletely erased sector into a read condition; scanning the rows of said sector to check for the possible presence of a spurious current indicating a fail state; identifying and electrically isolating the failed row; re-addressing from said failed row to a redundant row provided in the same sector; re-starting the erase algorithm.