摘要:
A method includes measuring a gate leakage current of at least one transistor. A single stress bias voltage is applied to the at least one transistor at a given temperature for a stress period t. The stress bias voltage causes a 10% degradation in a drive current of the transistor at the given temperature within the stress period t. A negative bias temperature instability (NBTI) lifetime τ of the transistor is estimated based on the measured gate leakage current and a relationship between drive current degradation and time observed during the applying step.
摘要:
A PMOS device less affected by negative bias time instability (NBTI) and a method for forming the same are provided. The PMOS device includes a barrier layer over at least a portion of a gate structure, a gate spacer, and source/drain regions of a PMOS device. A stressed layer is then formed over the barrier layer. The barrier layer is preferably an oxide layer and is preferably not formed for NMOS devices.
摘要:
A magnetic socket contains: a body and at least one magnetic attraction element. The body includes a connection segment and a fitting section, the connection segment has a polygonal coupling orifice defined therein and configured to accommodate a socket wrench, and the fitting section has a locking orifice formed therein and configured to lock a screw or a nut made of metal, wherein the locking orifice is polygonal. The body further includes at least one through orifice arranged on the fitting section and communicating with the locking orifice, and each of the at least one magnetic attraction element is housed in each of the at least one through orifice. Thereby, the magnetic socket is driven by the socket wrench so as to rotatably lock or remove a screw or a nut, and the magnetic socket magnetically attracts the screw or the nut, after removing the screw or the nut.
摘要:
An apparatus comprises a circuit for measuring a gate leakage current of a plurality of transistors. A circuit is provided to apply heat to gates of the plurality of transistors. A circuit is provided to apply a single stress bias voltage to the plurality of transistors for a stress period t. The stress bias voltage is sufficient to cause a 10% degradation in a drive current of the transistor within the stress period t. A processor is provided for estimating a negative bias temperature instability (NBTI) lifetime τ of the transistor based on a relationship between the gate leakage current and one or more of the group consisting of gate voltage, gate length, gate temperature, and gate width of the plurality of transistors. The relationship is determined from data observed while applying the single stress bias voltage.
摘要:
A stacked and integrated electric power generating device for capturing multiple light sources for power generation has a first concentrating photovoltaic module and a second concentrating photovoltaic module. The first concentrating photovoltaic module 10 has a transparent solar concentrating panel and a thin film solar cell. The second concentrating photovoltaic module is positioned below the first concentrating photovoltaic module with an interval, such that the first and second concentrating photovoltaic modules are in the form of a stacked and integrated structure, and the second concentrating photovoltaic module can absorb the light concentrated by the transparent solar concentrating panel to generate electric power.
摘要:
A capacitor and methods for forming the same are provided. The method includes forming a bottom electrode; treating the bottom electrode in an oxygen-containing environment to convert a top layer of the bottom electrode into a buffer layer; forming an insulating layer on the buffer layer; and forming a top electrode over the insulating layer.
摘要:
A steering wheel locking device includes a lock rod, a lock base, a locking device and a fixing unit. The lock rod has a chamber, two pairs of first holes longitudinally aligned, a lock hole and a saddle. The lock base comprises a lock core to be inserted into the lock base through the lock hole. The top of the lock core is provided with a latch. The locking device has a pair of second holes in register with the pairs of first holes of the lock rod, and is engageable with the latch and moveable transversely along the lock rod between a locked position and an unlocked position. The fixing unit comprises a pair of fixing rods in register with the pairs of first holes of the lock rod and the pair of second holes of the locking device. The fixing rods are moveable longitudinally through the pairs of first holes and the pair of second holes to lock or unlock the locking device.