摘要:
An abutted portion of face plates 12b and 22b of hollow frame members 10 and 20 is carried out according to a friction stir joining. Next, a connection member 30 is mounted, one end of the connection member 30 is abutted to an end portion of the face plate 11 of the hollow frame member 10. Under this condition, the abutted portion between the face plate 11 and the connection member 30 is carried out according to the friction stir joining. An overlapping portion between another end of the connection member 30 and the hollow frame member 20 is carried out according to the friction stir joining. According to demands, the connection member 30 and the face plate 21 of the hollow member 20 is welded. Without of regard of a dimension accuracy of the hollow frame member and the like, a good joining from one side face of the hollow frame member can be carried out.
摘要:
Specific ABR control capability for implementing an ABR service in an ATM switching system. A subscriber line processing device has a capability for calculating a turnaround delay time of a cell, based on a period during which the cell loops back at a terminal and returns. A switch or demultiplexer has a capability for detecting congestion. A rate calculator calculates a transmission rate corresponding to an output channel, and writes the calculated rate to the cell. A rate changer suitably changes the transmission rate according to the degree of occurrence of congestion. Additionally, the rate changer counts the number of communicating connections. At this time, the number of communicating connections which should exist in a certain predetermined period is estimated based on the counted number of communicating connections, which is counted in a period shorter than the predetermined period according to a predetermined method. Additionally, a coefficient is determined based on the number of communicating connections so estimated and an actual number of communicating connections, and a next estimated value is estimated to be a more suitable value using the coefficient.
摘要:
A device for discriminating timeout comprises an event discrimination unit, a calculation unit, a timing storage unit and a timeout discrimination unit. The event discrimination unit outputs each communication information concerning each communication to the calculation unit, when an event indicating a start of timeout discrimination occurred. The calculation unit calculates a timeout timing for every communication on the basis of the each communication information and the timing in which the event has occurred, and writes the calculated timeout timing into the timing storage unit. The timeout discrimination unit compares the timeout timing read out from the timing storage unit for every communication with the present timing, and discriminates that the timeout has occurred in reference to the communication when the present timing exceeds the timeout timing.
摘要:
A communication system for transmitting a fixed-length cell converted from a variable-length information including data and a destination of the data. The system includes a cell assembly/disassembly device for performing bi-directional conversion between the variable-length information and the fixed-length cell, a routing control device for receiving the fixed-length cell converted from the variable-length information by the cell assembly/disassembly device, for analyzing the destination of the data and for controlling a routing of the fixed-length cell based on the analyzed destination, and having an error detecting device for detecting an error of the variable-length information in the fixed-length cell, and a network for connecting the cell assembly/disassembly device and the routing control device by a fixed capacity path and for connecting the routing control device to another routing control device by the fixed capacity path or a variable capacity path.
摘要:
In a semiconductor phase synchronizing circuit, variations in specific frequency and damping factor due to unavoidable variations in manufacturing conditions are prevented so that variations in phase synchronizing characteristics from one product to another are reduced. A charge pump of the phase synchronizing circuit is provided with a proportional charging electric current source and a proportional discharging electric current source arranged to be in the form of a feedback loop and to pass to a loop filter charging/discharging electric currents which are proportional to a converted electric current (output electric current) of a V/I converting circuit. The proportional charging electric current source is a P-type MOSFET, while the proportional discharging electric current source is an N-type MOSFET. The charge pump is a current mirror circuit in front of which a current mirror circuit of the V/I converting circuit is disposed.
摘要翻译:在半导体相位同步电路中,防止了制造条件中不可避免的变化引起的特定频率和阻尼因数的变化,从而降低了从一个产品到另一个产品的相位同步特性的变化。 相位同步电路的电荷泵设置有比例充电电流源和布置为反馈回路形式的比例放电电流源,并且传递到环路滤波器,其与 V / I转换电路的转换电流(输出电流)。 比例充电电流源是P型MOSFET,而比例放电电流源是N型MOSFET。 电荷泵是电流镜电路,其前面设有V / I转换电路的电流镜电路。
摘要:
In order to realize a multiple assembled easily with high accuracy, a multipole having assembly accuracy within 10 micrometer and within several seconds of angle is achieved by fixing multipole elements by being guided by grooves provided on an inner side of a cylindrical housing to form the multipole.
摘要:
Disclosed is a scanning charged particle beam apparatus equipped with an aberration corrector, contrived to eliminate resolution degradation in tilt observation by a chromatic third-order aperture aberration without relying on a specific optical system. A controller of the scanning charged particle beam apparatus provides a chromatic third-order aperture aberration measurement method relevant to tilt observation of a specimen. Further, the controller has a chromatic aberration control function relevant to tilt observation of a specimen. By means of the chromatic aberration control function, the controller controls a chromatic aberration to be positive or negative, rather than remaining at 0, in order to eliminate an image blur which occurs in a direction parallel to the specimen surface due to a chromatic third-order aperture aberration and a chromatic aberration at a tilt angle (t1) under observation and another tilt angle (−t1) axially opposite to the tilt angle.
摘要:
A tilted illumination observation method and observation device with easy adjustment, high speed, good reproducibility and low cost is provided. A high resolution tilt image of a specimen is obtained by extracting the blurring on the scanning spot occurring during beam tilt from the image (step 6) captured by the tilted beam, and the image (step 4) captured from directly above the standard specimen; and then deconvoluting (step 11, 12) the tilted image of the target specimen (step 10) using the extracted scanning spot from the oblique beam.
摘要:
A method for estimation of a probe shape, in a scanning electron microscope provided with an aberration corrector, and the method is designed so as to obtain a probe image, by inputting to a computer an image taken in a just-focused state and an image taken in a de-focused state, as an image data; preparing a correlation window by automatically determining a size of a correlation window image, based on an input data size and an output data size; executing cross-correlation calculation between the correlation window and a reference area; and repeating this calculation while shifting the reference area, so as to obtain a cross-correlation matrix, in order to stably obtain the probe image, without receiving effects of use conditions or noises.
摘要:
In a charged-particle beam apparatus having a high-accuracy and high-resolution focusing optical system for charged-particle beam, a group of coils are arranged along a beam emission axis to extend through the contour of radial planes each radiating from the beam emission axis representing a rotary axis and each having a circular arc which subtends a divisional angle resulting from division of a circumferential plane by a natural number larger than 2 so that a superposed magnetic field may be generated on the incident axis of the charged-particle beam and the trajectory of the charged-particle beam may be controlled by the superposed magnetic field.