摘要:
A current mirror includes first and second transistors each having a control terminal and a load path with two terminals. The control terminals of the first and second transistors and one of the terminals of the load path of the first transistor receive a first input current. Third, fourth and fifth transistors each have a control terminal and a load path with two terminals. The control terminals of the third, fourth and fifth transistors and one of the terminals of the load path of the third transistor receive a second input current of equal magnitude to the first input current. One of the terminals of the load path of the fifth transistor supplies an output current proportional to the two input currents. The other of the terminals of the load paths of the third and fifth transistors are each connected to one terminal of the load path of a respective one of the fourth and second transistors. The other of the terminals of the load paths of the first, second and fourth transistors are connected to a common reference point.
摘要:
A circuit testing interface and test method are disclosed. The circuit testing interface may include a test current transmitting pad, a test voltage measuring pad, and at least one driving circuit comprising an output terminal. The output terminal of the at least one driving circuit may be coupled to a through-silicon via (TSV). The circuit testing interface may further include at least one switch module, coupled to (1) the output terminal of the driving circuit, (2) the test current transmitting pad, and (3) the test voltage measuring pad.
摘要:
A circuit test interface and a test method are disclosed. The circuit test interface may include a test voltage input pad, a test voltage output pad, and a plurality of input buffers. Each of the plurality of input buffers may have a first input terminal, a second input terminal, and an output terminal. The first input terminal of each respective input buffer may be coupled to one of a plurality of through-silicon vias (TSVs). The circuit test interface may further include a plurality of switch units. Each of the plurality of switch units may have a first terminal and a second terminal. The circuit test interface may further include a scan chain, coupled to both the output terminal of each of the plurality of input buffers and to the test voltage output pad.
摘要:
An electronic subsystem assembly including a subsystem circuit, a contact interface, a memory circuit, and a radio frequency interface. The subsystem circuit is configured to provide a system function. The contact interface is configured to receive input signals and output signals. The memory circuit is configured to receive the input signals via the contact interface and to transmit the output signals via the contact interface. The radio frequency interface is configured to receive data signals from the memory circuit and to provide a radio frequency transmission that includes the data signals.
摘要:
A test mode for component-specific testing of a memory module. Data is written to and stored in each memory component of a memory module, which data indicates whether the memory component is to execute a particular test mode. Upon receiving a test mode command supplied in common to all of the memory components on the memory module, each memory component examines the data to determine whether it is to execute a test mode command supplied contemporaneously therewith or subsequently supplied test mode commands.
摘要:
A semiconductor packaging arrangement, or module, includes a printed circuit board having an electrical interconnect thereon and a semiconductor package mounted to the printed circuit board. The semiconductor package includes a fractional portion of a semiconductor wafer having a plurality of integrated circuit chips thereon, such chips being separated by regions in the fractional portion of the wafer. The fractional portion of the wafer has a plurality of electrical contacts electrically connected to the chips. The package also includes a dielectric member having an electrical conductor thereon. The electrical conductor are electrically connected to the plurality of electrical contacts of the plurality of chips to electrically interconnect such plurality of chips with portions of the electrical conductor spanning the regions in the fractional portion of the wafer. A connector is provided for electrically connecting the electrical conductor of the package to the electrical interconnect of the printed circuit board.
摘要:
An integrated circuit, comprising: at least one main circuit operable to perform one or more functions, and including at least one I/O node for receiving or transmitting an operating signal; an active termination circuit having first and second MOSFETs of the same type coupled in series across a Vdd node of a first source potential and a Vss node of a second source potential, the at least one I/O node being coupled to a common node between the first and second MOSFETs; and a control circuit operable to bias the first and second MOSFETs such that they exhibit a controlled impedance at the common node.
摘要:
An N-bit word is produced from an M-bit code received on an M-bit line, M being larger than N, the M-bit code comprising at least an M-bit code word and a previous M-bit code word, the M-bit code word comprising different levels at at least two bit positions, and the previous M-bit code word comprising levels opposite to the different levels at the corresponding bit positions, by comparing the levels at the two bit positions of the M-bit code word to obtain a first value, comparing the levels at the two corresponding bit positions of the previous M-bit code word to obtain a second value, detecting that the first value is opposite to the second value, and decoding the M-bit code word responsive to detecting that the first value is opposite to the second value. An advantage of the present invention is that all the lines taking part in the transmission have the same electrical characteristics, the same meaning and the same kind of loads.
摘要:
A memory device includes a pair of complementary bitlines including a first bitline and a second bitline. A bitline precharge block is coupled between the first bitline and the second bitline. A sense amplifier is coupled to both the first bitline and the second bitline and a sense amplifier precharge block is coupled to the sense amplifier. The sense amplifier precharge block can be activated independently from the bitline precharge block. An isolation block is coupled between the pair of complementary bitlines and the bitline precharge block on one side and the sense amplifier and sense amplifier precharge block on another side.
摘要:
A semiconductor packaging arrangement, or module, includes a printed circuit board having an electrical interconnect thereon and a semiconductor package mounted to the printed circuit board. The semiconductor package includes a fractional portion of a semiconductor wafer having a plurality of integrated circuit chips thereon, such chips being separated by regions in the fractional portion of the wafer. The fractional portion of the wafer has a plurality of electrical contacts electrically connected to the chips. The package also includes a dielectric member having an electrical conductor thereon. The electrical conductor are electrically connected to the plurality of electrical contacts of the plurality of chips to electrically interconnect such plurality of chips with portions of the electrical conductor spanning the regions in the fractional portion of the wafer. A connector is provided for electrically connecting the electrical conductor of the package to the electrical interconnect of the printed circuit board.