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    Device for the biomethanation of H2 and CO2
    51.
    发明授权
    Device for the biomethanation of H2 and CO2 有权

    公开(公告)号：US10329588B2

    公开(公告)日：2019-06-25

    申请号：US14901585

    申请日：2014-06-27

    Applicant: Matthias Brunner

    Inventor： Matthias Brunner

    IPC: C12M1/00 ,  C12M1/06 ,  C12M1/12 ,  C12P5/02 ,  C12M1/107

    Abstract: The invention relates to means and methods for the biomethanation of H2 and CO2. In particular, the invention relates to devices for producing methane by means of methanogenic microorganisms by converting H2 and CO2, wherein the devices comprise at least one reactor, an aqueous medium, which is provided in the at least one reactor, wherein the methanogenic microorganisms are contained in the aqueous medium, a feeding apparatus, which is designed to introduce H2 and CO2 into the at least one reactor, wherein H2 and CO2 form a gaseous mixture therein, and a reaction-increasing device, which is designed to enlarge the contact surface between the aqueous medium having the methanogenic microorganisms and the gaseous mixture. The invention further relates to methods for producing methane in a reactor device by means of methanogenic microorganisms.

    Prober for electronic device testing on large area substrates
    52.
    发明授权
    Prober for electronic device testing on large area substrates 有权
    用于在大面积基板上进行电子设备测试的探针

    公开(公告)号：US07786742B2

    公开(公告)日：2010-08-31

    申请号：US11746530

    申请日：2007-05-09

    Applicant: Sriram Krishnaswami ,  Matthias Brunner ,  William Beaton ,  Yong Liu ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Ludwig Ledl ,  Ralf Schmid

    Inventor： Sriram Krishnaswami ,  Matthias Brunner ,  William Beaton ,  Yong Liu ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Ludwig Ledl ,  Ralf Schmid

    IPC: G01R31/02

    CPC classification number: G01R31/2887 ,  G09G3/006 ,  G09G3/3208 ,  G09G3/3611

    Abstract: An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact points, and may be configured to test various patterns of displays and contact points on various large area substrates. The prober assembly is also configured to test fractional sections of the large area substrate positioned on a testing table, and the prober assembly may be configured for different display and contact point patterns without removing the prober assembly from the testing table.

    Abstract translation: 描述了用于测试大面积基板的装置和方法。 大面积基板包括电耦合到大面积基板上的显示器的显示器图案和接触点。 该装置包括可相对于大面积基板和/或接触点移动的探测器组件，并且可以被配置为测试各种大面积基板上的各种显示图案和接触点。 探测器组件还被配置为测试位于测试台上的大面积衬底的小数部分，并且探针组件可以被配置为用于不同的显示和接触点图案而不从测试台移除探测器组件。

    Apparatus and method for contacting of test objects
    56.
    发明授权
    Apparatus and method for contacting of test objects 有权
    测试对象接触的装置和方法

    公开(公告)号：US07474108B2

    公开(公告)日：2009-01-06

    申请号：US11398052

    申请日：2006-04-05

    Applicant: Matthias Brunner

    Inventor： Matthias Brunner

    IPC: G01R31/305 ,  G01R31/28

    CPC classification number: G09G3/006 ,  G01R31/2887 ,  G01R31/302

    Abstract: The invention relates to methods for positioning of a substrate and contacting of the test object for testing with a test apparatus with an optical axis and corresponding devices. Thereby, the substrate is put on the holder. The substrate is positioned relative to the optical axis. A contact unit is also positioned relative to the optical axis, whereby the contact unit is positioned independent of the positioning activity of the substrate. Thereby, a flexible contacting of test objects on the substrate can be realized.

    Abstract translation: 本发明涉及一种用于定位基板的方法和用于测试的测试对象与测试设备与光轴和相应设备的接触。 由此，将基板放在支架上。 基板相对于光轴定位。 接触单元也相对于光轴定位，由此接触单元被定位成与衬底的定位活动无关。 从而可以实现测试对象在基板上的柔性接触。

    Configurable prober for TFT LCD array test
    57.
    发明授权
    Configurable prober for TFT LCD array test 有权
    可配置探针用于TFT LCD阵列测试

    公开(公告)号：US07355418B2

    公开(公告)日：2008-04-08

    申请号：US10903216

    申请日：2004-07-30

    Applicant: Matthias Brunner ,  Shinichi Kurita ,  Ralf Schmid ,  Fayez E. Abboud ,  Benjamin Johnston ,  Paul Bocian ,  Emanuel Beer

    Inventor： Matthias Brunner ,  Shinichi Kurita ,  Ralf Schmid ,  Fayez E. Abboud ,  Benjamin Johnston ,  Paul Bocian ,  Emanuel Beer

    IPC: G01R31/305

    CPC classification number: G01R1/07364 ,  G01R31/2893 ,  G01R31/305 ,  G09G3/006

    Abstract: An improved prober for an electronic devices test system is provided. The prober is “configurable,” meaning that it can be adapted for different device layouts and substrate sizes. The prober generally includes a frame, at least one prober bar having a first end and a second end, a frame connection mechanism that allows for ready relocation of the prober bar to the frame at selected points along the frame, and a plurality of electrical contact pins along the prober bar for placing selected electronic devices in electrical communication with a system controller during testing. In one embodiment, the prober is be used to test devices such as thin film transistors on a glass substrate. Typically, the glass substrate is square, and the frame is also square. In this way, “x” and “y” axes are defined by the frame. The electrical pins may be movable along the axial length of the prober bars, or may be selectively pushed down to contact selected contact pads on the substrate.

    Abstract translation: 提供了一种用于电子设备测试系统的改进的探测器。 探测器是“可配置的”，这意味着它可以适用于不同的设备布局和基板尺寸。 探测器通常包括框架，至少一个具有第一端和第二端的探测杆，框架连接机构，其允许在沿着框架的选定点准备将探测杆重新定位到框架，以及多个电触点 沿着探测杆的引脚，用于在测试期间将选定的电子设备与系统控制器电连通。 在一个实施例中，探测器用于测试诸如玻璃基板上的薄膜晶体管的器件。 通常，玻璃基板是正方形的，框架也是正方形的。 以这种方式，“x”和“y”轴由框架定义。 电引脚可以沿着探针杆的轴向长度移动，或者可以选择性地向下推动以接触衬底上的所选择的接触垫。

    Large substrate test system
    59.
    发明授权
    Large substrate test system 失效

    公开(公告)号：US07129694B2

    公开(公告)日：2006-10-31

    申请号：US10155796

    申请日：2002-05-23

    Applicant: Matthias Brunner ,  Shinichi Kurita ,  Wendell T. Blonigan ,  Edgar Kehrberg

    Inventor： Matthias Brunner ,  Shinichi Kurita ,  Wendell T. Blonigan ,  Edgar Kehrberg

    IPC: G01R31/28

    CPC classification number: H01L21/67748 ,  G01R31/01 ,  H01L21/67288 ,  H01L21/682

    Abstract: A system and method for testing substrates is generally provided. In one embodiment, a test system for testing a substrate includes a load lock chamber, a transfer chamber and a test station. The load lock chamber and the test station are disposed on top of one another and coupled to the transfer chamber. The transfer chamber includes a robot adapted to transfer a substrate between the load lock chamber, which is at a first elevation, and the test station, which is at a second elevation. In another embodiment, a test station is provided having a turntable adapted to rotate the substrate. The turntable enables the range of motion required to test the substrate to be substantially reduced while facilitating full test and/or inspection of the substrate.

    Deflection system for a particle beam device
    60.
    发明授权
    Deflection system for a particle beam device 有权
    用于粒子束装置的偏转系统

    公开(公告)号：US07105833B2

    公开(公告)日：2006-09-12

    申请号：US10477664

    申请日：2002-03-04

    Applicant: Matthias Brunner ,  Ralf Schmid

    Inventor： Matthias Brunner ,  Ralf Schmid

    IPC: H01J3/14

    CPC classification number: H01J37/153 ,  H01J37/147

    Abstract: A particle beam apparatus and a device for an energy corrected deflection by a predetermined deflection angle of a particle beam coming in along a beam axis are disclosed, whereby the particle beam consists of charged particles with energy values scattered around a predetermined energy value. The device comprises a corrector, whereby the corrector, by means of a first electric field and a superimposed first magnetic field, deflects the charged particles depending on their energies, and whereby the direction of the charged particles with the predetermined energy value is maintained during the passage through the corrector. The device further comprises a deflector applied after the corrector, whereby the deflector, by means of a second electric field or by means of a second magnetic field, deflects the charged particles with the predetermined energy vague by the predetermined deflection angle away from the beam axis, whereby the deflector focuses the charged particles. Further, the device comprises a controller to control the corrector and the deflector.

    Abstract translation: 公开了一种粒子束装置和用于通过沿着光束轴线进入的粒子束的预定偏转角的能量校正偏转的装置，由此粒子束由具有以预定能量值散射的能量值的带电粒子组成。 该装置包括校正器，由此校正器借助于第一电场和叠加的第一磁场根据其能量使带电粒子偏转，并且由此在期间保持具有预定能量值的带电粒子的方向 通过校正器。 该装置还包括在校正器之后施加的偏转器，由此偏转器借助于第二电场或借助于第二磁场使预定能量的带电粒子偏转远离光束轴线的预定偏转角 由此偏转器将带电粒子聚焦。 此外，该装置包括用于控制校正器和偏转器的控制器。

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