CONFORMAL/OMNI-DIRECTIONAL DIFFERENTIAL SEGMENTED APERTURE

    公开(公告)号:US20230187841A1

    公开(公告)日:2023-06-15

    申请号:US18105559

    申请日:2023-02-03

    IPC分类号: H01Q17/00 H01Q21/06

    CPC分类号: H01Q17/008 H01Q21/061

    摘要: A radio frequency (RF) aperture includes an array of electrically conductive tapered projections arranged to define a curved aperture surface, such as a semi-cylinder aperture surface, or a cylinder aperture surface (which may be constructed as two semi-circular aperture surfaces mutually arranged to define the cylinder aperture surface). The RF aperture may further include a top array of electrically conductive tapered projections arranged to define a top aperture surface. The top aperture surface may be planar, and a cylinder axis of cylinder aperture surface may be perpendicular to the plane of the planar top aperture surface. The RF aperture may further include baluns mounted on at least one printed circuit board, each having a balanced port electrically connected with two neighboring electrically conductive tapered projections of the array and further having an unbalanced port.

    Waveform Emission Location Determination Systems and Associated Methods

    公开(公告)号:US20230184880A1

    公开(公告)日:2023-06-15

    申请号:US17547665

    申请日:2021-12-10

    IPC分类号: G01S5/22 G08B13/16 G10L25/51

    摘要: Waveform emission location determination systems and associated methods are described. According to one aspect, a waveform emission location determination system includes a plurality of detectors configured to receive a waveform emitted by a source and to generate electrical signals corresponding to the waveform, processing circuitry configured to access data corresponding to the electrical signals generated by the detectors, use the data to determine a plurality of spheres, and wherein a surface of each of the spheres contains a location of the source when the waveform was emitted by the source, determine an intersection of the spheres, and use the intersection of the spheres to determine the location of the source when the waveform was emitted by the source.

    Resonant waveguide cavity system for complex permittivity measurements

    公开(公告)号:US11650168B2

    公开(公告)日:2023-05-16

    申请号:US17025600

    申请日:2020-09-18

    IPC分类号: G01N22/00 H01P7/06

    CPC分类号: G01N22/00 H01P7/06

    摘要: A method of using a resonant cavity for measuring a complex permittivity ε and identifying of a sample (solid or liquid) of microliter volume size includes using a network analyzer to measure over a defined millimeter wave frequency range, a first resonance frequency at a cavity resonance mode, and calculating an unloaded quality factor of an enclosed resonant waveguide cavity of a defined internal dimensions, placing a sample on a surface of a bottom wall of the resonant waveguide cavity and measure a second resonance frequency and calculating a loaded quality factor; determining, a resonance frequency shift Δf=(fs−fo), determining a complex permittivity ε of the sample according to the resonance frequency shift Δf, the loaded quality factor, the unloaded quality factor and the defined internal dimensions; and identifying the sample using a database through the complex permittivity ε.