Abstract:
A programmable logic module. In the programmable logic module, a first printed circuit board has a socket and a downloading unit. A field programmable gate array (FPGA) is disposed on the first printed circuit board. A nonvolatile memory stores program codes for programming the field programmable gate array. The nonvolatile memory is soldered to a second printed circuit board with a plurality of pins corresponding to the socket, and the second printed circuit board is plugged into the socket of the first printed circuit board. The nonvolatile memory downloads program codes thereof to the field programmable gate array by the downloading unit.
Abstract:
The invention relates to a phase offset tracking module and method for tracking a phase offset, and in particular, to a phase offset tracking module and method for tracking a phase offset in a receiver. A phase offset tracking method comprises: utilizing a first and a second registers to respectively store a first and a second register values; estimating an error phase according to an input phase and an output phase; setting the first register value to an unit phase error initially; setting the second register value according to the first register value; filtering the error phase to generate a filtered signal according to the first register value; accumulating the filtered signal continuously according to the second register value to generate the output phase; and compensating the phase offset in each input symbol according to the output phase.
Abstract:
A method for real-time instruction information tracing for recording the information about a plurality of specific instructions executed by a processor. The method contains the following steps. A trace count value is set to an initial value. A trigger count value is set according to the tracing start point. The trace count value is increased whenever a specific instruction executed by the processor. If the increased trace count value is equal to or larger than the trigger count value, record the instruction information about the specific instruction executed by the processor in a buffer; if the buffer is full, stop running the program and output the instruction information stored in the buffer. During this time reset the trigger count value according to the trace count value, reset the trace count value as the initial value, and then start running the program with the processor again.
Abstract:
A voltage regulator apparatus, wherein two transistors are coupled to an output terminal of a voltage regulator, so as to improve the transient response of output voltage and increase the stability of the output voltage. Besides, it avoids the use of an external capacitor.
Abstract:
A parametric measuring circuit for minimizing an oscillation effect is provided. The parametric measuring circuit comprises an input detection circuit, an oscillation effect eliminating logic circuit and an output selection circuit. The input detection circuit receives an input signal from an external input terminal and outputs the detection signal. The oscillation effect eliminating logic circuit is coupled to the input detection circuit for reducing/eliminating oscillation effect and outputting the detection signal. The output selection circuit is coupled to the oscillation effect eliminating logic circuit to select and transmit either the output signal generated from the internal circuit or the detection signal to the output terminal.
Abstract:
A method of generating a protected standard delay format (SDF) file is disclosed. The interconnect delay descriptions of a SDF file are backwardly or forwardly integrated into the related cell delay descriptions according to their interconnection type to generate the protected SDF file. The total delay value of each signal path is the same as original, so that the simulation result generated by a simulator is not affected.
Abstract:
An integrated circuit chip with a high area utilization rate includes: a plurality of logic circuits in a logic area; a first input and output circuit near a first side of the logic area for exchanging signals with the logic circuit; a second input and output circuit near a second side of the logic area for exchanging signals with the logic circuit; a plurality of first probe pads coupled to the first and the second input and output circuits for inputting or outputting signals to the first and the second input and output circuits; a corner cell comprising a plurality of wires coupled to the first and the second input and output circuits for exchanging signals between the first and the second input and output circuits; and a first process monitor circuit formed in the corner cell for monitoring a semiconductor process of the integrated circuit chip.
Abstract:
A power supply clamp circuit for preventing damage to an integrated circuit due to electrostatic discharge. The power supply clamp circuit includes a voltage generator electrically connected to a first node for generating a voltage; a first PMOS transistor having a source electrically connected to the first voltage source, a gate electrically connected to the first node, and a drain electrically connected to a second node; a first NMOS transistor having a drain electrically connected to the second node, a gate electrically connected to the first node, and a source connected to ground; a second NMOS transistor having a drain electrically connected to the first voltage source, a gate electrically connected to the second node, and a source connected to ground; and a second PMOS transistor having a source electrically connected to the second node, a gate and a drain commonly electrically connected to the first node.
Abstract:
A data transfer method for a Universal Serial Bus (USB) device is provided. The data transfer rate of a bulk transfer transmission in the USB is detected first for selecting a transfer transmission having a better data transfer rate between the bulk transfer transmission in the USB and an interrupt transfer transmission in the USB, so as to ensure the data transfer bandwidth in the USB is better utilized by the USB device.
Abstract:
An integrated circuit for locating failure process layers. The circuit has a substrate with a scan chain disposed therein, having scan cells connected to form a series chain. Each connection is formed according to a layout constraint of a minimum dimension provided by design rules for an assigned routing layer. Since the connection in the assigned routing layer is constrained to a minimum, the scan chain is vulnerable to variations in processes relevant to the assigned routing layer. The scan chain makes it easier to locate processes causing low yield rate of the scan chain.