Abstract:
A multi-channel electronic waveform recorder, for storing waveform data and time of occurrence information, i.e., a "time-tag", for each stored value of an input waveform, is disclosed. Specifically, each channel of the waveform recorder compares a previously stored value of a corresponding input signal to a current value .Iadd.of that signal.Iaddend., and .[.stores.]. .Iadd.is able to store .Iaddend.the current value whenever the difference between the input signal and the previously stored value is a predetermined amount. .Iadd.Each or any selected sub-set of all the channels, through an appropriate switch setting, can determine points in time when, in response to the difference occurring for that channel, all the channels will simultaneously store the current value of these respective input signals. .Iaddend.
Abstract:
In mixed analog/digital integrated circuit constructed by an analog unit, typically an A/D converter, which processes an analog signal and converts it into a digital signal, a digital unit for processing the digital signal, and a clock signal generator for supplying operating clock signals to the analog unit and the digital unit, a clock signal stop circuit for stopping an operating clock signal supplied to the digital unit during an operation of the analog unit is provided, thus adverse effect on the analog unit by the digital noise generated by the digital unit is eliminated.
Abstract:
A method and apparatus for a system physically realizing a transfer function and having improved accuracy and fast calibration is described, comprising a plurality of stages configured in a serial fashion, each stage having a transfer function realized with fixed and adjustable elements. Control logic for selectively reconfiguring said stages, operable for coupling any one of said stages to a reference signal and for further coupling said one of said stages to the remaining ones of said stages in a serial fashion is added; control logic for selectively causing said stages to transmit at their output responses to an input which enable measurement of individual components within said stages is included; and control logic for updating the adjustable elements within each stage is described. A calibration technique is disclosed wherein the system is reconfigured to allow any one of said stages to be configured as the first stage in a chain made up of all of said stages, serially coupled, the first stage outputting signals indicative of the value of components within it in response to selective excitation by the reference signal, the remaining stages capturing said outputted signals and storing the result as a measurement.The calibration process continues until the adjustable elements within each stage have been updated. Additional cycles may be performed for increased accuracy. An additional preferred embodiment of an analog-to-digital converter implemented using the accuracy bootstrapping invention is disclosed. Other embodiments are also disclosed.
Abstract:
The result of an analog to digital conversion is stored in a first storage unit, the contents of the first storage unit are transferred to a second storage unit, and the contents of these storage units are compared by an arithmetic unit to determine whether the result of the analog to digital conversion increases or decreases over time.
Abstract:
A semiconductor integrated circuit having a test circuit built therein is disclosed which consists of an A/D converter to be connected to a peripheral circuit, a digital circuit connected to the A/D converter, a digital signal switching device for selectively connecting to the output of the A/D converter and that of the digital circuit, and a boundary scan output circuit connected to the output of the digital signal switching device, wherein the digital signal switching device connects the A/D converter to the boundary scan output circuit in a normal mode, while the signal fetched in the boundary scan output circuit is outputted therefrom in test mode. Semiconductor integrated circuits having an analog circuit built therein and an analog integrated circuit in which a test circuit is built-in are also disclosed.
Abstract:
A circuit arrangement for defining the positions of extrema of a correlation function includes a memory (1), an address control unit (3) and a correlator (2). The elaborate computations for defining correlation functions can be reduced by the circuit arrangement described. The correlation function is an example. Two functions are present in digital form. Their sampling values are stored in the addressable memory (1). The address control unit (3) generates addresses by which the functions stored in the memory (1) are read in a sub-sampled manner. With these sub-sampled functions the extrema and their positions are defined in a first step by the correlator (2) and the address control unit (3). Proximate to an extremum thus defined the variation of the correlation functions is examined more precisely in this proximity in a smaller sub-sampling ratio and the extremum in this proximity is redefined. This process can be repeated with an increasingly smaller sub-sampling ratio.
Abstract:
A network for providing sensing, communications and control is described. A plurality of intelligent cells each of which comprises an integrated circuit having a processor and input/output section are coupled to the network. Each of the programmable cells receives when manufactured a unique identification number (48 bits) which remains permanently within the cell. The cells can be coupled to different media such as power lines, twisted, pair, radio frequency, infrared ultrasonic, optical coaxial, etc., to form a network. The preferred embodiment of the cell includes a multiprocessor and multiple I/O subsections where any of the processors can communicate with any of the I/O subsections. This permits the continual execution of a program without potential interruptions caused by interfacing with the I/O section. The I/O section includes programmable A-to-D and programmable D-to-A converters as well as other circuits for other modes of operation.
Abstract:
A single-chip microcomputer is comprised of an analog to digital converter, a first external terminal which receives an analog signal which is to be converted by the analog to digital converter, and a second external terminal for receiving a signal indicating an operating condition of the analog to digital converter.
Abstract:
A general architecture to correct conversion errors of a multi-stage, pipelined subranging analog-to-digital (A/D) converter includes cascaded stages, each stage generating a binary conversion signal representing the nearest quantized level below that of the analog input signal and a residual analog signal applied to the next conversion stage. The binary conversion signal from each stage addresses individual or common look-up tables providing a compensated binary signal selected to compensate for nonidealities of the A/D converter components. The compensated binary signals from the look-up tables provide a corrected output signal when summed together. A simple method of calibration for the A/D converter makes use of a least-mean-squared adaptation algorithm. The A/D converter accommodates practical circuit nonidealities such as component mismatching, gain error and voltage offsets, and handles high levels of amplifier nonlinearity. The architecture is applicable to any subranging converter with arbitrary numbers of stages and bits per stage.
Abstract:
A "reversible master/slave" handshaking protocol is disclosed for addressing the problem of interfacing a multiplexing analog-to-digital (A/D) converter, having a first operating rate, to a microprocessor, having a second operating rate. In the specific embodiment of a generator control unit (GCU) for an electrical power generating system, an analog multiplexer (124), an A/D converter (126), and a dual-port RAM (130) are controlled by an A/D controller (134) to provide data words to a voltage regulator processor (92). If a fast A/D converter is used, then the A/D controlling system will multiplex and convert samples from all of the analog input signals, load the RAM, and wait for the processor to read the RAM. If the A/D conversion rate is slow, the A/D controller will continuously sample all the multiplexed channels, while the processor waits for the appropriate channel information to be loaded into the RAM. In this manner, data acquisition can be perform utilizing A/D converters having various conversion rates, multiplexers having additional channels, or microprocessors having numerous feedback control loops.