公开(公告)号：US10329588B2

公开(公告)日：2019-06-25

申请号：US14901585

申请日：2014-06-27

申请人： Matthias Brunner

发明人： Matthias Brunner

IPC分类号： C12M1/00 ,  C12M1/06 ,  C12M1/12 ,  C12P5/02 ,  C12M1/107

摘要： The invention relates to means and methods for the biomethanation of H2 and CO2. In particular, the invention relates to devices for producing methane by means of methanogenic microorganisms by converting H2 and CO2, wherein the devices comprise at least one reactor, an aqueous medium, which is provided in the at least one reactor, wherein the methanogenic microorganisms are contained in the aqueous medium, a feeding apparatus, which is designed to introduce H2 and CO2 into the at least one reactor, wherein H2 and CO2 form a gaseous mixture therein, and a reaction-increasing device, which is designed to enlarge the contact surface between the aqueous medium having the methanogenic microorganisms and the gaseous mixture. The invention further relates to methods for producing methane in a reactor device by means of methanogenic microorganisms.

公开(公告)号：US07474108B2

公开(公告)日：2009-01-06

申请号：US11398052

申请日：2006-04-05

申请人： Matthias Brunner

发明人： Matthias Brunner

IPC分类号： G01R31/305 ,  G01R31/28

CPC分类号： G09G3/006 ,  G01R31/2887 ,  G01R31/302

摘要： The invention relates to methods for positioning of a substrate and contacting of the test object for testing with a test apparatus with an optical axis and corresponding devices. Thereby, the substrate is put on the holder. The substrate is positioned relative to the optical axis. A contact unit is also positioned relative to the optical axis, whereby the contact unit is positioned independent of the positioning activity of the substrate. Thereby, a flexible contacting of test objects on the substrate can be realized.

摘要翻译： 本发明涉及一种用于定位基板的方法和用于测试的测试对象与测试设备与光轴和相应设备的接触。 由此，将基板放在支架上。 基板相对于光轴定位。 接触单元也相对于光轴定位，由此接触单元被定位成与衬底的定位活动无关。 从而可以实现测试对象在基板上的柔性接触。

公开(公告)号：US07129694B2

公开(公告)日：2006-10-31

申请号：US10155796

申请日：2002-05-23

申请人： Matthias Brunner ,  Shinichi Kurita ,  Wendell T. Blonigan ,  Edgar Kehrberg

发明人： Matthias Brunner ,  Shinichi Kurita ,  Wendell T. Blonigan ,  Edgar Kehrberg

IPC分类号： G01R31/28

CPC分类号： H01L21/67748 ,  G01R31/01 ,  H01L21/67288 ,  H01L21/682

摘要： A system and method for testing substrates is generally provided. In one embodiment, a test system for testing a substrate includes a load lock chamber, a transfer chamber and a test station. The load lock chamber and the test station are disposed on top of one another and coupled to the transfer chamber. The transfer chamber includes a robot adapted to transfer a substrate between the load lock chamber, which is at a first elevation, and the test station, which is at a second elevation. In another embodiment, a test station is provided having a turntable adapted to rotate the substrate. The turntable enables the range of motion required to test the substrate to be substantially reduced while facilitating full test and/or inspection of the substrate.

公开(公告)号：US5414374A

公开(公告)日：1995-05-09

申请号：US123218

申请日：1993-09-20

申请人： Matthias Brunner ,  Reinhold Schmitt

发明人： Matthias Brunner ,  Reinhold Schmitt

IPC分类号： G01R31/02 ,  G01R31/302 ,  G01R31/305 ,  G01R31/308 ,  G02F1/136 ,  G02F1/1362 ,  G02F1/1368 ,  G09F9/35 ,  G09G3/18 ,  G01R31/00

CPC分类号： G01R31/305 ,  G01R31/302 ,  G01R31/308 ,  G02F2001/136254

摘要： Method for particle beam testing of substrates for liquid crystal displays (LCD). This is directed to methods wherein, given a substrate (SUB1) for a liquid crystal display, either potentials or, respectively, currents are set in defined fashion with a particle beam (S1, S2 and S4) and/or potentials are measured by detecting secondary electrons (S5) at different switch statuses of the switch elements (T) of the substrate (SUB1). The geometrical integrity and the electrical functionability of the substrate (SUB1) are thereby tested, even though, for example, a supplementary plane electrode is not present for forming a capacitor. An important advantage of the method is that faulty substrates can be repaired or can be segregated even before further-processing and, thus, costs can be reduced.

摘要翻译： 液晶显示器（LCD）基板的粒子束测试方法。 这涉及以下方法：其中，给定用于液晶显示器的衬底（SUB1），电势或电流分别以粒子束（S1，S2和S4）的形式设定，和/或电位通过检测 在基板（SUB1）的开关元件（T）的不同开关状态下的二次电子（S5）。 因此，即使例如辅助平面电极不存在用于形成电容器，也可以测试基板（SUB1）的几何完整性和电功能性。 该方法的一个重要优点是，即使在进一步处理之前，有缺陷的基板可以被修复或者可以被分离，因此可以降低成本。

公开(公告)号：US5190672A

公开(公告)日：1993-03-02

申请号：US703096

申请日：1991-05-22

申请人： Hubert Coenen ,  Helmut Hubert ,  Friedhelm Bultmann ,  Matthias Brunner

发明人： Hubert Coenen ,  Helmut Hubert ,  Friedhelm Bultmann ,  Matthias Brunner

IPC分类号： B09B3/00 ,  C02F9/00 ,  C02F11/00 ,  C02F11/06 ,  C02F11/12 ,  F23G5/00 ,  F23G7/00 ,  F23J15/00

CPC分类号： F23J15/006 ,  B09B3/005 ,  C02F11/004 ,  C02F9/00 ,  F23G5/006 ,  F23G7/001 ,  C02F11/12 ,  C02F2101/20 ,  C02F2103/18 ,  F23J2215/20 ,  F23J2215/301 ,  F23J2215/60 ,  F23J2217/102 ,  F23J2217/40 ,  F23J2219/40 ,  Y02W10/40

摘要： A method of thermal disposal of sewage sludge. The sludge is dried and incinerated. The flue gases from the incineration are washed. The flue gas dust resulting from the incineration and the sludge resulting from washing of the flue gases are treated together with high temperature combustion which includes melting of solids.

摘要翻译： 污水污泥热处理方法。 将污泥干燥并焚烧。 来自焚烧的烟道气被洗涤。 由焚烧产生的烟气和由烟气洗涤产生的污泥与包括固体熔化在内的高温燃烧一起处理。