公开(公告)号：US12209977B2

公开(公告)日：2025-01-28

申请号：US18439625

申请日：2024-02-12

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Janos Kirz

IPC: G01N23/20008 ,  G01N23/20091 ,  G01N23/207 ,  G01N23/2209 ,  G21K1/06

Abstract: An apparatus includes a plurality of stacked flat Bragg diffractors having at least a first flat Bragg diffractor and a second flat Bragg diffractor. The first and second flat Bragg diffractors are positioned sequentially along an x-ray propagation axis of an x-ray beam. The x-ray beam includes x-rays and has an angular beam divergence less than 30 mrad in at least one direction.

公开(公告)号：US12153001B2

公开(公告)日：2024-11-26

申请号：US18311558

申请日：2023-05-03

Applicant: Sigray, Inc.

Inventor： David Vine ,  Wenbing Yun ,  Janos Kirz ,  Sheraz Gul ,  Sylvia Jia Yun Lewis ,  Richard Ian Spink

IPC: G01N23/046 ,  G01N23/083

Abstract: A three-dimensional x-ray imaging system includes at least one detector and an x-ray source including an x-ray transmissive vacuum window. The x-ray source is configured to produce diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending through a region of interest of an object to the at least one detector. The diverging x-rays have propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis. The system further includes at least one sample motion stage configured to rotate the object about a rotation axis. The system further includes a sample mount configured to hold the object and comprises a first portion in the propagation paths of at least some of the diverging x-rays and having an x-ray transmission greater than 30% for x-rays having energies greater than 50% of a maximum x-ray energy of an x-ray spectrum of the diverging x-rays.

公开(公告)号：US11992350B2

公开(公告)日：2024-05-28

申请号：US18176760

申请日：2023-03-01

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  David John Vine ,  Sylvia Jia Yun Lewis ,  Sheraz Gul ,  Janos Kirz

IPC: A61B6/42

CPC classification number: A61B6/4266 ,  A61B6/4241

Abstract: An x-ray computed laminography imaging system includes a transmission x-ray source configured to generate x-rays, at least some of the x-rays propagate along an x-ray propagation axis through a region of interest of an object. The system further includes a stage assembly configured to rotate the object about a rotation axis extending through the region of interest. The system further includes at least one x-ray detector configured to intercept at least some of the x-rays propagating along the x-ray propagation axis. The at least one x-ray detector includes a scintillator, at least one optical lens, and two-dimensional pixelated imaging circuitry. The scintillator has a thickness that is substantially parallel to the x-ray propagation axis and the at least one optical lens is configured to receive visible light from the scintillator and to focus the visible light into a two-dimensional image. The at least one optical lens has a depth of focus, and the thickness of the scintillator is in a range of 1 to 20 times the depth of focus.

公开(公告)号：US11885755B2

公开(公告)日：2024-01-30

申请号：US18309021

申请日：2023-04-28

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Ruimin Qiao ,  Sylvia Jia Yun Lewis ,  Srivatsan Seshadri ,  Janos Kirz ,  Benjamin Donald Stripe

IPC: G01N23/207 ,  G01N23/20008 ,  G01N23/085 ,  G01N23/2209

CPC classification number: G01N23/2076 ,  G01N23/085 ,  G01N23/20008 ,  G01N23/2209 ,  G01N2223/041 ,  G01N2223/0568 ,  G01N2223/076 ,  G01N2223/1016 ,  G01N2223/316 ,  G01N2223/32 ,  G01N2223/50 ,  G01N2223/652

Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

公开(公告)号：US11428651B2

公开(公告)日：2022-08-30

申请号：US17533568

申请日：2021-11-23

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Srivatsan Seshadri ,  Ruimin Qiao ,  Janos Kirz ,  Sylvia Jia Yun Lewis

IPC: G01N23/223 ,  G01N23/085

Abstract: A fluorescence mode x-ray absorption spectroscopy apparatus includes an electron bombardment source of x-rays, a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R), a detector, and at least one stage configured to position a sample such that at least a portion of the sample is between the crystal analyzer and the detector.

公开(公告)号：US11217357B2

公开(公告)日：2022-01-04

申请号：US17169159

申请日：2021-02-05

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

IPC: G21K1/06 ,  G01N23/20008 ,  G01N23/083 ,  G01N23/205

Abstract: An x-ray mirror optic includes a plurality of surface segments with quadric cross-sections having differing quadric parameters. The quadric cross-sections of the surface segments share a common axis and are configured to reflect x-rays in a plurality of reflections along a single optical axis or in a scattering plane defined as containing an incident x-ray and a corresponding reflected x-ray.

公开(公告)号：US11215572B2

公开(公告)日：2022-01-04

申请号：US17320852

申请日：2021-05-14

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Srivatsan Seshadri ,  Ruimin Qiao ,  Janos Kirz ,  Sylvia Jia Yun Lewis

IPC: G01N23/223 ,  G01N23/085

Abstract: An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle. The crystal analyzer includes crystal planes curved along at least one direction and configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector that includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy. The plurality of x-ray detection elements are configured to measure received dispersed x-rays having x-ray energies below the first x-ray energy while suppressing measurements above the first x-ray energy and/or to measure the received dispersed x-rays having x-ray energies above the second x-ray energy while suppressing measurements below the second x-ray energy.

公开(公告)号：US11175243B1

公开(公告)日：2021-11-16

申请号：US17167870

申请日：2021-02-04

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

IPC: G01N23/20 ,  G01N23/083 ,  G01N23/04 ,  G01N23/18

Abstract: An x-ray imaging/inspection system includes an x-ray source having a plurality of sub-sources in thermal communication with a substrate. The system further includes a first grating positioned to receive at least some of the x-rays from the x-ray source, a stage configured to hold a sample positioned to receive at least some of the x-rays from the x-ray source, at least one x-ray detector, and a second grating having periodic structures. The x-ray source, the first grating, and the second grating are configured such that a ratio of a pitch p0 of the plurality of sub-sources to a pitch p2 of the periodic structures of the second grating is substantially equal to a ratio of a distance dS-G1 between the plurality of sub-sources and the first grating and a distance dG1-G2 between the first grating and the second grating: (p0/p2)=(dS-G1/dG1-G2).

公开(公告)号：US20210247334A1

公开(公告)日：2021-08-12

申请号：US17169159

申请日：2021-02-05

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

IPC: G01N23/20008 ,  G01N23/205 ,  G01N23/083

Abstract: An x-ray mirror optic includes a plurality of surface segments with quadric cross-sections having differing quadric parameters. The quadric cross-sections of the surface segments share a common axis and are configured to reflect x-rays in a plurality of reflections along a single optical axis or in a scattering plane defined as containing an incident x-ray and a corresponding reflected x-ray.

公开(公告)号：USRE48612E1

公开(公告)日：2021-06-29

申请号：US16523940

申请日：2019-07-26

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

IPC: G01N23/02 ,  G01N23/20 ,  G21K1/02 ,  A61B6/00 ,  H01J35/08

Abstract: An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, a means to translate the second grating G2 relative to the detector. The system may additionally comprise an antiscattering grid to reduce signals from scattered x-rays. Various configurations of dark-field and bright-field detectors are also disclosed.