Resist composition for electron beam or EUV (extreme ultraviolet) and method for forming resist pattern
    61.
    发明授权
    Resist composition for electron beam or EUV (extreme ultraviolet) and method for forming resist pattern 有权
    用于电子束或EUV(极紫外)的抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US07736842B2

    公开(公告)日:2010-06-15

    申请号:US11573884

    申请日:2005-09-01

    摘要: A resist composition for electron beam or extreme ultraviolet (EUV), comprising a resin component (A) which exhibits changed alkali solubility under action of acid, and a photoacid generator component (B) that generates acid on exposure, wherein the component (B) comprises at least one onium salt selected from the group consisting of onium salts having an anion represented by formula (b-0-1) or (b-0-2) shown below: wherein X represents an alkylene group having 2 to 6 carbon atoms, in which at least one hydrogen atom is substituted with a fluorine atom; and each of Y and Z independently represents an alkyl group having 1 to 10 atoms, in which at least one hydrogen atom is substituted with a fluorine atom.

    摘要翻译: 一种电子束或极紫外线抗蚀剂组合物(EUV),其包含在酸作用下表现出碱溶性变化的树脂组分(A)和曝光时产生酸的光致酸产生剂组分(B),其中组分(B) 包含至少一种选自由下式(b-0-1)或(b-0-2)表示的阴离子的鎓盐组成的组中的鎓盐:其中X表示碳原子数2〜6的亚烷基 其中至少一个氢原子被氟原子取代; Y和Z各自独立地表示具有1〜10个原子的烷基,其中至少一个氢原子被氟原子取代。

    RESIST COMPOSITION FOR LIQUID IMMERSION LITHOGRAPHY, METHOD OF FORMING RESIST PATTERN, AND FLUORINE-CONTAINING COPOLYMER
    62.
    发明申请
    RESIST COMPOSITION FOR LIQUID IMMERSION LITHOGRAPHY, METHOD OF FORMING RESIST PATTERN, AND FLUORINE-CONTAINING COPOLYMER 审中-公开
    用于液体渗透光刻的耐蚀组合物,形成耐蚀图案的方法和含氟聚合物

    公开(公告)号:US20090186300A1

    公开(公告)日:2009-07-23

    申请号:US12348780

    申请日:2009-01-05

    IPC分类号: G03C1/053 G03F7/26 C08F220/22

    摘要: A resist composition for immersion exposure including a base component (A) that exhibits changed solubility in an alkali developing solution under the action of acid, an acid generator component (B) that generates acid upon exposure, and a fluorine-containing copolymer (C) containing a structural unit (c1) represented by general formula (c1-1) shown below. In the formula, R1 represents a hydrogen atom, a lower alkyl group or a halogenated lower alkyl group, Q1 represents a single bond or a divalent linking group, A represents an aromatic cyclic group that may have a substituent, Q2 represents a group in which one hydrogen atom has been removed from a monovalent hydrophilic group, R2 represents a base dissociable group, and a represents 1 or 2, provided that at least one among A and the a R2 groups contains a fluorine atom.

    摘要翻译: 一种用于浸渍曝光的抗蚀剂组合物,包括在酸性作用下在碱性显影液中显示出改变的溶解性的基础组分(A),暴露时产生酸的酸产生剂组分(B)和含氟共聚物(C) 含有下述通式(c1-1)表示的结构单元(c1)。 在该式中,R1表示氢原子,低级烷基或卤代低级烷基,Q1表示单键或二价连接基团,A表示可具有取代基的芳香族环状基团,Q2表示其中 一个氢原子从单价亲水基团除去,R2表示碱可解离基团,a表示1或2,条件是A和A 2中的至少一个含有氟原子。

    Resist Composition for Electron Beam or Euv (Extreme Ultraviolet) and Method for Forming Resist Pattern
    63.
    发明申请
    Resist Composition for Electron Beam or Euv (Extreme Ultraviolet) and Method for Forming Resist Pattern 有权
    电子束或Euv(极紫外)的抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US20070269744A1

    公开(公告)日:2007-11-22

    申请号:US11573884

    申请日:2005-09-01

    IPC分类号: G03C1/00

    摘要: A resist composition for electron beam or extreme ultraviolet (EUV), comprising a resin component (A) which exhibits changed alkali solubility under action of acid, and a photoacid generator component (B) that generates acid on exposure, wherein the component (B) comprises at least one onium salt selected from the group consisting of onium salts having an anion represented by formula (b-0-1) or (b-0-2) shown below: wherein X represents an alkylene group having 2 to 6 carbon atoms, in which at least one hydrogen atom is substituted with a fluorine atom; and each of Y and Z independently represents an alkyl group having 1 to 10 atoms, in which at least one hydrogen atom is substituted with a fluorine atom.

    摘要翻译: 一种电子束或极紫外线抗蚀剂组合物(EUV),其包含在酸作用下表现出碱溶性变化的树脂组分(A)和曝光时产生酸的光致酸产生剂组分(B),其中组分(B) 包含至少一种选自由下式(b-0-1)或(b-0-2)表示的阴离子的鎓盐组成的组中的鎓盐:其中X表示碳原子数2〜6的亚烷基 其中至少一个氢原子被氟原子取代; Y和Z各自独立地表示具有1〜10个原子的烷基,其中至少一个氢原子被氟原子取代。

    Positive resist composition and method of forming resist pattern
    64.
    发明授权
    Positive resist composition and method of forming resist pattern 有权
    正型抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US08980524B2

    公开(公告)日:2015-03-17

    申请号:US12979067

    申请日:2010-12-27

    摘要: A positive resist composition including a base component (A) which exhibits increased solubility in an alkali developing solution under action of acid, an acid-generator component (B) which generates acid upon exposure and a fluorine-containing polymeric compound (C′) which generates acid upon exposure, the base component (A) having a structural unit (a0-1) represented by general formula (a0-1) and a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group, and the fluorine-containing polymeric compound (C′) having a structural unit (c0) which generates acid upon exposure and a structural unit (c1) represented by formula (c1) (wherein R2 represents a divalent linking group, R3 represents a cyclic group containing —SO2— within the ring skeleton, Q0 represents a single bond or a divalent linking group, and R0 represents an organic group which may have a fluorine atom).

    摘要翻译: 一种正性抗蚀剂组合物,包括在酸作用下在碱性显影液中显示出增加的溶解性的基础组分(A),暴露时产生酸的酸产生剂组分(B)和含氟聚合化合物(C') 在曝光时产生酸,具有由通式(a0-1)表示的结构单元(a0-1)的基础组分(A)和由含有酸解离的溶解抑制基团的丙烯酸酯衍生的结构单元(a1) 和具有曝光时产生酸的结构单元(c0)的含氟聚合化合物(C')和由式(c1)表示的结构单元(c1)(其中R 2表示二价连接基团,R 3表示环状基团 在环骨架中含有-SO 2 - ,Q 0表示单键或二价连接基团,R 0表示可以具有氟原子的有机基团)。

    Resist composition, method of forming resist pattern and polymeric compound
    65.
    发明授权
    Resist composition, method of forming resist pattern and polymeric compound 有权
    抗蚀剂组合物,抗蚀剂图案和高分子化合物的形成方法

    公开(公告)号:US08927191B2

    公开(公告)日:2015-01-06

    申请号:US13351716

    申请日:2012-01-17

    IPC分类号: G03F7/039 C08F226/06

    摘要: A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, wherein the base component (A) includes a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In the formula (a5-1), R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; each of Ra and Rb independently represents a hydrocarbon group which may have a substituent, and Ra and Rb may be mutually bonded to form a ring.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸作用下在显影液中溶解性变差的碱成分(A)和曝光时产生酸的酸发生剂成分(B),其中,所述碱成分(A)含有高分子化合物 )具有由通式(a5-1)表示的结构单元(a5)。 在式(a5-1)中,R表示氢原子,1〜5个碳原子的烷基或1〜5个碳原子的卤代烷基; Ra和Rb各自独立地表示可以具有取代基的烃基,Ra和Rb可以相互键合形成环。

    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND
    68.
    发明申请
    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND 有权
    耐蚀组合物,形成耐蚀图案和聚合物的方法

    公开(公告)号:US20120208128A1

    公开(公告)日:2012-08-16

    申请号:US13371151

    申请日:2012-02-10

    摘要: A resist composition including a base component (A) which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, the base component (A) including a resin component (A1) containing a structural unit (a0-1) having a group represented by general formula (a0-1) shown below and a structural unit (a1) derived from an acrylate ester which may have the hydrogen atom bonded to the carbon atom on the α-position substituted with a substituent and contains an acid decomposable group which exhibits increased polarity by the action of acid.

    摘要翻译: 一种抗蚀剂组合物,其包含在暴露后产生酸的基体组分(A),并且在酸的作用下在显影液中显示出改变的溶解性,所述基础组分(A)包含含有结构单元(a0-1)的树脂组分(A1) 具有由下述通式(a0-1)表示的基团和由可以具有与被取代基取代的具有氢原子键合的含有氢原子并含有酸的丙烯酸酯的结构单元(a1) 通过酸的作用显示出极性增加的可分解基团。

    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND
    69.
    发明申请
    RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND 有权
    耐蚀组合物,形成耐蚀图案和聚合物的方法

    公开(公告)号:US20120183900A1

    公开(公告)日:2012-07-19

    申请号:US13351716

    申请日:2012-01-17

    IPC分类号: G03F7/20 C08F226/06 G03F7/004

    摘要: A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, wherein the base component (A) includes a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In the formula (a5-1), R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; each of Ra and Rb independently represents a hydrocarbon group which may have a substituent, and Ra and Rb may be mutually bonded to form a ring.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸作用下在显影液中溶解性变差的碱成分(A)和曝光时产生酸的酸发生剂成分(B),其中,所述碱成分(A)含有高分子化合物 )具有由通式(a5-1)表示的结构单元(a5)。 在式(a5-1)中,R表示氢原子,1〜5个碳原子的烷基或1〜5个碳原子的卤代烷基; Ra和Rb各自独立地表示可以具有取代基的烃基,Ra和Rb可以相互键合形成环。

    Resist composition, and method of forming resist pattern
    70.
    发明申请
    Resist composition, and method of forming resist pattern 有权
    抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US20120148953A1

    公开(公告)日:2012-06-14

    申请号:US13373965

    申请日:2011-12-05

    IPC分类号: G03F7/20 G03F7/004

    摘要: A resist composition including a base component (A) which exhibits changed solubility in a developing solution under the action of acid, and an acid generator component (B) which generates acid upon exposure, wherein the base component (A) contains a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In formula (a5-1), R represents a hydrogen atom, an alkyl group or a halogenated alkyl group, X represents single bond or divalent linking group, W represents a cyclic alkylene group which may include an oxygen atom at arbitrary position, each of Ra and Rb independently represents a hydrogen atom or an alkyl group which may include an oxygen atom at arbitrary position, or alternatively, Ra and Rb may be bonded to each other to form a ring together with the nitrogen atom in the formula, and p represents integer of 1 to 3.

    摘要翻译: 一种抗蚀剂组合物,其包含在酸的作用下在显影溶液中显示出改变的溶解性的碱成分(A)和曝光时产生酸的酸产生剂成分(B),其中,所述碱成分(A)含有高分子化合物 A1)具有由通式(a5-1)表示的结构单元(a5)。 式(a5-1)中,R表示氢原子,烷基或卤代烷基,X表示单键或二价连接基,W表示可以在任意位置含有氧原子的环状亚烷基, Ra和Rb独立地表示氢原子或可以在任意位置包含氧原子的烷基,或者Ra和Rb可以与式中的氮原子一起形成环,p表示 1〜3的整数。