摘要:
A semiconductor device includes a thermal oxide film for isolation, a semiconductor region that becomes an element forming region with the circumference thereof surrounded by the oxide film and diffused resistance layers in the semiconductor region and provides a structure for controlling resistance value variation of diffused resistors originated in a stress generated at time of forming the oxide film for isolation. A distance between an end portion on a longer side closest to a thermal oxide film of the diffused layer and an end of the thermal oxide film is apart from each other by a predetermined value determined by stress distribution in the semiconductor region or by at least 4 .mu.m or more, the longitudinal direction of the diffused layer portion formed from the end of the thermal oxide film over to a stress distribution (gradient) forming region in the semiconductor region is parallel to the forming direction of the stress gradient, and resistance value distribution is formed parallel to the stress gradient in the diffused layer formed from the end of the thermal oxide film over to the stress distribution forming region in the semiconductor region.
摘要:
An optical waveguide device for coupling an external wave with a guided wave by means of a grating coupler formed on an optical waveguide device which lies on a substrate. The grating coupler is further coated with a cladding layer. An external wave is transformed into a guided wave after being diffracted by a first grating coupler, and travels along the waveguide to a second grating coupler. The guided wave is then subjected to diffraction by means of the second grating coupler, whereupon a minus first-order wave is diffracted only toward the substrate, whilst other waves of higher order are respectively diffracted toward the cladding layer and the substrate. The wave diffracted toward the cladding layer is totally reflected from a cladding layer boundary furtherst from the substrate, thereby passing through the substrate. The diffracted wave thus reflected interferes with the other wave of the same order diffracted to the substrate, thereby weakening each other.
摘要:
A mode plate (5) which moves between a plurality of operational positions controls the respective positions of a head plate (2) and a link (8). The link (8) is turned to a forward and a reverse position to selectively operate pinch roller casings (12F, 12R) through a change link (4). This causes pinch rollers (13F, 13R) to be pressed against capstans (15F, 15R), respectively to thereby provide a forward or reverse play mode tape travel. By the turning of the link (8), an FF/REW plate (27) is moved to a forward and a reverse side through a detect link (9) and a spring (9a) such that FF/REW gears (25F, 25R) supported at the ends of an FF/REW plate (27) engage selectively with reel bases (11F, 11R) to thereby perform tape travel in an FF mode or a REW mode. A head plate (2) controls the positions of pinch roller casings (12F, 12R) and the FF/REW plate (27). At a stop mode position, the head plate (2) holds the pinch roller casings (12F, 12R) and FF/REW plate (27) at the release positions while holding the FF/REW plate (27) at the release position at a play mode position. The head plate (29) causes idler plates (26F, 26R) which support idler gears (24F, 24R) to engage pinch roller casings (12F, 12R) to operate the idler plates (26F, 26R) depending on the operation of the pinch roller casings (12F, 12R) and engages the idler gears (24F, 24R) selectively with reel bases (11F, 11R), respectively.
摘要:
Provided, is a reliable semiconductor device with a layered interconnect structure that may develop no trouble of voids and interconnect breakdowns, in which the layered interconnect structure comprises a conductor film and a neighboring film as so layered on a semiconductor substrate that the neighboring film is contacted with the conductor film. In the device, the materials for the conductor film and the neighboring film are so selected that the difference between the short side, ap, of the rectangular unit cells that constitute the plane with minimum free energy of the conductor film and the short side, an, of the rectangular unit cells that constitute the plane with minimum free energy of the neighboring film, {lap−anl/ap}×100=A (%) and the difference between the long side, bp, of the rectangular unit cells that constitute the plane with minimum free energy of the conductor film and the long side, bn, of the rectangular unit cells that constitute the plane with minimum free energy of the neighboring film, {lbp−bnl/bp}×100=B (%) satisfy an inequality of {A+B×(ap/bp)}
摘要:
[Problems] A laser beam irradiation apparatus which can accurately perform a linear welding with a uniform width on an irradiation portion even if the overlap ratio is lowered is provided.[Means for Solving the Problems] A laser beam irradiation apparatus includes laser beam generation means for emitting a laser beam, an optical fiber for transmitting the laser beam incident on an input side face to an output side face, an incident optical unit for introducing the laser beam emitted from the laser beam generation means to the input side face of the optical fiber, and an emission optical unit for applying the laser beam emitted from the output side face of the optical fiber to an irradiation portion, wherein the core cross section of the optical fiber is formed to be rectangular, preferably oblong, throughout the optical fiber or in a range at a predetermined distance from the output side face, and the length of the range where the core cross section is rectangular is preferably set to 3 m or above.
摘要:
Diffusion layers 2-5 are formed on a silicon substrate 1, and gate dielectric films 6, 7 and gate lectrodes 8, 9 are formed on these diffusion layers 2-5 so as to be MOS transistors. Zirconium oxide or hafnium oxide is used as a major component of gate dielectric films 6, 7. Gate dielectric films 6, 7 are formed, for example, by CVD. As substrate 1, there is used one of which the surface is (111) crystal face so as to prevent diffusion of oxygen into silicon substrate 1 or gate electrodes 8, 9. In case of using a substrate of which the surface is (111) crystal face, diffusion coefficient of oxygen is less than 1/100 of the case in which a silicon substrate of which the surface is (001) crystal face is used, and oxygen diffusion is controlled. Thus, oxygen diffusion is controlled, generation of leakage current is prevented and properties are improved. There is realized a semiconductor device having high reliability and capable of preventing deterioration of characteristics concomitant to miniaturization.
摘要:
Light that is incident through a pair of object lenses of digital binocular glasses is photographed by a pair of image pickup devices to obtain a pair of images (stereoscopic image) generating a difference corresponding to a parallax of both eyes. A geometric difference between image structures corresponding to a parallax of both eyes is recognized in the pair of images subjected to various corrections and stored in memories. Thereafter, a noise reduction process is performed, which reduces a difference (for example, a difference between random noises superposed on the pair of images by the image pickup devices) other than the recognized geometric difference between the image structures. The images subjected to the noise reduction process are displayed on a pair of display devices, and are visually recognized (stereoscopically viewed) by the user through eyepiece lenses.
摘要:
A laser module includes: one or more semiconductor laser elements which emit one or more laser beams; an optical fiber which has a light-entrance end face; and an optical condensing system which is constituted by one or more optical components and makes the one or more laser beams converge at the light-entrance end face of the optical fiber. In the laser module, at least one of one or more light-entrance surfaces and one or more light-output surfaces of the one or more optical components is exposed to air, and the one or more laser beams realize an optical power density of 15 W/mm2 or lower, or 60 to 800 W/mm2 at the at least one of the one or more light-entrance surfaces and the one or more light-output surfaces.
摘要翻译:激光模块包括:发射一个或多个激光束的一个或多个半导体激光元件; 具有光入射端面的光纤; 以及由一个或多个光学部件构成并使一个或多个激光束会聚在光纤的光入射端面的光聚光系统。 在激光模块中,一个或多个光学部件的一个或多个光入射表面和一个或多个光输出表面中的至少一个暴露于空气中,并且一个或多个激光束实现15的光功率密度 一个或多个光入射表面中的至少一个上的W / mm 2或更低,或60至800W / mm 2, 输出面。
摘要:
Diffusion layers 2-5 are formed on a silicon substrate 1, and gate dielectric films 6, 7 and gate electrodes 8, 9 are formed on these diffusion layers 2-5 so as to be MOS transistors. Zirconium oxide or hafnium oxide is used as a major component of gate dielectric films 6, 7. Gate dielectric films 6, 7 are formed, for example, by CVD. As substrate 1, there is used one of which the surface is (111) crystal face so as to prevent diffusion of oxygen into silicon substrate 1 or gate electrodes 8, 9. In case of using a substrate of which the surface is (111) crystal face, diffusion coefficient of oxygen is less than 1/100 of the case in which a silicon substrate of which the surface is (001) crystal face is used, and oxygen diffusion is controlled. Thus, oxygen diffusion is controlled, generation of leakage current is prevented and properties are improved. There is realized a semiconductor device having high reliability and capable of preventing deterioration of characteristics concomitant to miniaturization.
摘要:
Provided, is a reliable semiconductor device with a layered interconnect structure that may develop no trouble of voids and interconnect breakdowns, in which the layered interconnect structure comprises a conductor film and a neighboring film as so layered on a semiconductor substrate that the neighboring film is contacted with the conductor film. In the device, the materials for the conductor film and the neighboring film are so selected that the difference between the short side, ap, of the rectangular unit cells that constitute the plane with minimum free energy of the conductor film and the short side, an, of the rectangular unit cells that constitute the plane with minimum free energy of the neighboring film, {|ap−an|/ap}×100=A (%) and the difference between the long side, bp, of the rectangular unit cells that constitute the plane with minimum free energy of the conductor film and the long side, bn, of the rectangular unit cells that constitute the plane with minimum free energy of the neighboring film, {|bp−bn|/bp}×100=B (%) satisfy an inequality of {A+B×(ap/bp)}
摘要翻译:提供的是具有分层互连结构的可靠的半导体器件,其可以不产生空隙和互连故障的问题,其中分层互连结构包括导体膜和相邻的膜,如此分层在半导体衬底上,邻近膜被接触 与导体膜。 在该器件中,用于导体膜和相邻膜的材料被选择成使构成具有最小自由能的平面的矩形单元电池的短边,即< 导体薄膜和构成具有相邻薄膜的最小自由能的平面的矩形单元电池的短边,即 n SUB> 构成该矩阵单元的长边,b SUB> p SUB>之间的差,x100 = A(%) 构成具有相邻膜的最小自由能的平面的矩形单位电池的导体膜和长边的最小自由能的平面{| b&lt; p&lt; x100 = B(%)满足不等式{A + Bx(a sub> p sub> b&lt; p&lt; p&gt;)} <13。 在此,导体膜的扩散被延迟。