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公开(公告)号：US20230417800A1
公开(公告)日：2023-12-28
申请号：US18454035
申请日：2023-08-22
Applicant: Tektronix, Inc.
Inventor： Josiah A. Bartlett , Daniel G. Knierim , David L. Knierim
CPC classification number: G01R15/181 , G01R15/146
Abstract: A current sensor configured to measure current in a current-carrying conductor. The current sensor includes a shunt configured to be placed in series with the current-carrying conductor, and a Rogowski coil including at least one conductor segment. The shunt and the Rogowski coil are coupled to produce an output signal representing the current in the current-carrying conductor.
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公开(公告)号：US11650225B2
公开(公告)日：2023-05-16
申请号：US17539160
申请日：2021-11-30
Applicant: Tektronix, Inc.
Inventor： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
CPC classification number: G01R1/025 , G01R13/0218
Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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公开(公告)号：US11552620B2
公开(公告)日：2023-01-10
申请号：US16894778
申请日：2020-06-06
Applicant: Tektronix, Inc.
Inventor： Patrick A. Smith , Daniel G. Knierim
Abstract: Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.
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公开(公告)号：US20220317225A1
公开(公告)日：2022-10-06
申请号：US17220857
申请日：2021-04-01
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim
Abstract: A test and measurement instrument for measuring a current in a device under test, comprising an input configured to receive signals from a magnetic field probe; and one or more processors configured to measure, from a signal from the magnetic field probe, a magnetic field generated by a current-carrying conductor of the device under test based on a known current, determine a calibration factor based on the known current and the magnetic field, and generate a calibrated measurement of an unknown current in the current-carrying conductor using a magnetic field generated by the current-carrying conductor based on the unknown current and the calibration factor.
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公开(公告)号：US20220196701A1
公开(公告)日：2022-06-23
申请号：US17539160
申请日：2021-11-30
Applicant: Tektronix, Inc.
Inventor： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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Patent Agency Ranking
公开(公告)号：US11187720B2
公开(公告)日：2021-11-30
申请号：US16622847
申请日：2018-06-18
Applicant: Tektronix, Inc.
Inventor： Tyler B. Niles , Daniel G. Knierim , Michael J. Wadzita , Joshua J. O'Brien , David Everett Burgess
Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
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公开(公告)号：US11146280B2
公开(公告)日：2021-10-12
申请号：US16554548
申请日：2019-08-28
Applicant: Tektronix, Inc.
Inventor： Gregory A. Martin , Patrick Satarzadeh , John J. Pickerd , Daniel G. Knierim
Abstract: A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.
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公开(公告)号：US20210263076A1
公开(公告)日：2021-08-26
申请号：US17317841
申请日：2021-05-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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公开(公告)号：US10996178B2
公开(公告)日：2021-05-04
申请号：US15693371
申请日：2017-08-31
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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公开(公告)号：US10365300B2
公开(公告)日：2019-07-30
申请号：US15395593
申请日：2016-12-30
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , David L. Kelly , Patrick A. Smith
Abstract: This disclosure relates generally to test and measurement instruments structured to detect that a series of events occurred, and structured to generate a trigger signal in response to detecting that a final event in the series of events occurred. The trigger may be generated based on a timeout signal, or based on another event, trigger, or signal. Stored data in the acquisition memory may be marked relative to the detection of the final event. An external forced timeout signal may control which in a series of events is marked as a final event. The triggering on final event may be enabled after another trigger is satisfied, and may be used as one of many different types of triggers.
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