Information recording and reproducing apparatus having an improved high frequency characteristic for a reproduction signal
    81.
    发明授权
    Information recording and reproducing apparatus having an improved high frequency characteristic for a reproduction signal 失效
    信息记录和再现装置具有用于再现信号的改进的高频特性

    公开(公告)号:US06181501B2

    公开(公告)日:2001-01-30

    申请号:US08992558

    申请日:1997-12-17

    申请人: Yuichiro Yamazaki

    发明人: Yuichiro Yamazaki

    IPC分类号: G11B502

    CPC分类号: G11B20/02 G11B5/012 G11B5/09

    摘要: A magnetic recording and reproducing apparatus having a reproducing circuit structure which improves a high frequency characteristic of a reproduction signal output from a read head. The read head reads information recorded on a recording medium. A first amplifying circuit amplifies a reproduction signal generated by the read head. A second amplifying circuit, which comprises a high-frequency amplifying circuit, amplifies the reproduction signal amplified by the first amplifying circuit in a high-frequency amplifying manner. The first amplifying circuit and the second amplifying circuit together constitute a cascode amplifier. A third amplifying circuit amplifies the reproduction signal amplified by the second amplifying circuit. A reproducing circuit reproduces the reproduction signal amplified by the third amplifying circuit.

    摘要翻译: 一种磁记录和再现装置,具有改善从读头输出的再现信号的高频特性的再现电路结构。 读取头读取记录在记录介质上的信息。 第一放大电路放大由读取头产生的再现信号。 包括高频放大电路的第二放大电路以高频放大方式放大由第一放大电路放大的再现信号。 第一放大电路和第二放大电路一起构成共源共栅放大器。 第三放大电路放大由第二放大电路放大的再现信号。 再现电路再现由第三放大电路放大的再现信号。

    Wafer pattern defect detection method and apparatus therefor
    82.
    发明授权
    Wafer pattern defect detection method and apparatus therefor 失效
    晶圆图案缺陷检测方法及其装置

    公开(公告)号:US5576833A

    公开(公告)日:1996-11-19

    申请号:US402486

    申请日:1995-03-10

    CPC分类号: G01N23/2251 H01J2237/2446

    摘要: A scanning electron beam is formed as a rectangular electron beam. The electro-optical system which forms this rectangular beam has a rectangular-cathode light source and a quadrupole lens system. This rectangular beam is scanned in its short-axis (X-axis) direction by a deflection system while a stage is moved in its long-axis (Y-axis) direction to achieve scanning of the surface of the wafer under inspection. The rectangular beam corresponds to a number of circular beams arranged in a row. Therefore, pixel signals corresponding to a number of pixels equal to the aspect ratio of the rectangular beam (ratio of the length in the long-axis direction to the length in the short-axis direction) are simultaneously output.

    摘要翻译: 扫描电子束形成为矩形电子束。 形成该矩形光束的电光系统具有矩形阴极光源和四极透镜系统。 这个矩形光束是通过偏转系统在其短轴(X轴)方向扫描的,同时一个台沿其长轴(Y轴)方向移动,以实现在检查晶片的表面的扫描。 矩形梁对应于排列成一排的多个圆形梁。 因此,同时输出与矩形光束的长宽比(长轴方向的长度与短轴方向的长度的比)相等的像素数的像素信号。

    Electrostatic lens
    83.
    发明授权
    Electrostatic lens 失效
    静电镜片

    公开(公告)号:US5293045A

    公开(公告)日:1994-03-08

    申请号:US988701

    申请日:1992-12-10

    IPC分类号: H01J37/02 H01J37/12

    CPC分类号: H01J37/12 H01J37/026

    摘要: An electrostatic lens having at least three electrodes and an insulating holder for holding the electrodes, the inner wall of the holder being coated with a silicone carbide film. The silicone carbide film may be formed by means of a vapor deposition method. The energy of an electron beam is set to 1.5 keV or lower. The silicone carbide film may be added with an additive for controlling the electric conductivity of the silicone carbide film. The additive may be nitrogen.

    摘要翻译: 具有至少三个电极的静电透镜和用于保持电极的绝缘保持器,保持器的内壁涂覆有碳化硅膜。 可以通过气相沉积法形成碳化硅膜。 电子束的能量设定为1.5keV以下。 可以向该碳化硅膜添加用于控制碳化硅膜的导电性的添加剂。 添加剂可以是氮气。

    Pattern inspection apparatus and pattern inspection method
    84.
    发明授权
    Pattern inspection apparatus and pattern inspection method 有权
    图案检验装置和图案检验方法

    公开(公告)号:US08649591B2

    公开(公告)日:2014-02-11

    申请号:US13308719

    申请日:2011-12-01

    IPC分类号: G06K9/36

    CPC分类号: G01N21/95607 G01N21/9501

    摘要: In accordance with an embodiment, a pattern inspection method includes: applying a light generated from a light source to the same region of a substrate in which an inspection target pattern is formed; guiding, imaging and then detecting a reflected light from the substrate, and acquiring a detection signal for each of a plurality of different wavelengths; and adding the detection signals of the different wavelengths in association with an incident position of an imaging surface to generate added image data including information on a wavelength and signal intensity, judging, by the added image data, whether the inspection target pattern has any defect, and when judging that the inspection target pattern has a defect, detecting the position of the defect in a direction perpendicular to the substrate.

    摘要翻译: 根据实施例,图案检查方法包括:将从光源产生的光施加到形成有检查对象图案的基板的相同区域; 引导,成像,然后检测来自基板的反射光,并获取多个不同波长中的每一个的检测信号; 并且与成像面的入射位置相关联地添加不同波长的检测信号,以生成包括关于波长和信号强度的信息的附加图像数据,通过添加的图像数据判断检查对象图案是否具有任何缺陷, 并且当判断为检查对象图案有缺陷时,检测出与基板垂直的方向上的缺陷的位置。

    PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
    85.
    发明申请
    PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD 审中-公开
    图案检查装置和图案检查方法

    公开(公告)号:US20120242995A1

    公开(公告)日:2012-09-27

    申请号:US13423877

    申请日:2012-03-19

    IPC分类号: G01B9/02

    摘要: In accordance with an embodiment, a pattern inspection apparatus includes a beam splitter, a polarization controller, a phase controller, a wave front distribution controller, and a detector. The beam splitter generates signal light and reference light from light emitted from a light source. The signal light is reflected light from a pattern on a subject to be inspected. The polarization controller is configured to control the polarization angle and polarization phase of the reference light. The phase controller is configured to control the phase of the reference light. The wave front distribution controller is configured to control a wave front distribution of the reference light. The detector is configured to detect light resulting from interference caused by superposing the signal light and the reference light on each other.

    摘要翻译: 根据实施例,图案检查装置包括分束器,偏振控制器,相位控制器,波前分布控制器和检测器。 分束器产生来自光源发出的光的信号光和参考光。 信号光是要检查的被检体上的图案的反射光。 偏振控制器被配置为控制参考光的偏振角和偏振相位。 相位控制器被配置为控制参考光的相位。 波前分配控制器被配置为控制参考光的波前分布。 检测器被配置为检测由信号光和参考光叠加而引起的干扰。

    Storage device, processor or storage device, and computer program product for providing parameter adjustment during read/write operations
    86.
    发明授权
    Storage device, processor or storage device, and computer program product for providing parameter adjustment during read/write operations 有权
    存储设备,处理器或存储设备以及用于在读/写操作期间提供参数调整的计算机程序产品

    公开(公告)号:US08000046B2

    公开(公告)日:2011-08-16

    申请号:US12631697

    申请日:2009-12-04

    申请人: Yuichiro Yamazaki

    发明人: Yuichiro Yamazaki

    IPC分类号: G11B27/36

    摘要: According to one embodiment, a storage device includes: ahead actuator configured to move a head to an arbitrary position on a disk medium; a write/read module configured to write data to or read data from the disk medium using the head; an adjustment region selector configured to divide the disk medium into a plurality of regions in a circumferential direction, write test data to each of the regions, read the test data to measure signal quality of the each of the regions, compare the signal quality of the each of the regions, and select a parameter adjustment region; and a parameter adjustment module configured to adjust a parameter used for the write/read module to write data to and read data from the disk medium to an optimal value using the selected parameter adjustment region.

    摘要翻译: 根据一个实施例,一种存储装置包括:前端致动器,被配置为将磁头移动到盘介质上的任意位置; 写/读模块,被配置为使用所述头将数据写入或从所述盘介质读取数据; 调整区域选择器,被配置为将盘介质沿周向划分成多个区域,将测试数据写入每个区域,读取测试数据以测量每个区域的信号质量,比较 每个区域,并选择参数调整区域; 以及参数调整模块,被配置为使用所选择的参数调整区域调整用于写入/读取模块的参数以将数据写入和从盘介质读取数据到最佳值。

    Magnetic disk device testing method and testing device
    87.
    发明授权
    Magnetic disk device testing method and testing device 有权
    磁盘设备测试方法和测试设备

    公开(公告)号:US07777979B2

    公开(公告)日:2010-08-17

    申请号:US12256202

    申请日:2008-10-22

    IPC分类号: G11B27/36

    摘要: A magnetic disk device testing method includes obtaining index values indicating the signal quality of an adjacent track at different positions scattered in the width direction in the adjacent track located in the vicinity of a target track on a magnetic disk after repeatedly writing data onto the target track, and determining a representative value of the index values indicating the signal quality of the adjacent track based on the obtained results, while incrementing the number of data write times; and estimating an index value indicating the signal quality of the adjacent track to be obtained where data is written onto the target track a larger number of times than the total number of data write times the data has been actually written in obtaining the index values, the index value being estimated with the use of the representative values decided in the representative value deciding.

    摘要翻译: 磁盘装置测试方法包括:在将数据重复写入目标轨道之后,获得指示位于磁盘上的目标轨道附近的相邻轨道中在宽度方向上散射的不同位置处的相邻轨道的信号质量的指标值 并且在增加数据写入次数的同时,基于所获得的结果来确定指示相邻轨道的信号质量的索引值的代表值; 并且在获得索引值时,估计指示将数据写入到目标轨道上的要获得的相邻轨道的信号质量的指标值比已经实际写入的数据写入时间的总数更多的次数, 利用代表值决定的代表值估计指标值。

    FLAVOR COMPOSITION OR FRAGRANCE COMPOSITION, PRODUCT CONTAINING THE FLAVOR COMPOSITION OR FRAGRANCE COMPOSITION, AND NOVEL ESTER COMPOUND
    88.
    发明申请
    FLAVOR COMPOSITION OR FRAGRANCE COMPOSITION, PRODUCT CONTAINING THE FLAVOR COMPOSITION OR FRAGRANCE COMPOSITION, AND NOVEL ESTER COMPOUND 失效
    挥发性组合物或香料组合物,含有挥发性组合物或香料组合物的产品和新型酯化合物

    公开(公告)号:US20100081725A1

    公开(公告)日:2010-04-01

    申请号:US12516454

    申请日:2007-11-02

    摘要: Disclosed is a 2-methyl-2-pentenyl ester represented by the general formula (1) [wherein R represents a hydrogen atom or a hydrocarbon group having 1 to 9 carbon atoms which may have a substituent]. The compound has a new-type, unprecedented aroma and/or flavor, particularly a fruity, greenish or floral aroma and/or flavor. The compound can be added to a flavor or fragrance composition in an amount of 0.001 to 30 wt %. The flavor or fragrance composition can be added to a cosmetic product, a toiletry product, a bath agent, a food, a beverage or a pharmaceutical product in an amount of 0.0001 to 30 wt %. All of the compounds of the general formula (1) are novel, except for those compounds of the general formula (1) wherein R represents a methyl group, an isopropyl group, a phenyl group or a mesityl group.

    摘要翻译: 公开了由通式(1)表示的2-甲基-2-戊烯基酯[其中R表示氢原子或可具有取代基的碳原子数1〜9的烃基]。 该化合物具有新型,前所未有的香气和/或风味,特别是水果,绿色或花香的香气和/或风味。 该化合物可以以0.001至30重量%的量加入香料或香料组合物中。 风味剂或香料组合物可以以0.0001〜30重量%的量添加到化妆品,化妆品,浴剂,食品,饮料或药品中。 所有通式(1)的化合物都是新的,除了通式(1)的那些化合物,其中R代表甲基,异丙基,苯基或均三甲苯基。

    Mask pattern inspection method, exposure condition verification method, and manufacturing method of semiconductor device
    89.
    发明授权
    Mask pattern inspection method, exposure condition verification method, and manufacturing method of semiconductor device 有权
    掩模图案检查方法,曝光条件验证方法和半导体器件的制造方法

    公开(公告)号:US07674570B2

    公开(公告)日:2010-03-09

    申请号:US11480382

    申请日:2006-07-05

    IPC分类号: G03F7/20

    CPC分类号: G03F1/84

    摘要: A mask pattern inspection method includes: transferring a mask pattern onto a conductor substrate or a semiconductor substrate; preparing a sample including a substrate surface pattern in an electrically conductive state to the substrate, the substrate surface pattern being constituted of a convex pattern or a concave pattern each having a shape in accordance with the transferred mask pattern, or a surface layer obtained by filling the concave pattern with a material; irradiating the sample with an electron beam to detect at least one of a secondary electron, a reflected electron and a backscattered electron generated from the surface of the sample, thereby acquiring an image of the sample surface; and inspecting the mask pattern on the basis of the image.

    摘要翻译: 掩模图案检查方法包括:将掩模图案转印到导体基板或半导体基板上; 将具有导电状态的基板表面图案的样品制备到基板,所述基板表面图案由根据所转印的掩模图案的形状的凸形图案或凹形图案构成,或者通过填充获得的表面层 具有材料的凹形图案; 用电子束照射样品以检测从样品表面产生的二次电子,反射电子和背散射电子中的至少一个,从而获取样品表面的图像; 并基于图像检查掩模图案。