摘要:
The present invention provides a fastening bracket for fastening right and left ends of a deck cross member to respective fitting parts of a vehicle body frame. The fastening bracket includes a body plate to which one of the ends of the deck cross member is connected, a surface contact plate to which a fastening nut corresponding to a bolt to be inserted into corresponding one of the fitting parts of the vehicle body frame is fixed, the surface contact plate being provided in the body plate, a connection plate that is a part for connecting the body plate and the surface contact plate, the connection plate having a width in a direction perpendicular to a connecting direction of the body plate and the surface contact plate equal to or smaller than the surface contact plate, and a demarcating slit for demarcating the body plate and the surface contact plate.
摘要:
Provided is a test apparatus for testing a device under test, including: a level comparing section that receives a signal under test output from the device under test and outputs a logical value, the logical value indicating a comparison result obtained by comparing a signal level of the signal under test with preset first threshold and second threshold; an acquiring section that acquires the logical value output from the level comparing section, according to a strobe signal supplied thereto; an expected value comparing circuit that determines whether the logical value acquired by the acquiring section corresponds to a preset expected value; and a threshold control section that sets an upper limit and a lower limit of a voltage of the eye mask to the level comparing section as the first threshold and the second threshold, when an eye mask test is performed for determining whether an eye opening of the signal under test is larger than a predefined eye mask.
摘要:
Disclosed is an image pickup device, by which cut resistance at the time of cutting a wafer lens is reduced, high production efficiency is maintained, and excellent optical characteristics are obtained. The image pickup device has a first lens block, a second lens block, a spacer, and a sensor unit. The side surface section of the first lens block, the side surface section of the second lens block, and the side surface section of the spacer are formed on the same plane. A lens cover that covers the first and the second lens blocks is provided in a step formed by respective side surface sections of the first lens block, the second lens block and the spacer, and the side surface section of the sensor unit.
摘要:
A twisted wire 1 is produced by twisting two wires 2 together. When that portion of the twisted wire 1 extending from one ends 3 of the two wires 2 to a first predetermined position 4 is defined as a one end-side twisted portion 5, and that portion of the twisted wire 1 extending from the first predetermined position 4 to a second predetermined position 6 is defined as an intermediate twisted portion 7, and that portion of the twisted wire 1 extending from the second predetermined position 6 to the other ends 8 of the two wires 2 is defined as an other end-side twisted portion 9, a twisting pitch of the one end-side twisted portion 5 and the other end-side twisted portion 9 is smaller than a twisting pitch of the intermediate twisted portion 7.
摘要:
In a grommet (1), a centering unit and a temporary anchor unit are provided on an outer surface of a grommet inner member (2). The centering unit includes a plurality of centering portions (e.g., centering claws 8) configured to elastically abut on an attachment panel (20) at an inner edge thereof around an insertion hole (21) so as to position the grommet inner member (2) in a center of the insertion hole (21). The temporary anchor unit includes a plurality of engaging portions (e.g., temporary anchor claws 7) configured to engage with the inner edge of the attachment panel (20), thereby supporting the grommet (1) in an axial direction thereof before lock portions (e.g., lock claws 6) make the grommet inner member (2) retained at the inner edge of the attachment panel (20) around the insertion hole (21) when the grommet inner member (2) is inserted into the insertion hole (21).
摘要:
There is provided a signal generating apparatus for generating an output signal corresponding to pattern data supplied thereto. The signal generating apparatus includes a timing generating section that generates a periodic signal, a shift register section including a plurality of flip-flops in a cascade arrangement through which each piece of data of the pattern data is propagated sequentially in response to the periodic signal, a waveform generating section that generates the output signal whose value varies in accordance with a cycle of the periodic signal, based on data values output from the plurality of flip-flops, and an analog circuit that enhances a predetermined frequency component in a waveform of the output signal generated by the waveform generating section.
摘要:
Provided is a test system that tests a device under test, including a plurality of internal test circuits that are provided inside the device under test and that are used for testing an operation circuit of the device under test; a device control section that is electrically connected to the plurality of internal test circuits via a common bus and that controls the plurality of internal test circuits by supplying the common bus with an intra-device control signal corresponding to a received external signal; and a test apparatus that supplies the device control section with the external signal.
摘要:
There is provided a test apparatus for testing a device under test including a pre-emphasis circuit. The pre-emphasis circuit emphasizes a predetermined component of an output signal of the device under test and outputs the resulting output signal. Here, the test apparatus includes a filter that eliminates an emphasized component that is generated by the pre-emphasis circuit, from the output signal output from the device under test, and a testing section that measures the output signal output from the filter, and judges whether the device under test is acceptable based on a result of the measurement. The test apparatus can accurately test the pre-emphasis function of the device under test including the pre-emphasis circuit.
摘要:
A delay setting data generator generates delay setting data based on rate data. A variable delay circuit delays the test pattern data by a delay time determined by the delay setting data with reference to a predefined unit amount of delay. First rate data designates the period of the test pattern data with a precision determined by the unit amount of delay. Second rate data designates the period of the test pattern data with a precision higher than that determined by the unit amount of delay. The delay setting data generator outputs a first value and a second value in a time division manner at a ratio determined by the second rate data, the first and second values being determined by the first rate data.
摘要:
The present invention provides an etching solution in which a change in the composition due to the evaporation of the chemical solution or the like is small, thus reducing the frequency with which the chemical solution must be replaced, and in which the time-dependent change in etch rate is also small, thus allowing uniform etching of a silicon oxide film. Specifically, the present invention relates to an etching solution, a process of producing the same, and an etching process using the same, in which the etching solution includes hydrofluoric acid (a), ammonium fluoride (b), and salt (c) formed between hydrogen fluoride and a base having a boiling point higher than that of ammonia; the concentration of ammonium fluoride (b) is not higher than 8.2 mol/kg, and the total amount of ammonium fluoride (b) and salt (c) formed between hydrogen fluoride and a base having a boiling point higher than that of ammonia is not less than 9.5 mol/kg.