Probe card having lead part for removing excessive solder

    公开(公告)号:US10119994B2

    公开(公告)日:2018-11-06

    申请号:US14934803

    申请日:2015-11-06

    IPC分类号: G01R1/073 G01R3/00

    摘要: A probe card includes a ceramic substrate; an electrode connection part connecting an electrode pad and a via pad which are provided on one surface of the ceramic substrate; a bonding pad provided on an upper surface of the electrode pad and disposed inwardly of an edge of the electrode pad; and a probe bonded to an upper surface of the bonding pad by a solder layer between the bonding pad and the probe. The bonding pad includes a lead part protruding from a side surface of the bonding pad. As a result, overflowed solder at the time of attaching the probe onto the upper surface of the bonding pad may be dispersed to the lead part.