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公开(公告)号：US20120086290A1
公开(公告)日：2012-04-12
申请号：US13269963
申请日：2011-10-10
申请人： Bengt IVARSSON , Bettina LEINWEBER , Hei Wai CHOI , David DYCHER , Greg SPOONER , Hoss VONG , James MACKINTOSH , Yee Wah LAM , Teruo HISHIKI
发明人： Bengt IVARSSON , Bettina LEINWEBER , Hei Wai CHOI , David DYCHER , Greg SPOONER , Hoss VONG , James MACKINTOSH , Yee Wah LAM , Teruo HISHIKI
IPC分类号： H02K7/14
CPC分类号： H02K7/145 , A61C17/221 , A61C17/3445
摘要： A vibratory appliance includes a tool driven to oscillate by a rotary electric motor. A mechanism for converting rotary movement to oscillatory movement includes magnetic couplers moveable relative to one another. A displacement mechanism moves one of the magnetic couplers relative to the other magnetic coupler and varies the amplitude of oscillation of the tool.
摘要翻译： 振动器具包括由旋转电动机驱动振荡的工具。 用于将旋转运动转换成振荡运动的机构包括可相对于彼此移动的磁耦合器。 位移机构使磁耦合器中的一个相对于另一个磁耦合器移动并改变工具的振荡幅度。
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公开(公告)号：US20100006618A1
公开(公告)日：2010-01-14
申请号：US12282792
申请日：2007-01-10
申请人： Frank Ambjörnsson , Bengt Ivarsson
发明人： Frank Ambjörnsson , Bengt Ivarsson
IPC分类号： B25C5/00
摘要： A stapler (1) using staples for stapling together a workpiece (5), particularly a sheaf of papers, which stapler comprises a base part (3) against which the workpiece is placed, a magazine part (4) in which the staples are stored and a built-in staple remover arrangement (7) comprising a staple remover (8) which is movable between a non-operational first position where it is re-tracted in the stapler body (2) and locked by a locking device (9) and an operational second position where it is partly extended from the stapler body, the staple remover (8) being acted upon by a first elastic means (10) which is tensioned when the staple remover is in a non-operational position and which pushes the staple remover to the extended position when the locking device (9) is released in the non-operational position.
摘要翻译： 一种订书机（1），其使用订书钉将工件（5），特别是一捆纸张装订在一起，所述订书机包括：工件放置在其上的基部（3），存储有订书钉的仓库部分 以及内置的钉移除器装置（7），其包括钉移除器（8），所述钉钉移除器（8）可在非操作的第一位置和第二位置之间移动，在所述非操作的第一位置，所述钉移除器在所述缝合器主体（2）中被重新拉出并被锁定装置（9） 以及操作的第二位置，其中它从订书机主体部分延伸，所述订书钉移除器（8）由第一弹性装置（10）作用，所述第一弹性装置（10）在所述订书钉移除器处于非操作位置时被张紧并且推动 当锁定装置（9）被释放在非操作位置时，钉移除器到达延伸位置。
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公开(公告)号：US20080030738A1
公开(公告)日：2008-02-07
申请号：US11838909
申请日：2007-08-15
申请人： BENGT IVARSSON
发明人： BENGT IVARSSON
IPC分类号： G01N21/55
CPC分类号： G01B11/0625 , G01N21/552 , G01N21/553 , G01N2021/212 , G01N2021/215
摘要： A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.
摘要翻译： 一种检查表面上薄层结构相对于光学厚度差异的方法，该方法包括以下步骤：用光照射表面，使得光在表面内部或外部反射; 对第一二维检测器上的反射光进行成像; 在角度和/或波长范围内顺序地或连续地扫描光的入射角和/或波长; 测量从表面的不同部分反射并撞击检测器的不同部分的光的强度，至少多个入射角和/或波长，从每个角度的每个部分表面反射的光的强度和/或 波长取决于其上的薄层结构的光学厚度; 并且根据检测到的不同光入射角的光强度和/或波长确定表面上的薄层结构的光学厚度图像。 根据本发明，在第二检测器上检测在所述表面反射的光的一部分，以确定照射表面的偏振光的入射角或波长。 还公开了一种用于执行该方法的装置。
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公开(公告)号：US20060072115A1
公开(公告)日：2006-04-06
申请号：US11234829
申请日：2005-09-23
申请人： Bengt Ivarsson
发明人： Bengt Ivarsson
IPC分类号： G01N21/55
CPC分类号： G01B11/0625 , G01N21/552 , G01N21/553 , G01N2021/212 , G01N2021/215
摘要： A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.
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公开(公告)号：US5313264A
公开(公告)日：1994-05-17
申请号：US681533
申请日：1991-05-10
IPC分类号： G01N21/01 , G01N21/03 , G01N21/05 , G01N21/17 , G01N21/21 , G01N21/27 , G01N21/55 , G01N21/59 , G01N21/85 , G01N33/543 , G02B6/26 , G02B6/34 , G02B21/00 , G01N33/53
CPC分类号： G01N21/648 , G01N21/552 , G01N21/553 , G02B6/34 , G01N2021/0346 , G01N2021/212 , G01N2021/5957 , G01N21/0332 , G01N21/05
摘要： An optical biosensor system using internal reflection versus angle of incidence determination for the detection of biomolecules, the system comprising a sensor unit (10) with at least two sensing surfaces (39A-D), a source of light (1), and lens means (2) for forming a convergent beam of light which is focused in wedge-shape fashion to form a streak of light (5) extending transversely over all the sensing surfaces; a photodetector device (7) in the form of a two-dimensional matrix of individual photodetector; optical imaging instrumentation in the form of an anamorphic lens system (6) for the purpose of imaging rays of reflected light from the sensing surfaces on each its own column of photodetectors, so that for each sensing surface there is a corresponding set of columns of photodetectors; and an evaluation unit (8) for determining the minimum reflectance or the resonance angle at each of the sensing surfaces. The invention also relates to a method for calibrating the biosensor system, a method for correcting for baseline drift as well as a method for temperature regulation of thermostat means in the biosensor system.
摘要翻译： PCT No.PCT / SE89 / 00641 Sec。 371日期1991年5月10日 102（e）日期1991年5月10日PCT提交1989年11月9日PCT公布。 第WO90 / 05295号公报 日期1990年5月17日。一种使用内部反射与入射角确定用于生物分子检测的光学生物传感器系统，该系统包括具有至少两个感测表面（39A-D）的传感器单元（10），光源 1）和用于形成会聚光束的透镜装置（2），其以楔形方式聚焦以形成横向延伸到所有感测表面上的条纹（5）; 单独光电检测器的二维矩阵形式的光检测器装置（7）; 以变形透镜系统（6）的形式的光学成像仪器，用于成像来自每个自身的光电检测器列上的感测表面的反射光的光线，使得对于每个感测表面，存在相应的一组光电检测器 ; 以及用于确定每个感测表面处的最小反射率或共振角的评估单元（8）。 本发明还涉及用于校准生物传感器系统的方法，用于校正基线漂移的方法以及用于生物传感器系统中恒温器装置的温度调节的方法。
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公开(公告)号：US07621433B2
公开(公告)日：2009-11-24
申请号：US10588302
申请日：2004-12-16
申请人： Bengt Ivarsson
发明人： Bengt Ivarsson
CPC分类号： B25C5/0207
摘要： Stapler (1) which comprises a base part (2) and a stapling unit (3). The base part consists of a lower part (5) and an upper part (6) which are connected together such that they from each other, and between which parts is arranged a first elastic element (8) which, in an initial position, moves the upper and lower parts apart. A workpiece to be stapled is placed on the upper part (6), where an opening (31) is arranged through which the legs of the staple is driven after that the legs have driven through the workpiece, and to which upper part bending devices (21, 22), pivotable about pivot pins (25, 26), are connected. The upper part being blocked from moving downward by a blocking arrangement (21, 22, 25, 26, 44, 45) when the driver drives the staple legs through the workpiece. The blocking device is disengaged by means of a releasing device (53, 54, 55, 56) when the staple crown (40) contacts the upper surface (17) of the workpiece.
摘要翻译： 订书机（1），其包括基部（2）和装订单元（3）。 基部由下部（5）和上部（6）组成，它们彼此连接在一起，并且在这些部分之间布置有第一弹性元件（8），其在初始位置移动 上部和下部分开。 要装订的工件放置在上部（6）上，在上部（6）上布置有开口（31），在腿部已经穿过工件之后，钉子的腿被驱动，并且上部弯曲装置 21,22），可围绕枢轴销（25,26）枢转。 当驾驶员通过工件驱动钉腿时，上部被阻挡装置（21,22,25,26,44,45）向下移动。 当钉冠（40）接触工件的上表面（17）时，阻挡装置通过释放装置（53,54,55,56）脱开。
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公开(公告)号：US07460236B2
公开(公告)日：2008-12-02
申请号：US11838909
申请日：2007-08-15
申请人： Bengt Ivarsson
发明人： Bengt Ivarsson
CPC分类号： G01B11/0625 , G01N21/552 , G01N21/553 , G01N2021/212 , G01N2021/215
摘要： A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.
摘要翻译： 一种检查表面上薄层结构相对于光学厚度差异的方法，该方法包括以下步骤：用光照射表面，使得光在表面内部或外部反射; 对第一二维检测器上的反射光进行成像; 在角度和/或波长范围内顺序地或连续地扫描光的入射角和/或波长; 测量从表面的不同部分反射并撞击检测器的不同部分的光的强度，至少多个入射角和/或波长，从每个角度的每个部分表面反射的光的强度和/或 波长取决于其上的薄层结构的光学厚度; 并且根据检测到的不同光入射角的光强度和/或波长确定表面上的薄层结构的光学厚度图像。 根据本发明，在第二检测器上检测在所述表面反射的光的一部分，以确定照射表面的偏振光的入射角或波长。 还公开了一种用于执行该方法的装置。
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公开(公告)号：US06999175B2
公开(公告)日：2006-02-14
申请号：US10766696
申请日：2004-01-27
申请人： Bengt Ivarsson
发明人： Bengt Ivarsson
CPC分类号： G01B11/0625 , G01N21/552 , G01N21/553 , G01N2021/212 , G01N2021/215
摘要： A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.
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公开(公告)号：US20120073849A1
公开(公告)日：2012-03-29
申请号：US13247271
申请日：2011-09-28
申请人： Bengt IVARSSON , Bettina LEINWEBER , Hei Wai CHOI , David DYCHER , Greg SPOONER , Hoss VONG , James MACKINTOSH , Yee Wah LAM , Teruo HISHIKI
发明人： Bengt IVARSSON , Bettina LEINWEBER , Hei Wai CHOI , David DYCHER , Greg SPOONER , Hoss VONG , James MACKINTOSH , Yee Wah LAM , Teruo HISHIKI
IPC分类号： B25F5/00
CPC分类号： A61C17/40
摘要： A vibratory appliance includes a tool driven to oscillate by a rotary electric motor. A shaft supported, at an intermediate portion by a pivot, is driven by an orbital drive mechanism. The orbital drive mechanism includes a rotor rotated about a rotor axis by the motor, an elongate part, and a coupler. The elongate part and the coupler are each fixed to a respective one of the inner end and the rotor. The elongate part and the coupler are mutually connected for sliding movement relative to one another, between first and second relative positions in which the inner end orbits about the rotor axis at first and second orbital radii, respectively, to vary the amplitude of oscillation of the tool.
摘要翻译： 振动器具包括由旋转电动机驱动振荡的工具。 由枢轴支撑在中间部分处的轴由轨道驱动机构驱动。 轨道驱动机构包括通过马达围绕转子轴旋转的转子，细长部分和耦合器。 细长部分和耦合器各自固定到内端和转子中的相应一个。 细长部分和耦合器相互相互连接，用于相对于彼此滑动运动，在第一和第二相对位置之间，内端分别围绕转子轴线在第一和第二轨道半径处绕轨道运动，以改变振动的振幅 工具。
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公开(公告)号：US20070013912A1
公开(公告)日：2007-01-18
申请号：US11482501
申请日：2006-07-07
申请人： Bengt Ivarsson
发明人： Bengt Ivarsson
IPC分类号： G01N21/55
CPC分类号： G01B11/0625 , G01N21/552 , G01N21/553 , G01N2021/212 , G01N2021/215
摘要： A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.
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