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    Memory semiconductor device and method of operating the same
    2.
    发明授权
    Memory semiconductor device and method of operating the same 有权
    存储器半导体器件及其操作方法

    公开(公告)号：US08644064B2

    公开(公告)日：2014-02-04

    申请号：US13107206

    申请日：2011-05-13

    申请人： Byungkyu Cho ,  Changhyun Lee ,  Sunghoi Hur

    发明人： Byungkyu Cho ,  Changhyun Lee ,  Sunghoi Hur

    IPC分类号： G11C16/04

    CPC分类号： G11C16/3427 ,  G11C16/0483 ,  G11C16/26

    摘要： In a read step or a program (write) verification step of a semiconductor memory device, read voltages different from one another are applied to a pair of word lines respectively disposed on both sides of a selected word line to suppress the enlargement of program distribution.

    摘要翻译： 在半导体存储器件的读取步骤或程序（写入）验证步骤中，彼此不同的读取电压被施加到分别设置在所选字线的两侧上的一对字线，以抑制程序分配的扩大。

    LOCAL SELF-BOOSTING METHOD OF FLASH MEMORY DEVICE AND PROGRAM METHOD USING THE SAME
    5.
    发明申请
    LOCAL SELF-BOOSTING METHOD OF FLASH MEMORY DEVICE AND PROGRAM METHOD USING THE SAME 有权
    闪存存储器件的本地自动提升方法和使用其的程序方法

    公开(公告)号：US20110103154A1

    公开(公告)日：2011-05-05

    申请号：US12917634

    申请日：2010-11-02

    申请人： ByungKyu Cho ,  Kwang Soo Seol ,  Sunghoi Hur ,  Jungdal Choi

    发明人： ByungKyu Cho ,  Kwang Soo Seol ,  Sunghoi Hur ,  Jungdal Choi

    IPC分类号： G11C16/12 ,  G11C16/10

    CPC分类号： G11C16/10 ,  G11C16/3418

    摘要： Provided is a local self-boosting method of a flash memory device including at least one string having memory cells respectively connected to wordlines. The local self-boosting method includes forming a potential well at a channel of the string and forming potential walls at the potential well to be disposed at both sides of a channel of a selected one of the memory cells. The channel of the selected memory cell is locally limited by the potential walls and boosted when a program voltage is applied to the selected memory cell.

    摘要翻译： 提供了一种闪存器件的局部自增强方法，其包括至少一个具有分别连接到字线的存储单元的串。 局部自增强方法包括在串的通道处形成势阱，并在势阱处形成位于所选存储单元的通道两侧的电势壁。 所选择的存储单元的通道在局部受到潜在的壁限制，并且当将程序电压施加到所选择的存储单元时升压。

    Local self-boosting method of flash memory device and program method using the same
    7.
    发明授权
    Local self-boosting method of flash memory device and program method using the same 有权
    闪存器件的局部自增强方法及使用其的程序方法

    公开(公告)号：US08625357B2

    公开(公告)日：2014-01-07

    申请号：US12917634

    申请日：2010-11-02

    申请人： ByungKyu Cho ,  Kwang Soo Seol ,  Sunghoi Hur ,  Jungdal Choi

    发明人： ByungKyu Cho ,  Kwang Soo Seol ,  Sunghoi Hur ,  Jungdal Choi

    IPC分类号： G11C11/34

    CPC分类号： G11C16/10 ,  G11C16/3418

    摘要： Provided is a local self-boosting method of a flash memory device including at least one string having memory cells respectively connected to wordlines. The local self-boosting method includes forming a potential well at a channel of the string and forming potential walls at the potential well to be disposed at both sides of a channel of a selected one of the memory cells. The channel of the selected memory cell is locally limited by the potential walls and boosted when a program voltage is applied to the selected memory cell.

    摘要翻译： 提供了一种闪存器件的局部自增强方法，其包括至少一个具有分别连接到字线的存储单元的串。 局部自增强方法包括在串的通道处形成势阱，并在势阱处形成位于所选存储单元的通道两侧的电势壁。 所选择的存储单元的通道在局部受到潜在的壁限制，并且当将程序电压施加到所选择的存储单元时升压。

    MEMORY SEMICONDUCTOR DEVICE AND METHOD OF OPERATING THE SAME
    8.
    发明申请
    MEMORY SEMICONDUCTOR DEVICE AND METHOD OF OPERATING THE SAME 有权
    存储器半导体器件及其操作方法

    公开(公告)号：US20110286266A1

    公开(公告)日：2011-11-24

    申请号：US13107206

    申请日：2011-05-13

    申请人： BYUNGKYU CHO ,  Changyun Lee ,  Sunghoi Hur

    发明人： BYUNGKYU CHO ,  Changyun Lee ,  Sunghoi Hur

    IPC分类号： G11C16/04

    CPC分类号： G11C16/3427 ,  G11C16/0483 ,  G11C16/26

    摘要： In a read step or a program (write) verification step of a semiconductor memory device, read voltages different from one another are applied to a pair of word lines respectively disposed on both sides of a selected word line to suppress the enlargement of program distribution.

    摘要翻译： 在半导体存储器件的读取步骤或程序（写入）验证步骤中，彼此不同的读取电压被施加到分别设置在所选字线的两侧上的一对字线，以抑制程序分配的扩大。

    Non-Volatile Memory Devices Having Semiconductor Barrier Patterns and Methods of Forming Such Devices
    9.
    发明申请
    Non-Volatile Memory Devices Having Semiconductor Barrier Patterns and Methods of Forming Such Devices 审中-公开
    具有半导体阻挡图案的非易失性存储器件和形成这种器件的方法

    公开(公告)号：US20110073928A1

    公开(公告)日：2011-03-31

    申请号：US12894844

    申请日：2010-09-30

    申请人： ByungKyu Cho ,  Sunghoi Hur ,  Jaeduk Lee ,  Jungdal Choi

    发明人： ByungKyu Cho ,  Sunghoi Hur ,  Jaeduk Lee ,  Jungdal Choi

    IPC分类号： H01L29/788

    CPC分类号： H01L29/42324 ,  H01L27/11521 ,  H01L29/40114 ,  H01L29/7881

    摘要： Provided are a non-volatile memory device and a method of forming the same. The non-volatile memory device includes: a tunnel insulation layer on a substrate; a floating gate on the tunnel insulation layer; a blocking insulation layer on the floating gate; a first barrier pattern, between the top of the floating gate and the blocking insulation layer, having a higher conduction band energy level than the floating gate; and a control gate on the blocking insulation layer.

    摘要翻译： 提供一种非易失性存储器件及其形成方法。 非易失性存储器件包括：衬底上的隧道绝缘层; 隧道绝缘层上的浮栅; 浮栅上的阻挡绝缘层; 在浮置栅极的顶部和阻挡绝缘层之间的第一阻挡图案具有比浮动栅极更高的导带能级; 和阻挡绝缘层上的控制栅极。