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15 条记录 (耗时 0.014 秒)

    Charged-particle energy analyzer
    1.
    发明授权
    Charged-particle energy analyzer 失效
    带电粒子能量分析仪

    公开(公告)号：US08421030B2

    公开(公告)日：2013-04-16

    申请号：US13119689

    申请日：2010-07-16

    申请人： Khashayar Shadman ,  Robert Haynes ,  Gabor D. Toth ,  Christopher Sears ,  Mehran Nasser Ghodsi

    发明人： Khashayar Shadman ,  Robert Haynes ,  Gabor D. Toth ,  Christopher Sears ,  Mehran Nasser Ghodsi

    IPC分类号： G01K1/08

    CPC分类号： H01J37/28 ,  H01J37/05 ,  H01J49/486 ,  H01J2237/0535 ,  H01J2237/2446 ,  H01J2237/24485

    摘要： One embodiment relates to a charged-particle energy analyzer apparatus. A first mesh is arranged to receive the charged particles on a first side and pass the charged particles to a second side, and a first electrode is arranged such that a first cavity is formed between the second side of the first mesh and the first electrode. A second mesh is arranged to receive the charged particles on a second side and pass the charged particles to a first side, and a second electrode is arranged such that a second cavity is formed between the first side of the second mesh and the second electrode. Finally, a third mesh is arranged to receive the charged particles on a first side and pass the charged particles to a second side, and a position-sensitive charged-particle detector is arranged to receive the charged particles after the charged particles pass through the third mesh.

    摘要翻译： 一个实施例涉及一种带电粒子能量分析装置。 布置第一网格以接收第一侧上的带电粒子并将带电粒子传递到第二侧，并且第一电极被布置成使得第一空腔形成在第一网格的第二侧和第一电极之间。 布置第二网以接收第二侧上的带电粒子并将带电粒子传递到第一侧，并且第二电极被布置成使得在第二网格的第一侧和第二电极之间形成第二腔。 最后，设置第三网格以接收第一侧上的带电粒子并将带电粒子传递到第二侧，并且位置敏感带电粒子检测器布置成在带电粒子通过第三侧之后接收带电粒子 网格。

    Automated hotfix handling model
    2.
    发明授权
    Automated hotfix handling model 有权
    自动热修复处理模型

    公开(公告)号：US08713554B1

    公开(公告)日：2014-04-29

    申请号：US13618634

    申请日：2012-09-14

    申请人： Shelesh Chopra ,  William Scott ,  Christopher Sears ,  Shivashankar Vasanad

    发明人： Shelesh Chopra ,  William Scott ,  Christopher Sears ,  Shivashankar Vasanad

    IPC分类号： G06F9/44

    CPC分类号： G06F11/3664 ,  G06F8/71 ,  G06F11/3688

    摘要： This disclosure relates to a method, article of manufacture, and apparatus for automated handling of a hotfix. In some embodiments, this includes obtaining defects submitted to a defect repository, querying the defect repository to obtain a defect, permitting the users to approve the defect as a cumulative hotfix candidate, receiving and storing check-in data corresponding to the cumulative hotfix candidate to a source code repository, approving the check-in data, triggering an automated compiling of a build of the version of the software, examining the build, triggering an automated testing of the build based on a determination that the build is clean, storing the build in a build repository when the automated testing of the build completes without error, and publishing the build.

    摘要翻译： 本公开涉及一种用于自动处理修补程序的方法，制品和装置。 在一些实施例中，这包括获得提交给缺陷库的缺陷，查询缺陷库以获得缺陷，允许用户将缺陷批准为累积修补程序候选者，接收和存储对应于累积修补程序候选的登记数据 源代码存储库，批准签入数据，触发对软件版本的自动编译，检查构建，触发对构建的自动化测试，基于构建清洁的确定，存储构建 在构建库中，当构建的自动化测试完成时没有错误，并发布构建。

    Auger elemental identification algorithm
    5.
    发明授权
    Auger elemental identification algorithm 失效
    俄歇元素识别算法

    公开(公告)号：US08658973B2

    公开(公告)日：2014-02-25

    申请号：US13913240

    申请日：2013-06-07

    申请人： Mark Neil ,  Mehran Nasser-Ghodsi ,  Christopher Sears

    发明人： Mark Neil ,  Mehran Nasser-Ghodsi ,  Christopher Sears

    IPC分类号： H01J37/26

    CPC分类号： H01J37/26 ,  G01N23/2276 ,  G01N2223/345 ,  G06K9/00563 ,  G06K9/6271 ,  H01J49/0036 ,  H01J49/44

    摘要： System and methods for decomposing an Auger electron spectrum into elemental and chemical components, includes conditioning and input spectrum to generate a normalized input spectrum; determining statistical correlation between the normalized input spectrum and stored elemental spectral signatures; and characterizing elemental or chemical species in the input spectrum from the statistical correlation, wherein said conditioning the input spectrum includes estimating a background signal of non-Auger electrons in the input spectrum and subtracting the estimated background signal from the input spectrum.

    摘要翻译： 将俄歇电子谱分解为元素和化学成分的系统和方法包括调节和输入光谱以产生归一化输入光谱; 确定归一化输入光谱和存储的基本光谱特征之间的统计相关性; 以及从所述统计相关性表征所述输入光谱中的元素或化学物质，其中所述调节所述输入光谱包括估计所述输入光谱中的非俄歇电子的背景信号并从所述输入光谱中减去所估计的背景信号。

    CHARGED-PARTICLE ENERGY ANALYZER
    8.
    发明申请
    CHARGED-PARTICLE ENERGY ANALYZER 失效
    充电颗粒能量分析仪

    公开(公告)号：US20110168886A1

    公开(公告)日：2011-07-14

    申请号：US13119689

    申请日：2010-07-16

    申请人： Khashayar Shadman ,  Robert Haynes ,  Gabor D. Toth ,  Christopher Sears ,  Mehran Nasser Ghodsi

    发明人： Khashayar Shadman ,  Robert Haynes ,  Gabor D. Toth ,  Christopher Sears ,  Mehran Nasser Ghodsi

    IPC分类号： H01J37/28 ,  H01J37/244

    CPC分类号： H01J37/28 ,  H01J37/05 ,  H01J49/486 ,  H01J2237/0535 ,  H01J2237/2446 ,  H01J2237/24485

    摘要： One embodiment relates to a charged-particle energy analyzer apparatus. A first mesh is arranged to receive the charged particles on a first side and pass the charged particles to a second side, and a first electrode is arranged such that a first cavity is formed between the second side of the first mesh and the first electrode. A second mesh is arranged to receive the charged particles on a second side and pass the charged particles to a first side, and a second electrode is arranged such that a second cavity is formed between the first side of the second mesh and the second electrode. Finally, a third mesh is arranged to receive the charged particles on a first side and pass the charged particles to a second side, and a position-sensitive charged-particle detector is arranged to receive the charged particles after the charged particles pass through the third mesh.

    摘要翻译： 一个实施例涉及一种带电粒子能量分析装置。 布置第一网格以接收第一侧上的带电粒子并将带电粒子传递到第二侧，并且第一电极被布置成使得第一空腔形成在第一网格的第二侧和第一电极之间。 布置第二网以接收第二侧上的带电粒子并将带电粒子传递到第一侧，并且第二电极被布置成使得在第二网格的第一侧和第二电极之间形成第二腔。 最后，设置第三网格以接收第一侧上的带电粒子并将带电粒子传递到第二侧，并且位置敏感带电粒子检测器布置成在带电粒子通过第三侧之后接收带电粒子 网格。

    Permanent magnet lens array
    9.
    发明授权
    Permanent magnet lens array 有权
    永磁体透镜阵列

    公开(公告)号：US08698094B1

    公开(公告)日：2014-04-15

    申请号：US13187019

    申请日：2011-07-20

    申请人： Christopher Sears ,  Mehran Nasser-Ghodsi ,  Khashayar Shadman

    发明人： Christopher Sears ,  Mehran Nasser-Ghodsi ,  Khashayar Shadman

    IPC分类号： H01J1/50 ,  H01F7/00

    CPC分类号： H01J37/143 ,  H01F7/0278 ,  H01J37/28 ,  H01J2237/1405 ,  H01J2237/1534

    摘要： A permanent magnetic lens array for charged-particle focusing includes a first sheet of soft magnetic material, wherein the first sheet of soft magnetic material includes a plurality of snorkel cone protrusions arranged in an array pattern, wherein each snorkel cone is axially symmetric and includes an opening passing from a first surface of the first sheet of soft magnetic material to a second surface of soft magnetic material, and a plurality of permanent magnetic elements, wherein each permanent magnetic element is axially symmetric and arranged concentrically with a snorkel cone of the first sheet of soft magnetic material, wherein the snorkel cones of the first sheet of soft magnetic material and the plurality of permanent magnetic elements are configured to form a plurality of magnetic lenses, wherein each magnetic lens has a magnetic field with an axial component oriented perpendicular to the first surface of the soft magnetic material.

    摘要翻译： 用于带电粒子聚焦的永久磁性透镜阵列包括第一片软磁材料，其中第一片软磁材料包括以阵列图案排列的多个浮潜锥体突起，其中每个浮潜锥体是轴对称的，并且包括 开口从第一软磁材料片的第一表面延伸到软磁材料的第二表面，以及多个永久磁性元件，其中每个永久磁性元件轴向对称并与第一片的吸管锥体同心地布置 的软磁性材料，其中，所述第一软磁性材料片的所述通气孔和所述多个永久磁性元件被配置为形成多个磁性透镜，其中每个磁性透镜具有磁场，所述磁场的轴向分量垂直于 软磁材料的第一表面。